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225 条记录 (耗时 0.033 秒)

    Fluorogenic protease substrates based on dye-dimerization
    22.
    发明授权
    Fluorogenic protease substrates based on dye-dimerization 失效
    基于染料二聚化的荧光蛋白酶底物

    公开(公告)号：US07256012B2

    公开(公告)日：2007-08-14

    申请号：US10930522

    申请日：2004-08-31

    申请人： Ai-Ping Wei ,  Michael George Williams

    发明人： Ai-Ping Wei ,  Michael George Williams

    IPC分类号： C12Q1/37 ,  C12Q1/04 ,  C07K7/06 ,  G01N2/64

    CPC分类号： C07K7/06 ,  C12Q1/37 ,  C12Q2337/40 ,  Y02A50/451

    摘要： A method of biological assay comprises the steps of providing an enzyme substrate comprising two fluorescence dye groups bound to a flexible peptide, the dye groups being of proximity sufficiently close so as to allow free energy attractions to draw the dyes together to essentially self-quench fluorescence of the dye groups, wherein self quenching of fluorescence of the dye groups is effected by dye dimerization or stacking, and enzymatically cleaving the peptide to release the fluorescence dye groups from dye dimerization or stacking, thereby producing an increase in fluorescence intensity. A protease substrate for use in the method of the invention is also disclosed. This invention finds use in detection and identification of microorganisms, sterilization assurance, pharmaceutical discovery, enzyme assays, immunoassays, and other biological assays.

    摘要翻译： 一种生物测定方法包括以下步骤：提供包含与柔性肽结合的两个荧光染料基团的酶底物，所述染料组的接近度足够接近，以便使自由能吸引力将染料一起吸收到基本上自熄灭荧光 的染料基团，其中染料基团的荧光自发淬灭通过染料二聚化或堆叠进行，并且酶切割肽以使荧光染料基团从染料二聚化或堆叠释放，从而产生荧光强度的增加。 还公开了用于本发明方法的蛋白酶底物。 本发明用于微生物的检测和鉴定，灭菌保证，药物发现，酶测定，免疫测定和其他生物测定。

    Latching micro-magnetic switch array
    23.
    发明授权
    Latching micro-magnetic switch array 有权
    锁存微磁开关阵列

    公开(公告)号：US07253710B2

    公开(公告)日：2007-08-07

    申请号：US11179809

    申请日：2005-07-13

    申请人： Jun Shen ,  Cheng Ping Wei

    发明人： Jun Shen ,  Cheng Ping Wei

    IPC分类号： H01H51/22

    CPC分类号： H01H50/005 ,  H01H67/22 ,  H01H2050/007

    摘要： Systems and methods for actuating micro-magnetic latching switches in an array of micro-magnetic latching switches are described. The array of switches is defined by Y rows aligned with a first axis and X columns aligned with a second axis. Each switch in the array of switches is capable of being actuated by a coil. In an aspect, a row of coils is moved along the second axis to be positioned adjacent to a selected one of the Y rows of switches. A sufficient driving current is proved to a selected coil in the row of coils to actuate a selected switch in the selected one of the Y rows of switches. In another aspect, a plurality of first axis drive signals and a plurality of second axis drive signals are generated. These signals drive an array of coils, wherein each coil in the array of coils is positioned adjacent to a corresponding switch in the array of switches. Each first axis drive signal is coupled to coils in a corresponding column of coils in the array of coils. Each second axis drive signal is coupled to coils in a corresponding row of coils in the array of coils. In another aspect, a three-dimensional array of switches is actuated by drive signals that drive a three-dimensional array of coils.

    摘要翻译： 描述了用于在微型磁性锁存开关阵列中致动微型磁性闭锁开关的系统和方法。 开关阵列由与第一轴对准的Y列和与第二轴对齐的X列限定。 开关阵列中的每个开关都能够被线圈驱动。 在一个方面，一排线圈沿着第二轴线移动以被定位成与所选择的Y行开关中的一个相邻。 对线圈中的所选择的线圈证明足够的驱动电流，以驱动所选择的Y行开关中的选定开关。 另一方面，产生多个第一轴驱动信号和多个第二轴驱动信号。 这些信号驱动线圈阵列，其中线圈阵列中的每个线圈被定位成与开关阵列中相应的开关相邻。 每个第一轴驱动信号耦合到线圈阵列中的相应的线圈列中的线圈。 每个第二轴驱动信号耦合到线圈阵列中相应行的线圈中的线圈。 在另一方面，开关的三维阵列由驱动线圈三维阵列的驱动信号驱动。

    Control of twist, crown and camber for sliders using location sensitive scribing
    26.
    发明授权
    Control of twist, crown and camber for sliders using location sensitive scribing 有权
    使用位置敏感划线控制滑块的扭转，表冠和弯度

    公开(公告)号：US07133257B2

    公开(公告)日：2006-11-07

    申请号：US11038332

    申请日：2005-01-18

    申请人： Ping-Wei Chang ,  Chie Ching Poon ,  John Raniseski ,  Andrew C. Tam

    发明人： Ping-Wei Chang ,  Chie Ching Poon ,  John Raniseski ,  Andrew C. Tam

    IPC分类号： G11B5/60 ,  G11B5/127

    CPC分类号： G11B5/4826 ,  G11B5/6082 ,  Y10T29/49036

    摘要： Embodiments include a method for adjusting the twist, crown and camber of an air bearing surface a slider to substantially match final target values for twist, crown and camber, the slider having a back surface opposite the air bearing surface. The method includes the steps of measuring the twist, crown and camber of the at least one slider. A first group of twist scribes may be formed on the back surface. A first group of crown and camber scribes are formed on the back surface. The twist, crown and camber of the slider are measured and comparing to the final target values. Additional twist scribes may be formed if the final target value for twist is not reached or if the final target value is exceeded. Additional crown and camber scribes may be formed if the final target values for crown and camber are not obtained.

