Abstract:
The invention provides an integrated circuit device. The integrated circuit device includes a substrate. A first capacitor is disposed on the substrate. A first metal pattern is coupled to a first electrode of the first capacitor. A second metal pattern is coupled to a first electrode of the second capacitor. A third metal pattern is disposed over the first and second metal patterns. The third metal pattern covers the first capacitor, the first metal pattern, and the second metal pattern. The third metal pattern is electrically grounded. An inductor is disposed over the third metal pattern.
Abstract:
A pin arrangement adapted to a FPC connector is provided. The pin arrangement includes a pin lane. The pin lane includes a pair of ground pins, a pair of differential pins and at least one not-connected (NC) pin. The differential pins are located between the pair of ground pins. The at least one NC pin is located between the pair of differential pins or between one of the pair of ground pins and one of the pair of differential pins adjacent thereto. By adding the at least one NC pin between the pair of differential pins and/or between the differential pin and the ground pin adjacent thereto, a distance between each of the pair of the differential pins and/or between the differential pin and the ground pin is increased, and thus a differential characteristic impedance of the pair of differential pins is raised to reduce the impact of impedance mismatch.
Abstract:
A transmittal system including an extension device, a connection device, and an impedance device is disclosed. The extension device includes a first connection port and is coupled to a peripheral device. The connection device includes a second connection port and a third connection port. The second connection port is coupled to the first connection port. The third connection port is coupled to an electronic device. The impedance device connects at least one of the first, the second and the third connection ports to ground.
Abstract:
The invention provides an integrated circuit device. The integrated circuit device includes a substrate. A first capacitor is disposed on the substrate. A first metal pattern is coupled to a first electrode of the first capacitor. A second metal pattern is coupled to a first electrode of the second capacitor. A third metal pattern is disposed over the first and second metal patterns. The third metal pattern covers the first capacitor, the first metal pattern and the second metal pattern. The third metal pattern is electrically grounding. An inductor is disposed over the third metal pattern.
Abstract:
A through-hole layout structure is suitable for a circuit board. The through-hole layout structure includes a pair of first differential through-holes, a pair of second differential through-holes, a first ground through-hole, a second ground through-hole, and a third ground through-hole, which are all arranged on a first line. The first ground through-hole is located between the pair of first differential through-holes and the pair of second differential through-holes. The pair of first differential through-holes is located between the first ground through-hole and the second ground through-hole. The pair of second differential through-holes is located between the first ground through-hole and the third ground through-hole.
Abstract:
A circuit layout structure is suitable for a circuit board and includes following components. A first differential pair and a second differential pair respectively extend from the inside of a chip area of the circuit board to the outside of the chip area through a first patterned conductive layer of the circuit board, and respectively extend between the chip area and a port area of the circuit board through a second patterned conductive layer of the circuit board. A third differential pair extends from the chip area to the port area through the first patterned conductive layer. A first ground plane is constituted by the first patterned conductive layer. Orthogonal projections of the first differential pair and the second differential pair on the second patterned conductive layer overlap the first ground plane.