摘要:
A semiconductor integrated circuit device is provided, in which a node from which an output signal of a level shifter is sent can be initialized such that the potential thereof be set at a desired logic level at the time of power supply.The semiconductor integrated circuit device includes a level shifter 6 and two capacitors N10 and C0. The level shifter 6 receives an input signal and converts the received signal to a signal having a voltage amplitude greater than that of the received signal, then to provide the signal to a node D3. The capacitor N10 is connected to the node D3, and the capacitor C0 is connected in series with the capacitor N10. The capacitor N10 is formed of a MOS transistor having a gate connected to the node D3 and a source and a drain both connected to the capacitor C0.
摘要:
A local sense amplifier drives a global bit line pair by potentials of data storage nodes when a global word line attains an H level. A global sense amplifier amplifies the potential difference of data storage nodes when a global sense enable signal attains an H level. The global sense enable signal is inverted by an inverter to be provided to a global word driver. When the global word line attains an L level by the global word driver, the local sense amplifier suppresses the drive of the global bit line pair.
摘要:
Transistors (MP1 and MP2) supply a current (I.sub.0) for nodes (K and L), respectively. Transistors (MN10 and MN11) draw the same current from nodes (K and L), respectively. A parallel connection of serial connections (N1 and N2) draws a current (I.sub.1) from the node (K) only when an exclusive OR of clocks (S1 and S2) is "H". On the other hand, a parallel connection of serial connections (N3 and N4) draws a current (I.sub.1) from the node (L) only when the exclusive OR of clocks (S1 and S2) is "L". When the current (I.sub.1) is drawn from the node (K), the current (I.sub.1) flows out from the node (L) and when the current (I.sub.1) is drawn from the node (L), the current (I.sub.1) flows into the node (L). In the serial connections (N1 to N4), each of the clocks (S1 and S2) and their inverted signals (S1B and S2B) is applied to one of the gates of the transistors (MN1 to MN8) and therefore a uniform input load is obtained. With this configuration provided is a 90-degree phase shifter which achieves the uniform input load to improve a phase offset.
摘要:
In a synchronous semiconductor memory device in which an internal clock signal from an internal timing clock signal generating circuit is branched in the form of a tree by driver circuits and applied to output buffers and data are output in synchronization with the internal clock signal, the driver circuit of the first stage is constituted by an NAND gate and an inverter. When output is to be temporarily stopped, an enabling signal is set to "L" level, so that the NAND gate is closed, output of the clock signal to each driver circuit is stopped, and thus power consumption is reduced.
摘要:
A voltage controlled delay circuit having the same structure, except for a loop, as a voltage controlled oscillator included in a PLL circuit which in turn generates an internal clock signal from an external clock signal is controlled by a control voltage from the PLL circuit, and the delay output of the voltage controlled delay circuit is selected by a selection circuit in accordance with the output signal of a vernier-adjusting counter in order to generate a read clock signal. Therefore, a vernier for optimizing data input timing in a controller can be realized which always has a constant delay amount regardless of a change in operating environment.
摘要:
A power source potential VDD and a ground potential GND are supplied to a memory cell which belongs to a selected column. The power source potential VDD and an intermediate potential V.sub.p are supplied to a memory cell which belongs to a non-selected column. Even if an access transistor of the memory cell which belongs to a selected word line and the non-selected column conducts, a current which flows in a drive transistor is suppressed.
摘要:
There is disclosed a rapidly and correctly readable semiconductor device wherein a clamping transistor (Pcr.sub.-- 0) having a threshold voltage (Vthp) precharges a pair of bit lines (BIT.sub.-- 0, BIT.sub.-- 1) at a precharge potential (VDD-.vertline.Vthp.vertline.) when transistors (Pprc.sub.-- 0, Pprc.sub.-- 1) are conducting, and a write circuit (3) includes a clamping transistor (Pcr.sub.-- 1) having the same threshold voltage (Vthp) as the clamping transistor (Pcr.sub.-- 0), and inverters (23, 24) responsive to input data (DIN.sub.-- 0, DIN.sub.-- 1) for outputting signals which are "H" at the precharge potential (VDD-.vertline.Vthp.vertline.) and "L" at the ground potential to a pair of write input lines (WD.sub.-- 0, WD.sub.-- 1), respectively.
摘要:
A circuit module includes a connector terminal (4A) provided on a front surface of a printed wiring board (2) and connected to a data pin (DQt) of a memory IC (3) through an interconnect line (5a). A conductive connector terminal (4c) corresponds to the connector terminal (4a) and is provided on a back surface of the printed wiring board (2). A through hole (16) extends between part of the front surface of the printed wiring board (2) where the connector terminal (4a) is formed and part of the back surface thereof where the conductive connector terminal (4c) is formed. A conductor fills the through hole (16), thereby suppressing skews resulting from a difference in interconnect line length on the circuit module and decreasing a stub capacitance to achieve the reduction in power consumption.
摘要:
Provided is a semiconductor memory having a layout structure in which a memory cell has excellent patterning controllability. A pattern of element components (active regions 10 to 15 and 21 to 23 and polysilicon regions 31 to 42) of a memory cell for one memory cell unit of a memory cell array region 1 is identical to that of a dummy cell of a peripheral dummy cell region 3, and both patterns present a line symmetrical relationship with respect to a boundary line BC1. In addition, a pattern of the memory cell for one memory cell unit of the memory cell array region 1 is identical to that of a dummy cell of a power wiring region 2, and both patterns present a line symmetrical relationship with respect to a boundary line BC2.
摘要:
Provided is a DLL circuit that can execute a precise delay synchronization operation without increasing the variable delay time range of a delay line. The DLL circuit comprises a phase comparator (3), a charge pump (6), an LPF (8) and a delay line (9), and operates to match phases of an input signal (CLKIN) and a feedback signal (FBCLK). The phase comparator (3) always outputs a phase comparison result that causes a delay time of the delay line (9) to increase, at the time of initial operation after a reset operation. The LPF (8) outputs a delay adjusting signal (S8) indicating that a delay time due to the delay line (9) becomes the minimum, in executing a reset.