公开(公告)号：US09494651B2

公开(公告)日：2016-11-15

申请号：US14592585

申请日：2015-01-08

Applicant: Andrzej Wlodzimierz Nawrocki

Inventor： Andrzej Wlodzimierz Nawrocki

IPC: G01R31/28 ,  G01R31/3187 ,  G01R31/3185 ,  G01R31/3167 ,  H02M1/00 ,  G01N1/00

CPC classification number: G01R31/3187 ,  G01N1/00 ,  G01N2201/00 ,  G01R31/3167 ,  G01R31/318508 ,  H02M1/00

Abstract: Functional diagnostic testing of an electronic circuit board assembly with one or more embedded channels to be tested includes steps of: (a) connecting a channel under test; (b) imposing a known digital or analog voltage, as appropriate for a channel under test, that is generated by a digital or analog output of the electronic circuit board assembly; and (c) comparing data read by the channel under test with the stored value of the imposed voltage and required tolerance to determine whether the channel under test is within specifications. Diagnostic test implemented by digital logic and software residing onboard the electronic circuit board assembly. Execution of software or firmware code segment controls the diagnostic test sequence. Signal switching is facilitated by digital and analog multiplexers.

Abstract translation: 具有一个或多个要测试的嵌入式通道的电子电路板组件的功能诊断测试包括以下步骤：（a）连接被测通道; （b）施加由所述电子电路板组件的数字或模拟输出产生的适用于被测信道的已知数字或模拟电压; 和（c）将被测试通道读取的数据与所施加的电压的存储值和所需的容限进行比较，以确定被测信道是否在规范内。 由数字逻辑和软件实现的诊断测试驻留在电子电路板组件上。 执行软件或固件代码段来控制诊断测试顺序。 数字和模拟多路复用器便于信号切换。

公开(公告)号：US20160252571A1

公开(公告)日：2016-09-01

申请号：US15055200

申请日：2016-02-26

Applicant: Toyota Jidosha Kabushiki Kaisha

Inventor： Yohei Iwahashi ,  Hidemi Senda

IPC: G01R31/28 ,  G01R31/26 ,  H01L21/687 ,  H01L21/66 ,  H01L21/67

CPC classification number: G01R31/2875 ,  G01N2201/00 ,  G01R31/26 ,  H01L21/00 ,  H01L22/14 ,  H01L22/20 ,  H01L2221/00

Abstract: A manufacturing method of a semiconductor device is provided with an inspecting of a semiconductor substrate by an inspection method, the method including heating the semiconductor substrate, measuring first and second characteristics. The measuring of a first characteristic is performed by bringing a plurality of probes into contact with the heated semiconductor substrate and making a first electric current flow in the semiconductor substrate. The measuring of a second characteristic is performed, after the measuring of the first characteristic, by bringing a plurality of probes into contact with the heated semiconductor substrate and making a second electric current flow in the semiconductor substrate. A number of the plurality of probes used in the measuring of the second characteristic is larger than a number of the plurality of probes used in the measuring of the first characteristic. The second electric current is larger than the first electric current.

Abstract translation: 半导体器件的制造方法通过检查方法来检查半导体衬底，该方法包括加热半导体衬底，测量第一和第二特性。 通过使多个探针与被加热的半导体衬底接触并使半导体衬底中的第一电流流动来进行第一特性的测量。 在测量第一特性之后，通过使多个探针与加热的半导体衬底接触并在半导体衬底中产生第二电流来执行第二特性的测量。 在第二特性的测量中使用的多个探针的数量大于在第一特性的测量中使用的多个探针的数量。 第二电流大于第一电流。

公开(公告)号：US09385448B2

公开(公告)日：2016-07-05

申请号：US13956331

申请日：2013-07-31

Applicant: Quest Integrated, Inc.

Inventor： Phillip D. Bondurant ,  Giovanni Nino ,  David W. Rook ,  Anthony Mactutis ,  David Bothell

IPC: G01R19/00 ,  H01R11/00 ,  G01N29/22 ,  G01N17/04 ,  G01R1/04 ,  G01N1/00 ,  F16B1/00

CPC classification number: H01R11/00 ,  F16B2001/0064 ,  G01N1/00 ,  G01N17/04 ,  G01N29/223 ,  G01N2201/00 ,  G01N2203/00 ,  G01N2291/0289 ,  G01N2291/2691 ,  G01N2291/2694 ,  G01R1/0416

Abstract: The systems, apparatus, and methods disclosed herein provide access to systems located within a closed structure, such that the systems are traditionally difficult for humans to access. Exemplary structures include an engine compartment, airplane wing, or fuselage. This access allows a system located within the structure to be electrically coupled with an electrical I/O device located outside the structure. Access to a system located within the closed structure is provided by way of a hole.

