SURFACE-EMITTING LASER DEVICE
    22.
    发明公开

    公开(公告)号:US20240195150A1

    公开(公告)日:2024-06-13

    申请号:US18286149

    申请日:2022-03-02

    Abstract: A surface-emitting laser device includes a first electrode, a lower cladding layer, an active layer, an upper cladding layer, a relaxation layer, a contacting layer having a bandgap different from that of the upper cladding layer, a second electrode, and a photonic crystal layer provided between the lower cladding layer and the active layer or between the active layer and the upper cladding layer, including a basic region and a plurality of different refractive index regions that differ in refractive index from the basic region and are distributed two-dimensionally in a plane perpendicular to a thickness direction to form a resonance mode of light in the plane. The relaxation layer has a bandgap that is between a bandgap of the upper cladding layer and a bandgap of the contacting layer.

    SEMICONDUCTOR LASER ELEMENT
    23.
    发明公开

    公开(公告)号:US20230369825A1

    公开(公告)日:2023-11-16

    申请号:US18029141

    申请日:2021-09-28

    CPC classification number: H01S5/18305 H01S5/18302 H01S5/11

    Abstract: A semiconductor laser element of the present disclosure reducing one-dimensional local oscillation includes a substrate, an active layer, and a phase modulation layer. The phase modulation layer includes a base layer and modified refractive index regions two-dimensionally placed on a reference surface. In a virtual square lattice on the reference surface, the gravity center of each modified refractive index region is placed away from the corresponding lattice point, and an angle of a vector connecting the corresponding lattice point to the gravity center is set individually. A lattice spacing and a light emission wavelength of the active layer satisfy a Γ-point oscillation condition. The gravity center of each modified refractive index region is placed such that the absolute value of the Fourier coefficient of an annular or a circular shape obtained by rotating each modified refractive index region with the corresponding lattice point is 0.01 or less.

    THREE-DIMENSIONAL MEASUREMENT DEVICE, LIGHT SOURCE DEVICE, AND LIGHT RECEIVING AND EMITTING MODULE

    公开(公告)号:US20230273015A1

    公开(公告)日:2023-08-31

    申请号:US18195508

    申请日:2023-05-10

    CPC classification number: G01B11/2513

    Abstract: A three-dimensional measurement device includes a plurality of light source units configured to irradiate the object to be measured with measurement light having predetermined patterns, an image capture unit configured to capture an image of the object to be measured which is irradiated with the measurement light, and a measurement unit configured to measure a three-dimensional shape of the object to be measured based on results of image capture performed by the image capture unit. The predetermined patterns of the measurement light include stripe patterns, respectively. The stripe patterns radiated from the plurality of light source units have respective patterns different from each other. The plurality of light source units are arrayed in a direction parallel to stripes in the stripe patterns. The measurement unit measures the three-dimensional shape of the object to be measured based on a three-dimensional shape measurement method using the stripe pattern.

    LIGHT-EMITTING DEVICE
    25.
    发明申请

    公开(公告)号:US20200209653A1

    公开(公告)日:2020-07-02

    申请号:US16622497

    申请日:2018-06-13

    Abstract: The present embodiment relates to a light-emitting device that enables reduction in attenuation or diffraction effect caused by a semiconductor light-emitting device with respect to modulated light outputted from a spatial light modulator, and the light-emitting device includes the semiconductor light-emitting device that outputs light from a light output surface and the reflection type spatial light modulator that modulates the light. The spatial light modulator includes a light input/output surface having the area larger than the area of a light input surface of the semiconductor light-emitting device, modulates light taken through a region facing the light output surface of the semiconductor light-emitting device in the light input/output surface, and outputs the modulated light from another region of the light input/output surface to a space other than the light input surface of the semiconductor light-emitting device.

    LIGHT-EMITTING DEVICE
    26.
    发明申请

    公开(公告)号:US20190181613A1

    公开(公告)日:2019-06-13

    申请号:US16323625

    申请日:2017-08-10

    Abstract: The present embodiment relates to a light emitting device having a structure capable of removing zero order light from output light of an S-iPM laser. The light emitting device includes a semiconductor light emitting element and a light shielding member. The semiconductor light emitting element includes an active layer, a pair of cladding layers, and a phase modulation layer. The phase modulation layer has a basic layer and a plurality of modified refractive index regions, each of which is individually disposed at a specific position. The light shielding member has a function of passing through a specific optical image output along an inclined direction and shielding zero order light output along a normal direction of a light emitting surface.

    SEMICONDUCTOR LASER MODULE
    27.
    发明申请
    SEMICONDUCTOR LASER MODULE 有权
    半导体激光模块

    公开(公告)号:US20170012407A1

    公开(公告)日:2017-01-12

    申请号:US15115713

    申请日:2014-11-10

    CPC classification number: H01S5/0683 H01S5/022 H01S5/105 H01S5/18 H01S5/187

    Abstract: A surface emitting laser element capable of emitting a main beam and a sub-beam, and a monitoring light detection element capable of detecting a light intensity of the sub-beam are included, the surface emitting laser element is a PCSEL, the main beam and the sub-beam are emitted in an upward direction of the surface emitting laser element and are inclined to each other at a predetermined angle, and respective changes in a peak light intensity of the main beam and a peak light intensity of the sub-beam with respect to a value of a driving current of the surface emitting laser element are correlated with each other. Therefore, if an output of the monitoring light detection element indicating the peak light intensity of the sub-beam is used, the peak light intensity of the main beam can be estimated.

    Abstract translation: 包括能够发射主光束和子光束的表面发射激光器元件和能够检测子光束的光强度的监视光检测元件,表面发射激光器元件是PCSEL,主光束和 子光束在表面发射激光器元件的向上方向上发射,并且以预定角度彼此倾斜,并且主光束的峰值光强度和子光束的峰值光强度各自变化, 相对于表面发射激光元件的驱动电流的值彼此相关。 因此,如果使用表示子光束的峰值光强度的监视光检测元件的输出,则可以估计主光束的峰值光强度。

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