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    VACUUM CLEANER
    12.
    发明申请
    VACUUM CLEANER 审中-公开
    吸尘器

    公开(公告)号：US20160037984A1

    公开(公告)日：2016-02-11

    申请号：US14695223

    申请日：2015-04-24

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Tae Sang PARK ,  Myung Bae BANG ,  Kwang Soo KIM ,  Jong Jin PARK ,  Hyeon Joon OH ,  Seung Yeol LEE ,  Byung Ryel IN

    IPC: A47L9/00 ,  A47L5/28

    CPC classification number: A47L9/0081 ,  A47L5/22 ,  A47L5/225 ,  F04D25/08 ,  F04D29/4253 ,  F04D29/444 ,  F04D29/626

    Abstract: A vacuum cleaner having an improved structure capable of enhancing suction performance includes a suction unit provided in a main body, the suction unit including an impeller disposed to suck air by rotating about an axis thereof, and a diffuser disposed to guide air discharged from the impeller. The diffuser includes an inner casing, an outer casing disposed to be spaced apart from an outer circumference of the inner casing and to form a path through which the air discharged from the impeller flows, and a plurality of vanes disposed at the inner casing to guide the air discharged from the impeller to the path, and the plurality of vanes protrude toward the outer casing to cross at least a part of the path.

    Abstract translation: 具有能够提高抽吸性能的改进结构的真空吸尘器包括设置在主体中的抽吸单元，所述抽吸单元包括设置成通过围绕其轴线旋转而吸入空气的叶轮和设置成引导从叶轮排出的空气的扩散器 。 扩散器包括内壳体，外壳体，其设置成与内壳体的外周间隔开并形成从叶轮排出的空气流过的路径，以及设置在内壳体处的多个叶片以引导 从叶轮排出的空气到达路径，并且多个叶片向外壳突出，以穿过路径的至少一部分。

    OPTICAL MEASUREMENT APPARATUS AND METHOD OF CONTROLLING THE SAME
    13.
    发明申请
    OPTICAL MEASUREMENT APPARATUS AND METHOD OF CONTROLLING THE SAME 审中-公开
    光学测量装置及其控制方法

    公开(公告)号：US20150369588A1

    公开(公告)日：2015-12-24

    申请号：US14839553

    申请日：2015-08-28

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Kwang Soo KIM ,  Hyun Jae LEE ,  Byeong Hwan JEON ,  Chang Hoon CHOI

    IPC: G01B11/00

    CPC classification number: G01B11/00 ,  G01B11/24 ,  G01B11/28 ,  G01B2210/56

    Abstract: According to example embodiments, an optical measurement apparatus may include: a station configured to support a measurement target; an image acquisition unit configured to acquire a one-dimensional (1D) line image of the measurement target; a driver configured to move the station and the image acquisition unit; and a controller. The controller may be configured to control the driver and the image acquisition unit to acquire a plurality of 1D line images of the measurement target while varying a distance between the image acquisition unit and the measurement target to generate a two-dimensional (2D) scan image from combining the plurality of 1D line images; and to detect a pattern of the measurement target based on comparing a plurality of 2D reference images and the 2D scan image. The optical measurement apparatus may measure critical dimensions of non-repeating ultrafine patterns at high speed.

    Abstract translation: 根据示例实施例，光学测量装置可以包括：被配置为支持测量目标的站; 图像获取单元，被配置为获取所述测量对象的一维（1D）线图像; 驱动器，被配置为移动所述站和所述图像获取单元; 和控制器。 控制器可以被配置为控制驱动器和图像获取单元，以在改变图像获取单元和测量对象之间的距离的同时获取测量对象的多个1D线图像，以生成二维（2D）扫描图像 从组合多个1D线图像; 并且基于比较多个2D参考图像和2D扫描图像来检测测量对象的图案。 光学测量装置可以高速度地测量非重复超细纹图案的临界尺寸。

