摘要:
A substrate (102) having a surface (103) with a plurality of electrical traces (106) disposed thereon is provided. A photonic device (111) is operably mounted on the electrical traces (106) of the substrate (102). An optical portion (121) having a reflective surface (118) that is embedded in the optical portion (121) for directing light to and from the working portion of the photonic device (111) is disposed on the surface (103) of the substrate (102), thereby encapsulating the photonic device (111) in the optical portion (121).
摘要:
An optical/electrical connector including a molded base having a well and a plurality of grooves extending from the well to a first outer edge of the base and alignment guides associated with the grooves at the first outer edge. The base further having external electrical connections with first ends exposed and positioned in the well and second ends extending outwardly beyond a second outer edge of the base. An array of photonic components is positioned in the well and each aligned with a separate groove. The array is electrically coupled to the exposed first ends of the external electrical connections of the base. The grooves are filled with a plastic material to form optical waveguides from the optical ports to the first outer edge.
摘要:
An article and a method for making contact areas (221, 222, 230) on an optical waveguide (100, 200) are provided. A waveguide (100, 200) having a first surface (112) and a second surface (113) with a first indent (101) located on the first surface (112) and a second indent (102) located on the second surface (113) and a groove (104) is made interconnecting the first and second indents (101, 102). A low temperature melting member (111) is placed in the first indent (101) on the first surface (112) and is melted, thereby flowing the low temperature melting member into the groove (104) and into the second indent (102) located on the second surface (113).
摘要:
An electronic component includes a substrate (210, 1510), a device (221, 222) supported by the substrate and including a first bond pad (223, 224, 225, 226), and a cap (231, 232, 631, 731, 732, 1531, 1532) overlying the substrate. The cap includes a second bond pad (241, 242, 243, 244) at an outside surface of the cap, a third bond pad (245, 246, 247, 248) at an inside surface of the cap and electrically coupled to the first bond pad, and an electrically conductive via (251, 252, 254, 751, 752, 753, 754) extending through the cap and electrically coupling together the second and third bond pads.
摘要:
A credit card pager having a casing surrounding a substrate and electronic circuitry mounted on the substrate. An information connection including at least one molded waveguide having a core with a photonic device mounted at one end and a second end of the core being positioned on the substrate to be accessible exterior of the casing so as to communicate optical information signals therethrough.
摘要:
A micro-electro-mechanical device (10) including a shorting bar (40) having a first portion (42) electrically coupled to a first input/output signal line (34) and a second portion (43) electrically uncoupled to a second input/output signal line (36). Shorting bar (40) is coupled to a moveable end (49) of a cantilever structure (44). Thus, preferably only the second portion (43) of shorting bar (40) needs to be actuated to be electrically coupled to the second input/output signal line (36).
摘要:
A method for measuring die bond material (27) used to bond a semiconductor die (26) to a lead frame (28). The semiconductor die (26) height is measured on the lead frame (28). Die bond material (27) is placed onto the lead frame (28) and the semiconductor die (26) is pressed into the die bond material (27). The height of the semiconductor die (26) on the die bond material (27) is measured again. Thickness of the die bond material (27) is obtained by subtraction of the two heights.
摘要:
A method of determining the intrinsic electrical characteristics of a device under test (DUT) includes determining a set of test measurements for a test structure including the device and determining test measurements for a number of de-embedding test structures. Based on the test measurements, DUT measurements are determined using both open-short and three-step de-embedding processes. The DUT measurements are combined to determine an imperfection error, which is used to adjust the calculations of a four-port de-embedding method. The adjusted calculations provide for a more accurate measurement of the parasitic elements in the test structure, thereby improving the determination of the intrinsic electrical characteristics of the device.
摘要:
A method of determining the intrinsic electrical characteristics of a device under test (DUT) includes determining a set of test measurements for a test structure including the device and determining test measurements for a number of de-embedding test structures. Based on the test measurements, DUT measurements are determined using both open-short and three-step de-embedding processes. The DUT measurements are combined to determine an imperfection error, which is used to adjust the calculations of a four-port de-embedding method. The adjusted calculations provide for a more accurate measurement of the parasitic elements in the test structure, thereby improving the determination of the intrinsic electrical characteristics of the device.
摘要:
An assembly and method for connecting two substrates utilizes a nonconductive laminant that is compatible when wet with a conductive paste when wet. Thus, the curing of the nonconductive laminant and the conductive paste may be performed together. The nonconductive laminant also cures in a shorter time than those previously available, thus the stress on the semiconductor device created by exposure to the cure temperature is additionally reduced.