Semiconductor package and method
    21.
    发明授权
    Semiconductor package and method 失效
    半导体封装及方法

    公开(公告)号:US06730989B1

    公开(公告)日:2004-05-04

    申请号:US09596130

    申请日:2000-06-16

    IPC分类号: H01L23544

    摘要: A semiconductor packaging arrangement, or module, includes a printed circuit board having an electrical interconnect thereon and a semiconductor package mounted to the printed circuit board. The semiconductor package includes a fractional portion of a semiconductor wafer having a plurality of integrated circuit chips thereon, such chips being separated by regions in the fractional portion of the wafer. The fractional portion of the wafer has a plurality of electrical contacts electrically connected to the chips. The package also includes a dielectric member having an electrical conductor thereon. The electrical conductor are electrically connected to the plurality of electrical contacts of the plurality of chips to electrically interconnect such plurality of chips with portions of the electrical conductor spanning the regions in the fractional portion of the wafer. A connector is provided for electrically connecting the electrical conductor of the package to the electrical interconnect of the printed circuit board.

    摘要翻译: 半导体封装装置或模块包括其上具有电互连的印刷电路板和安装到印刷电路板的半导体封装。 半导体封装包括其上具有多个集成电路芯片的半导体晶片的分数部分,这些芯片由晶片的分数部分中的区域分隔开。 晶片的分数部分具有电连接到芯片的多个电触点。 封装还包括其上具有电导体的电介质构件。 电导体电连接到多个芯片的多个电触头,以将这些多个芯片与跨越晶片的分数部分中的区域的电导体的部分电互连。 提供一种用于将封装的电导体电连接到印刷电路板的电互连的连接器。

    Semiconductor Memory Device with Hierarchical Bitlines
    24.
    发明申请
    Semiconductor Memory Device with Hierarchical Bitlines 有权
    具有分层位线的半导体存储器件

    公开(公告)号:US20120170356A1

    公开(公告)日:2012-07-05

    申请号:US13393216

    申请日:2010-07-30

    申请人: Thomas Vogelsang

    发明人: Thomas Vogelsang

    IPC分类号: G11C11/24 H01L21/8242

    摘要: A dynamic random access memory (DRAM) device has a hierarchical bitline structure with local bitlines and global bitlines formed on different metal layers. The local bitlines are separated into a plurality of local bitline sections, and bitline isolation switches are configured to connect or disconnect the local bitline sections to or from the global bitlines. As a result, the local bitlines with higher per-length capacitance can be made shorter, since the global bitline with lower per-length capacitance is used to route the signal from the cell capacitances of the memory cells to the remote sense amplifiers.

    摘要翻译: 动态随机存取存储器(DRAM)器件具有分层位线结构,其中局部位线和在不同金属层上形成的全局位线。 局部位线被分成多个本地位线部分,并且位线隔离开关被配置为将本地位线部分连接到全局位线或从全局位线断开连接。 结果,由于具有较低的每长度电容的全局位线用于将来自存储器单元的单元电容的信号路由到远程读出放大器,所以可以使具有较高每个长度电容的局部位线更短。

    CONFIGURABLE MEMORY BANKS OF A MEMORY DEVICE
    25.
    发明申请
    CONFIGURABLE MEMORY BANKS OF A MEMORY DEVICE 审中-公开
    存储设备的可配置存储器

    公开(公告)号:US20120166753A1

    公开(公告)日:2012-06-28

    申请号:US13394533

    申请日:2010-08-23

    申请人: Thomas Vogelsang

    发明人: Thomas Vogelsang

    IPC分类号: G06F12/00

    摘要: A memory device has a storage array having a plurality of accessible memory banks and a configurable first set of memory segments. The plurality of accessible memory banks include a second set of memory segments. During a first mode of operation, the first set of memory segments is configured to be an additional accessible memory bank. During a second mode of operation, a pair of memory segments in the first set of memory segments are configured to be an additional set of memory segments in each of the plurality of accessible memory banks.