    VERTICAL MEMORY DEVICE
    14.
    发明申请
    VERTICAL MEMORY DEVICE 有权

    公开(公告)号：US20220130851A1

    公开(公告)日：2022-04-28

    申请号：US17569497

    申请日：2022-01-05

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Jun Hyoung KIM ,  Kwang Soo KIM ,  Seok Cheon BAEK ,  Geun Won LIM

    IPC: H01L27/11575 ,  H01L27/11524 ,  H01L27/11556 ,  H01L27/11573 ,  H01L27/11529 ,  H01L27/1157 ,  H01L27/11582 ,  H01L27/11548

    Abstract: A vertical memory device includes a substrate having a peripheral circuit structure, first gate patterns having first gate pad regions stacked vertically from the substrate, vertical channel structures penetrating the first gate patterns, first gate contact structures each extending vertically to a corresponding first gate pad region, mold patterns stacked vertically from the substrate, the mold patterns each being positioned at the same height from the substrate with a corresponding gate pattern, peripheral contact structures penetrating the mold patterns to be connected to the peripheral circuit structure, a first, block separation structure disposed between the first gate contact structures and the peripheral contact structures, and a first peripheral circuit connection wiring extending across the first block separation structure to connect one of the first gate contact structures to one of the peripheral contact structures.

    MEMORY DEVICE
    15.
    发明申请
    MEMORY DEVICE 审中-公开

    公开(公告)号：US20190043886A1

    公开(公告)日：2019-02-07

    申请号：US16149249

    申请日：2018-10-02

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Kwang Soo KIM ,  Shin Hwan KANG ,  Jae Hoon JANG ,  Kohji KANAMORI

    IPC: H01L27/11582 ,  G11C16/04 ,  H01L27/11556

    CPC classification number: H01L27/11582 ,  G11C16/0483 ,  H01L27/11556

    Abstract: A memory device includes a plurality of gate electrode layers stacked on a substrate, a plurality of channel layers penetrating the plurality of gate electrode layers, a gate insulating layer between the plurality of gate electrode layers and the plurality of channel layers, and a common source line on the substrate adjacent to the gate electrode layers. The common source line includes a first part and a second part that are alternately arranged in a first direction and have different heights in a direction vertical to a top surface of the substrate. The gate insulating layer includes a plurality of vertical parts and a horizontal part. The plurality of vertical parts surrounds corresponding ones of the plurality of channel layers. The horizontal part extends parallel to a top surface of the substrate.

    MOTOR APPARATUS AND CLEANER HAVING THE SAME
    18.
    发明申请
    MOTOR APPARATUS AND CLEANER HAVING THE SAME 审中-公开
    电动机和清洗机具有相同的功能

    公开(公告)号：US20140359969A1

    公开(公告)日：2014-12-11

    申请号：US14281109

    申请日：2014-05-19

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Kwang Soo KIM ,  Deok Jin Kim ,  Myung Bae Bang ,  Sung Gu Lee ,  Byung Ryel In ,  Young Kwan Kim

    IPC: H02K1/27 ,  A47L9/22 ,  H02K9/10

    CPC classification number: A47L9/22 ,  F04D29/263 ,  H02K1/246 ,  H02K1/278 ,  H02K7/14 ,  H02K9/06

    Abstract: A motor apparatus having a high efficiency and reducing manufacturing cost by using a cost effective ferrite permanent magnet includes a rotatable shaft, a fan connected to one side of the shaft to generate a flow of air, a stator including stator cores arranged in a circumferential direction, and a coil wound around the stator core, and a rotor disposed at an inside of the stator and provided in a form of a cylinder having a passage allowing the shaft to pass through the rotor includes a rotor core provided with a protrusion structure and one or more ferrite magnets coupled to the rotor core to provide a magnetic force. By using a ferrite magnet, when compared to a conventional universal motor, a superior efficiency is obtained, and when compared to a BLDC motor using a Nd magnet, a low cost BLDC motor is implemented.