    摘要翻译： 实施例包括一种用于调节空气轴承表面的扭转，冠部和弯度的方法，该滑块用于基本上匹配用于扭转，冠部和弯度的最终目标值，滑块具有与空气支承表面相对的后表面。 该方法包括以下步骤：测量至少一个滑块的扭转，凸度和弯度。 可以在后表面上形成第一组扭转划线。 在背面形成第一组冠和弧形文字。 测量滑块的扭曲，凸度和弯度，并与最终目标值进行比较。 如果没有达到扭曲的最终目标值或超过最终目标值，则可以形成额外的扭转划线。 如果没有获得冠和弯度的最终目标值，则可以形成额外的冠和弧形划线。

    SOI SRAM products with reduced floating body effect and the method thereof
    28.
    发明申请
    SOI SRAM products with reduced floating body effect and the method thereof 有权
    具有减少浮体效应的SOI SRAM产品及其方法

    公开(公告)号：US20060231891A1

    公开(公告)日：2006-10-19

    申请号：US11105452

    申请日：2005-04-14

    申请人： Ping-Wei Wang

    发明人： Ping-Wei Wang

    IPC分类号： H01L27/12

    CPC分类号： H01L21/84 ,  H01L21/743 ,  H01L23/535 ,  H01L27/105 ,  H01L27/11 ,  H01L27/1116 ,  H01L27/1203 ,  H01L2924/0002 ,  H01L2924/00

    摘要： A memory device is formed on a semiconductor-on-insulator (SOI) structure, the SOI structure including a substrate, an insulating layer on the substrate, and a semiconductor film on the insulating layer. The memory device includes a memory array in a memory region of the SOI structure, a plurality of first substrate contacts in the peripheral region of the memory device, and a plurality of second substrate contacts in the memory region of the SOI structure, wherein the first substrate contacts and the second substrate contacts are formed in and over the semiconductor film and in the insulating layer and are electrically connected to the substrate of the SOI structure.

    摘要翻译： 存储器件形成在绝缘体上半导体（SOI）结构上，SOI结构包括衬底，衬底上的绝缘层和绝缘层上的半导体膜。 存储器件包括在SOI结构的存储器区域中的存储器阵列，存储器件的外围区域中的多个第一衬底触点和SOI结构的存储区域中的多个第二衬底触点，其中第一 衬底触点和第二衬底触点形成在半导体膜中和绝缘层中并且在绝缘层中并且与SOI结构的衬底电连接。

    Doping of semiconductor fin devices
    29.
    发明申请
    Doping of semiconductor fin devices 有权

    公开(公告)号：US20060220133A1

    公开(公告)日：2006-10-05

    申请号：US11446890

    申请日：2006-06-05

    申请人： Yee-Chia Yeo ,  Ping-Wei Wang ,  Hao-Yu Chen ,  Fu-Liang Yang ,  Chenming Hu

    发明人： Yee-Chia Yeo ,  Ping-Wei Wang ,  Hao-Yu Chen ,  Fu-Liang Yang ,  Chenming Hu

    IPC分类号： H01L27/12

    CPC分类号： H01L29/785 ,  H01L21/26586 ,  H01L29/66803

    摘要： A semiconductor structure includes of a plurality of semiconductor fins overlying an insulator layer, a gate dielectric overlying a portion of said semiconductor fin, and a gate electrode overlying the gate dielectric. Each of the semiconductor fins has a top surface, a first sidewall surface, and a second sidewall surface. Dopant ions are implanted at a first angle (e.g., greater than about 7°) with respect to the normal of the top surface of the semiconductor fin to dope the first sidewall surface and the top surface. Further dopant ions are implanted with respect to the normal of the top surface of the semiconductor fin to dope the second sidewall surface and the top surface.

    Wafer-level tester with magnet to test latching micro-magnetic switches
    30.
    发明授权
    Wafer-level tester with magnet to test latching micro-magnetic switches 失效

    公开(公告)号：US07005876B2

    公开(公告)日：2006-02-28

    申请号：US10823786

    申请日：2004-04-14

    申请人： Cheng Ping Wei ,  Jun Shen

    发明人： Cheng Ping Wei ,  Jun Shen

    IPC分类号： G01R31/26

    CPC分类号： H01H50/005 ,  B81C99/005 ,  H01H11/0062 ,  H01H2050/007

    摘要： A method, system, and apparatus for testing one or more micro-magnetic switches on a wafer is described. A magnet is positioned adjacent to a first switch on the wafer. A probe card is positioned adjacent to the first switch. The probe card mounts a first set of probes and a second set of probes. The first set of probes interface with contact areas of a coil associated with the first switch. The second set of probes interface with conductors on the wafer associated with the cantilever of the first switch. A current source is electrically coupled to the first set of probes. The current source activates the coil of the first switch using the first set of probes to switch the cantilever from a first state to a second state. A switch state monitor is electrically coupled to the second set of probes. The switch state monitor determines whether the cantilever of the first switch is in the first state prior to the current source activating the coil of the first switch. The switch state monitor also determines whether the cantilever is in the second state after the current source activates the coil of the first switch. A stepper motor moves the wafer relative to the magnet and probe card to test further switches on the wafer. An inker marks a switch on the wafer that has been determined by the switch state monitor to be defective.