    摘要翻译: 存储器件具有存储阵列,其具有多个可存取存储体和可配置的第一组存储器段。 多个可存储存储体包括第二组存储器段。 在第一操作模式期间,第一组存储器段被配置为附加的可访问存储体。 在第二操作模式期间,第一组存储器段中的一对存储器段被配置为在多个可存取存储体的每一个中的另外一组存储器段。

    SEMICONDUCTOR MEMORY HAVING NON-STANDARD FORM FACTOR
    26.
    发明申请
    SEMICONDUCTOR MEMORY HAVING NON-STANDARD FORM FACTOR 有权
    具有非标准形式因子的半导体存储器

    公开(公告)号:US20110185257A1

    公开(公告)日:2011-07-28

    申请号:US12693837

    申请日:2010-01-26

    申请人: Thomas Vogelsang

    发明人: Thomas Vogelsang

    IPC分类号: H03M13/05 G06F11/10 G06F12/02

    摘要: A semiconductor memory chip including error correction circuitry configured to receive data words from an external device, each data word comprising a binary number of data bits, and configured to error encode each data word to form a corresponding coded word comprising a non-binary number of data bits including the data bits of the data word and a plurality of error correction code bits. At least one memory cell array is configured to receive and store the coded word and partitioned based on the non-binary number of bits of the coded word so as to have a non-binary number of wordlines and provide the memory chip with an aspect ratio other than a 2:1 aspect ratio.

    摘要翻译: 一种半导体存储器芯片,包括错误校正电路,其被配置为从外部设备接收数据字,每个数据字包括二进制数量的数据位,并且被配置为对每个数据字进行错误编码以形成相应的编码字,所述对应的编码字包括非二进制数 数据位包括数据字的数据位和多个纠错码位。 至少一个存储单元阵列被配置为基于编码字的非二进制位数来接收和存储编码字并分区,以便具有非二进制数字的字线,并为存储器芯片提供宽高比 除了2:1的纵横比。

    CIRCUIT AND METHOD TO FIND WORDLINE-BITLINE SHORTS IN A DRAM
    27.
    发明申请
    CIRCUIT AND METHOD TO FIND WORDLINE-BITLINE SHORTS IN A DRAM 失效
    在DRAM中找到字线短路的电路和方法

    公开(公告)号:US20080273407A1

    公开(公告)日:2008-11-06

    申请号:US11744790

    申请日:2007-05-04

    申请人: Thomas Vogelsang

    发明人: Thomas Vogelsang

    IPC分类号: G11C7/24

    摘要: Method and apparatus for testing for a short between a wordline being tested and a bitline in a memory device. The method includes applying a first voltage to the bitline using a first voltage source and applying a second voltage to the wordline being tested using a second voltage source. The method further includes disconnecting the wordline being tested from the second voltage source; and after disconnecting the wordline being tested from the second voltage source, activating the wordline being tested, thereby connecting the wordline being tested to a wordline power supply line. A determination is made of whether a voltage of the wordline power supply line indicates a short between the wordline being tested and the bitline. The determination is based on the voltage of the wordline power supply line relative to the first voltage and the second voltage.

    摘要翻译: 在被测试的字线和存储器件中的位线之间测试短路的方法和装置。 该方法包括使用第一电压源向位线施加第一电压,并使用第二电压源向被测试的字线施加第二电压。 该方法还包括将正在测试的字线与第二电压源断开连接; 并且在断开正在测试的字线与第二电压源之间,激活被测试的字线,从而将被测试的字线连接到字线电源线。 确定字线电源线的电压是否表示正在被测试的字线和位线之间的短路。 该确定基于字线电源线相对于第一电压和第二电压的电压。

    Sense amplifier for eliminating leakage current due to bit line shorts
    28.
    发明授权
    Sense amplifier for eliminating leakage current due to bit line shorts 有权
    用于消除由于位线短路导致的漏电流的感应放大器

    公开(公告)号:US07227799B2

    公开(公告)日:2007-06-05

    申请号:US11118036

    申请日:2005-04-29

    申请人: Thomas Vogelsang

    发明人: Thomas Vogelsang

    IPC分类号: G11C7/00

    摘要: A sense amplifier comprises a transistor configured to be switched with a column select line to pass a bit line equalization voltage, an array equalize device coupled to the transistor for receiving the bit line equalization voltage, a sense amplifier equalize device, a multiplexer coupled between the sense amplifier equalize device and the array equalize device, and a cross-coupled amplifier latch coupled to the sense amplifier equalize device.