    Abstract translation: 通过使用具有成本效益的铁素体永磁体，具有高效率且降低制造成本的电动机装置包括可旋转轴，连接到轴的一侧的风扇以产生空气流;定子，其包括沿圆周方向布置的定子芯 以及缠绕在定子铁芯上的线圈，以及设置在定子的内侧并具有允许轴穿过转子的通道的圆筒形式的转子，包括：转子芯，其设置有突出结构和一个 或更多的铁氧体磁体，其耦合到转子芯以提供磁力。 通过使用铁氧体磁体，与以往的通用电动机相比，能够获得优异的效率，与使用Nd磁体的BLDC电动机相比，实现低成本的BLDC电动机。

    OPTICAL MEASUREMENT APPARATUS AND METHOD OF CONTROLLING THE SAME
    19.
    发明申请
    OPTICAL MEASUREMENT APPARATUS AND METHOD OF CONTROLLING THE SAME 审中-公开
    光学测量装置及其控制方法

    公开(公告)号：US20140002829A1

    公开(公告)日：2014-01-02

    申请号：US13927843

    申请日：2013-06-26

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Kwang Soo KIM ,  Hyun Jae Lee ,  Byeong Hwan Jeon ,  Chang Hoon Choi

    IPC: G01B11/28

    CPC classification number: G01B11/00 ,  G01B11/24 ,  G01B11/28 ,  G01B2210/56

    Abstract: According to example embodiments, an optical measurement apparatus may include: a station configured to support a measurement target; an image acquisition unit configured to acquire a one-dimensional (1D) line image of the measurement target; a driver configured to move the station and the image acquisition unit; and a controller. The controller may be configured to control the driver and the image acquisition unit to acquire a plurality of 1D line images of the measurement target while varying a distance between the image acquisition unit and the measurement target to generate a two-dimensional (2D) scan image from combining the plurality of 1D line images; and to detect a pattern of the measurement target based on comparing a plurality of 2D reference images and the 2D scan image. The optical measurement apparatus may measure critical dimensions of non-repeating ultrafine patterns at high speed.

    Abstract translation: 根据示例实施例，光学测量装置可以包括：被配置为支持测量目标的站; 图像获取单元，被配置为获取所述测量对象的一维（1D）线图像; 驱动器，被配置为移动所述站和所述图像获取单元; 和控制器。 控制器可以被配置为控制驱动器和图像获取单元，以在改变图像获取单元和测量对象之间的距离的同时获取测量对象的多个1D线图像，以生成二维（2D）扫描图像 从组合多个1D线图像; 并且基于比较多个2D参考图像和2D扫描图像来检测测量对象的图案。 光学测量装置可以高速度地测量非重复超细纹图案的临界尺寸。

    POSITION DETECTOR AND AUTOFOCUS CONTROL APPARATUS
    20.
    发明申请
    POSITION DETECTOR AND AUTOFOCUS CONTROL APPARATUS 有权
    位置检测器和自动控制装置

    公开(公告)号：US20130214121A1

    公开(公告)日：2013-08-22

    申请号：US13773736

    申请日：2013-02-22

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Hyun Jae LEE ,  Myoung Ki AHN ,  Kwang Soo KIM ,  In Ho SEO ,  Chang Hoon CHOI

    IPC: G02B27/40

    CPC classification number: G02B27/40 ,  G02B3/10 ,  G02B7/38

    Abstract: An autofocus control apparatus includes a beam splitter, a condenser lens and a detector. The beam splitter directs light beams from a light source toward a sample and passes light beams reflected from the sample to the condenser lens. The condenser lens condenses the light beams, and the detector detects a focal point deviation of the sample relative to a focal point of the condenser lens. The focal point deviation is detected based on an intersection of a focal line passing through different focal points of the condenser lens and a light receiving plane configured to receive the light beams passing through the condenser lens.

    Abstract translation: 自动对焦控制装置包括分束器，聚光透镜和检测器。 分束器将来自光源的光束引向样品，并将从样品反射的光束传递到聚光透镜。 聚光透镜冷凝光束，并且检测器检测样品相对于聚光透镜的焦点的焦点偏差。 基于通过聚光透镜的不同焦点的焦点线和被配置为接收通过聚光透镜的光束的受光面的交点，检测焦点偏差。

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