Abstract translation: 本文公开的系统，装置和方法提供对位于封闭结构内的系统的访问，使得系统传统上难以人类访问。 示例性结构包括发动机舱，飞机机翼或机身。 该访问允许位于结构内的系统与位于结构外部的电I / O设备电耦合。 通过孔提供对位于封闭结构内的系统的访问。

公开(公告)号：US20150204943A1

公开(公告)日：2015-07-23

申请号：US14603251

申请日：2015-01-22

Applicant: Shing Kai YIP ,  Chi Wah CHENG

Inventor： Shing Kai YIP ,  Chi Wah CHENG

IPC: G01R31/28 ,  G01R31/26 ,  G01R1/067

CPC classification number: G01R31/2891 ,  G01N1/00 ,  G01N2201/00 ,  G01R1/00 ,  G01R1/06705 ,  G01R31/26 ,  G01R31/2893

Abstract: A test handler comprises an orientation changing device having a device holder for holding electronic devices, the device holder having a vertical rotary axis. A conveying device is operative to convey electronic devices to the device holder, and a rotary motor connected to the device holder is operative to rotate the device holder about the vertical rotary axis to change an orientation of the electronic device held on it. A rotary turret of the test handler has a plurality of pick heads arranged on the rotary turret, and each pick head is configured to pick up electronic devices from the device holder.

Abstract translation: 测试处理器包括具有用于保持电子设备的设备保持器的定向改变设备，该设备保持器具有竖直旋转轴线。 传送装置用于将电子装置传送到装置保持器，并且连接到装置保持器的旋转电机可操作以围绕垂直旋转轴线旋转装置保持架以改变保持在其上的电子装置的取向。 测试处理器的旋转转台具有设置在旋转转台上的多个拾取头，并且每个拾取头构造成从装置保持器拾取电子装置。

公开(公告)号：US20130293242A1

公开(公告)日：2013-11-07

申请号：US13978645

申请日：2012-08-30

Applicant: Gabriel Kohn ,  Leonard Horey ,  William G. McCoy

Inventor： Gabriel Kohn ,  Leonard Horey ,  William G. McCoy

IPC: G01R31/02

CPC classification number: G01R31/026 ,  G01K7/16 ,  G01K13/00 ,  G01K15/007 ,  G01N1/00 ,  G01N2201/00 ,  G01R31/021 ,  G01R31/2829 ,  H01L2221/00 ,  H05B1/0272 ,  H05B3/342 ,  H05B2203/019 ,  H05B2203/02

Abstract: A circuit integrity detection system for use in detecting the integrity of a sensing wire in a heating pad wherein the integrity of the sensing wire is determined by first driving one end of the sensing wire with a low voltage electrical test signal from a microcontroller, and then checking whether the test signal is present on the other end of the sensing wire, in order to distinguish the test signal from the standard AC line voltage present on the sensing wire, the electrical test signal is preferably of a different frequency than the standard 50-60 Hz AC line voltage. In one embodiment, the test signal frequency is approximately 30 kHz.

Abstract translation: 一种电路完整性检测系统，用于检测加热垫中的感测线的完整性，其中感测线的完整性通过首先用来自微控制器的低电压电测试信号驱动感测线的一端来确定，然后 检查测试信号是否存在于感测线的另一端，为了区分测试信号与感测线上存在的标准AC线电压，电测试信号优选地与标准50- 60 Hz交流线路电压。 在一个实施例中，测试信号频率为大约30kHz。

公开(公告)号：US20130214797A1

公开(公告)日：2013-08-22

申请号：US13742443

申请日：2013-01-16

Applicant: Roman Gruden

Inventor： Roman Gruden

IPC: G01N27/22

CPC classification number: G01N27/221 ,  A47L15/4297 ,  D06F39/004 ,  G01N1/00 ,  G01N27/30 ,  G01N33/18 ,  G01N2201/00 ,  G01R1/00

Abstract: The invention relates to a sensor device for detecting properties of fluid media in a container, comprising at least one base plate (42) made of an insulating material and having a first surface (42a) exposed to the medium (3), at least two sensor elements (41) having at least a first and a second electrode (41a, 41b) arranged insulated from one another on the first surface of the base plate and around which the medium flows, the at least two sensor elements being arranged in a predetermined spatial position relative to each other.