    摘要翻译: 读出放大器包括晶体管,其被配置为与列选择线切换以通过位线均衡电压;耦合到晶体管的阵列均衡器件,用于接收位线均衡电压;读出放大器均衡器件; 读出放大器均衡器件和阵列均衡器件,以及耦合到读出放大器的交叉耦合放大器锁存器来均衡器件。

    Standby current reduction over a process window with a trimmable well bias
    29.
    发明申请
    Standby current reduction over a process window with a trimmable well bias 失效
    通过可调整的井偏压在过程窗口上的待机电流减少

    公开(公告)号:US20050280083A1

    公开(公告)日:2005-12-22

    申请号:US10873010

    申请日:2004-06-22

    申请人: Thomas Vogelsang

    发明人: Thomas Vogelsang

    摘要: An integrated circuit device including a plurality of MOSFETs of similar type and geometry is formed on a substrate with an ohmic contact, and an adjustable voltage source on the die utilizing clearable fuses is coupled between the ohmic contact and the sources of the MOSFETs. After die processing, a post-processing test is performed to measure an operating characteristic of the die such as leakage current or switching speed, and an external voltage source is applied and adjusted to control the operating characteristic. The on-die fuses are then cleared to adjust the on-die voltage source to match the externally applied voltage. The operating characteristic may be determined by including a test circuit on the die to exhibit the operating characteristic such as a ring oscillator frequency. This approach to controlling manufacturing-induced device performance variations is well suited to efficient manufacture of small feature-size circuits such as DRAMs.

    摘要翻译: 在具有欧姆接触的衬底上形成包括具有相似类型和几何形状的多个MOSFET的集成电路器件,并且使用可清除熔丝的管芯上的可调电压源耦合在欧姆接触和MOSFET的源极之间。 在模具处理之后,进行后处理试验以测量管芯的工作特性,例如漏电流或开关速度,施加外部电压源并进行调整以控制工作特性。 然后清除管芯内保险丝以调整片上电压源以匹配外部施加的电压。 操作特性可以通过在芯片上包括测试电路来表现出诸如环形振荡器频率的工作特性来确定。 用于控制制造引起的器件性能变化的这种方法非常适合于诸如DRAM的小型特征尺寸电路的有效制造。

    Multiple chip semiconductor arrangement having electrical components in separating regions
    30.
    发明授权
    Multiple chip semiconductor arrangement having electrical components in separating regions 有权
    在分离区域中具有电气部件的多芯片半导体布置

    公开(公告)号:US06815803B1

    公开(公告)日:2004-11-09

    申请号:US09596129

    申请日:2000-06-16

    IPC分类号: H01L23544

    摘要: A semiconductor packaging arrangement, or module, includes a printed circuit board having an electrical interconnect thereon and a semiconductor package mounted to the printed circuit board. The semiconductor package includes a fractional portion of a semiconductor wafer having a plurality of integrated circuit chips thereon, such chips being separated by regions in the fractional portion of the wafer. The fractional portion of the wafer has a plurality of electrical contacts electrically connected to the chips. The package also includes a dielectric member having an electrical conductor thereon. The electrical conductor are electrically connected to the plurality of electrical contacts of the plurality of chips to electrically interconnect such plurality of chips with portions of the electrical conductor spanning the regions in the fractional portion of the wafer. A connector is provided for electrically connecting the electrical conductor of the package to the electrical interconnect of the printed circuit board.

    摘要翻译: 半导体封装装置或模块包括其上具有电互连的印刷电路板和安装到印刷电路板的半导体封装。 半导体封装包括其上具有多个集成电路芯片的半导体晶片的分数部分,这些芯片由晶片的分数部分中的区域分隔开。 晶片的分数部分具有电连接到芯片的多个电触点。 封装还包括其上具有电导体的电介质构件。 电导体电连接到多个芯片的多个电触头,以将这些多个芯片与跨越晶片的分数部分中的区域的电导体的部分电互连。 提供一种用于将封装的电导体电连接到印刷电路板的电互连的连接器。