Electronic device including glass plate

    公开(公告)号:US10819381B2

    公开(公告)日:2020-10-27

    申请号:US16449765

    申请日:2019-06-24

    Abstract: An electronic device according to certain embodiments includes a housing, a first glass plate coupled to the housing and defining an inner space, the first glass plate including a peripheral portion including: a first, second, third, fourth, and fifth surface forming an edge of the glass plate, the first and fifth surfaces being substantially parallel and the third surface being substantially perpendicular to the first and fifth surfaces, a decorative layer formed of a first material, disposed on a first area of the fifth surface such that a second area disposed between the fourth surface and the first area is uncovered by the decorative layer, and a protective layer formed of a second material, covering the second surface, the third surface, the fourth surface, the second area of the fifth surface, and a part of the decorative layer.

    Method of testing memory device, memory built-in self test (MBIST) circuit, and memory device for reducing test time

    公开(公告)号:US11899959B2

    公开(公告)日:2024-02-13

    申请号:US17337992

    申请日:2021-06-03

    CPC classification number: G06F3/0653 G06F3/0614 G06F3/0679

    Abstract: A method of testing a memory device, a memory built-in self-test (MBIST) circuit, and a memory device for improving reliability and reducing a test time. The memory device includes a plurality of memory banks and the MBIST circuit. The MBIST circuit is configured to generate double data rate (DDR) test patterns and parallel bit test (PBT) test patterns to test the memory banks. When a defective cell is detected as a result of the PBT test or the DDR test, the MBIST circuit is configured to perform a repair operation for replacing the defective cell with a redundancy cell and perform a re-test to verify the repair operation. The MBIST circuit may be configured to perform the DDR test on one or more memory cells including the defective cell during the re-test.

    Semiconductor device
    14.
    发明授权

    公开(公告)号:US11233062B2

    公开(公告)日:2022-01-25

    申请号:US16827778

    申请日:2020-03-24

    Abstract: A semiconductor device includes a substrate having a conductive region and an insulating region; gate electrodes including sub-gate electrodes spaced apart from each other and stacked in a first direction perpendicular to an upper surface of the substrate and extending in a second direction perpendicular to the first direction and gate connectors connecting the sub-gate electrodes disposed on the same level; channel structures penetrating through the gate electrodes and extending in the conductive region of the substrate; and a first dummy channel structure penetrating through the gate electrodes and extending in the insulating region of the substrate and disposed adjacent to at least one side of the gate connectors in a third direction perpendicular to the first and second directions.

    Semiconductor device
    16.
    发明授权

    公开(公告)号:US11637110B2

    公开(公告)日:2023-04-25

    申请号:US17580811

    申请日:2022-01-21

    Abstract: A semiconductor device includes a substrate having a conductive region and an insulating region; gate electrodes including sub-gate electrodes spaced apart from each other and stacked in a first direction perpendicular to an upper surface of the substrate and extending in a second direction perpendicular to the first direction and gate connectors connecting the sub-gate electrodes disposed on the same level; channel structures penetrating through the gate electrodes and extending in the conductive region of the substrate; and a first dummy channel structure penetrating through the gate electrodes and extending in the insulating region of the substrate and disposed adjacent to at least one side of the gate connectors in a third direction perpendicular to the first and second directions.

    Comparator providing offset calibration and integrated circuit including comparator

    公开(公告)号:US11509298B2

    公开(公告)日:2022-11-22

    申请号:US17514552

    申请日:2021-10-29

    Abstract: A comparator configured to calibrate an offset according to a control signal, including an input circuit configured to receive a first input signal and a second input signal, and to generate a first internal signal corresponding to the first input signal and a second internal signal corresponding to the second input signal; a differential amplification circuit configured to consume a supply current flowing from a positive voltage node having a positive supply voltage to a negative voltage node having a negative supply voltage, and to generate an output signal by amplifying a difference between the first internal signal and the second internal signal; and a current valve configured to adjust at least a portion of the supply current based on the control signal.

    Electronic device for establishing communication with external electronic device and method of controlling the same

    公开(公告)号:US11405963B2

    公开(公告)日:2022-08-02

    申请号:US16863141

    申请日:2020-04-30

    Abstract: An electronic device provided. The electronic device comprises at least one communication circuit configured to perform communication with at least one external device, at least one processor operatively connected with the at least one communication circuit, and a memory operatively connected with the at least one processor, wherein the memory stores instructions to, when executed, enable the at least one processor to control the at least one communication circuit to establish a first communication connection with a first wearable device, control the at least one communication circuit to receive a signal for establishing a second communication connection from a second wearable device, the signal including information indicating whether a user wears the second wearable device, identify whether the user wears the second wearable device based on the information, and based on identifying that the user wears the second wearable device, control the at least one communication circuit to release the first communication connection and establish the second communication connection with the second wearable device. Other various embodiments are possible as well.

    Electronic device for providing notification message and method thereof

    公开(公告)号:US10992489B2

    公开(公告)日:2021-04-27

    申请号:US16535683

    申请日:2019-08-08

    Abstract: An electronic device includes a display, communication circuitry performing wireless connection with an external electronic device, a processor operatively coupled with the display and the communication circuitry, and a memory operatively connected with the processor. Based on executing instructions stored in the memory, the processor is configured to control the electronic device to receive information on a first notification message generated within the external electronic device using the communication circuitry. Based on instructions stored in the memory being executed, the processor controls the electronic device to display the first notification message through the display. Based on the instructions stored in the memory being executed, the processor is configured to control the electronic device to receive one or more second notification messages which have been generated within the external electronic device prior to the first notification message. Based on instructions stored in the memory being executed, the processor is configured to control the electronic device to display, in response to an input, the second notification message in at least a portion of the display.

    Semiconductor device having buffer layer and method of forming the same

    公开(公告)号:US09954052B2

    公开(公告)日:2018-04-24

    申请号:US14958146

    申请日:2015-12-03

    Inventor: Jaehoon Lee

    Abstract: A semiconductor device is provided as follows. A substrate includes an NMOS region and a PMOS region. A first trench and a second trench are disposed in the NMOS region. A first buffer layer is disposed in the first trench and the second trench. A stressor is disposed in the first trench and the second trench and disposed on the first buffer layer. A first channel region is disposed between the first trench and the second trench and disposed in the substrate. A first gate electrode is disposed on the first channel area. A third trench is disposed in the PMOS region. A second buffer layer is disposed in the third trench. A second channel area is disposed in the third trench, disposed on the second buffer layer, and has a different semiconductor layer from the substrate. A second gate electrode is disposed on the second channel area.

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