Abstract translation: 本发明涉及一种用于检测容器中流体介质性质的传感器装置，包括至少一个由绝缘材料制成并具有暴露于介质（3）的第一表面（42a）的基板（42），至少两个 传感器元件（41）具有至少第一和第二电极（41a，41b），所述第一和第二电极彼此绝缘地布置在所述基板的第一表面上，所述介质流过所述第一和第二电极，所述至少两个传感器元件布置成预定的 相对于彼此的空间位置。

公开(公告)号：US10082525B2

公开(公告)日：2018-09-25

申请号：US15511733

申请日：2015-09-18

Applicant: NHK Spring Co., Ltd.

Inventor： Yoshio Yamada ,  Kohei Hironaka

IPC: G01R1/067 ,  G01R1/073 ,  H01L21/00

CPC classification number: G01R1/07357 ,  G01N2201/00 ,  G01R1/06722 ,  G01R1/07378 ,  H01L21/00 ,  H01L2221/00 ,  H01R13/2421 ,  H01R2201/20

Abstract: A probe unit according to the present invention is suitable for allowing a large current to flow. In the probe unit that accommodates a plurality of contact probes for electrically connecting an inspection target object and a signal processing device used to output an inspection signal, both ends of a large current probe (3) are electrically connected to electrodes of a contact target object, and a large current is made to flow via a metal block (50) that comes into contact with both end portions of the large current probe (3).

公开(公告)号：US20180074095A1

公开(公告)日：2018-03-15

申请号：US15439967

申请日：2017-02-23

Applicant: CHUNGHWA PRECISION TEST TECH. CO., LTD.

Inventor： Chih-Peng HSIEH

IPC: G01R1/067 ,  G01R31/28

CPC classification number: G01R1/06794 ,  G01N1/00 ,  G01N2201/00 ,  G01R1/06722 ,  G01R1/44 ,  G01R31/2831 ,  H01L2221/00

Abstract: A probe having a sliding rail is provided and includes a probe head, a probe tail, an elastic element made of an elastic material and connected between the probe head and the probe tail, and a sliding rail assembly. The sliding rail assembly includes a slide rail and a position limit protrusion. The slide rail has a fixed end and a free end. The fixed end is fixedly connected to the probe tail, and the free end extends to the probe head. The position limit protrusion is fixedly connected to the probe head, and has a sliding slot formed thereon through which the slide rail can pass. The sliding rail assembly is made of a conductive material, and a cross-section area of the slide rail is greater than a cross-section area of the elastic material of the elastic element.

公开(公告)号：US09916710B2

公开(公告)日：2018-03-13

申请号：US14905076

申请日：2014-04-07

Applicant: NIDEC SANKYO CORPORATION

Inventor： Shogo Momose

IPC: G01R33/12 ,  G07D5/08 ,  G01N1/00 ,  H01F1/00

CPC classification number: G07D5/08 ,  G01N1/00 ,  G01N2201/00 ,  H01F1/00

Abstract: A coin-shaped detection object discriminating device may be used with a detection object in a coin shape, and the coin-shaped detection object discriminating device may include a passage through which the detection object is passed; a permanent magnet; and a magnetic sensor disposed opposite to the permanent magnet across the passage.

公开(公告)号：US09810759B2

公开(公告)日：2017-11-07

申请号：US14995521

申请日：2016-01-14

Applicant: Texas Instruments Incorporated

Inventor： Arup Polley ,  Russell Melvin Rosenquist ,  Terry Lee Sculley

IPC: G01R35/00 ,  G01R33/07 ,  G01N1/00 ,  H04J1/00

CPC classification number: G01R35/005 ,  G01N1/00 ,  G01N2201/00 ,  G01R33/0035 ,  G01R33/07 ,  H04J1/00

Abstract: A closed-loop calibration scheme is configured to allow a device to remain in continuous operation. A signal generator device provides a pseudorandom sequence for a signal received by a magnetic field magnetic field sensor, such as a Hall-effect sensor. A signal decoder circuit receives the output signal and decouples the generated spread spectrum signal from the interference by measuring the gain in the overall signal. The decoder device distinguishes the known spread spectrum signal from any perturbation effects of particular bandwidths. A processing circuit then outputs a signal that has an operation parameter that has been adjusted to compensate for the perturbation effects. The processing circuit provides the receiver circuit with the compensation signal, hence forming a closed-loop calibration configuration.