摘要:
In one embodiment, the method includes receiving a request to read data stored in a first memory cell associated with a first word line, and performing a first read operation on at least one memory cell associated with a second word line in response to the request. The second word line follows the first word line in a word line programming order, and the first read operation is performed over a first time period. The method further includes performing a second read operation on the first memory cell based on output from the first read operation. The second read operation is performed for a second time period, and the first time period is shorter than the second time period if output from performing the first read operation indicates the first memory cell is not coupled.
摘要:
A method programming multi-bit data to multi-level non-volatile memory cells (MLC) includes; programming a first page of data to the MLC, programming a first page flag to an initial first flag state in response in the programming of the first page, programming a second page of data to the MLC, in response to programming the second page, determining whether the first page has been programmed and if the first page has been programmed, programming the first page flag to a final first flag state different from the initial first flag state in response to programming of the second page, and if the first page has not been programmed, inhibiting programming of the first page flag during programming of the second page.
摘要:
A nonvolatile memory device includes a memory cell, a bit line, a page buffer, and a control logic. The page buffer is connected to the memory cell through the bit line and the page buffer is configured to precharge the bit line to perform a desired operation. The desired operation may be one of a read operation and a verify operation. The control logic is configured to control bit line development time differently according to a temperature after precharging the bit line during the desired operation. The control logic is configured to determine the bit line development time according to a period of a reference clock signal that includes a different frequency depending on the temperature and/or a temperature compensation pulse signal including a pulse width that varies based on the temperature.
摘要:
In a program operation a plurality of memory cells are programmed depending on data stored in first and second data latches. Verification read operations are performed for the plurality of memory cells using different verification voltages respectively corresponding to different program states and collecting verification read results of the verification read operations. The first data latches and the second data latches are updated depending on the collected verification read results.
摘要:
In one embodiment, the method includes receiving a request to read data stored in a first memory cell associated with a first word line, and performing a first read operation on at least one memory cell associated with a second word line in response to the request. The second word line follows the first word line in a word line programming order, and the first read operation is performed over a first time period. The method further includes performing a second read operation on the first memory cell based on output from the first read operation. The second read operation is performed for a second time period, and the first time period is shorter than the second time period if output from performing the first read operation indicates the first memory cell is not coupled.
摘要:
A program verification circuit comprises a failed state counting unit and a failed bit counting unit. The failed state counting unit counts failed program states among a plurality of program states, and generates a first program mode signal indicating whether counting of failed bits is required. The failed bit counting unit selectively counts failed bits in response to the first program mode signal, and generates a second program mode signal indicating whether a program operation is completed.
摘要:
A method of programming a memory device includes comparing a first verify voltage and a distribution voltage of at least one memory cell, and if a result of the comparison is a pass, adjusting the distribution voltage until the distribution voltage is higher than a second verify voltage while comparing the distribution voltage and the second verify voltage.
摘要:
A nonvolatile memory device with a memory cell array including a plurality of memory cells coupled to first through M-th wordlines and first through N-th bitlines (M>2, N>2), and a page buffer circuit including first through N-th page buffers that are coupled to the first through N-th bitlines, respectively, and generate first through N-th output data, respectively. A K-th page buffer includes first through L-th latches which generate read data by sampling a voltage of a K-th output line, which is discharged through a K-th bitline, at different sampling timings after a read voltage is applied to a P-th wordline (K≦N, L>1, P≦M). The K-th page buffer outputs the first output data if an error in the read data of the first latch is correctable.
摘要:
A method of programming a nonvolatile memory device comprises programming target memory cells among a plurality of memory cells connected to a wordline, performing a first sensing operation on the plurality of memory cells, and selectively performing a second sensing operation on the target memory cells based on a result of the first sensing operation.
摘要:
In one embodiment, the method includes receiving a request to read data stored in a first memory cell associated with a first word line, and performing a first read operation on at least one memory cell associated with a second word line in response to the request. The second word line follows the first word line in a word line programming order, and the first read operation is performed over a first time period. The method further includes performing a second read operation on the first memory cell based on output from the first read operation. The second read operation is performed for a second time period, and the first time period is shorter than the second time period if output from performing the first read operation indicates the first memory cell is not coupled.