Method and apparatus for testing RFID devices
    28.
    发明授权
    Method and apparatus for testing RFID devices 有权
    RFID设备测试方法和设备

    公开(公告)号:US07659822B2

    公开(公告)日:2010-02-09

    申请号:US12022933

    申请日:2008-01-30

    IPC分类号: G08B13/14 G06K7/00

    摘要: A method and apparatus for testing RFID straps. Arrays of RFID straps in a roll-to-roll process are coupled to an array of test elements. RF programming and interrogation signals are frequency and time multiplexed to the RFID array. Return signals are detected to determine sensitivity and programmability parameters of the RFID straps.

    摘要翻译: 一种用于测试RFID绑带的方法和装置。 卷对卷过程中的RFID带的阵列耦合到测试元件的阵列。 RF编程和询问信号被频率和时间复用到RFID阵列。 检测返回信号以确定RFID带的灵敏度和可编程性参数。