摘要:
A lateral JFET has a basic structure including an n-type semiconductor layer (3) formed of an n-type impurity region and a p-type semiconductor layer formed of a p-type impurity region on the n-type semiconductor layer (3). Moreover, in the p-type semiconductor layer, there are provided a p+-type gate region layer (7) extending into the n-type semiconductor layer (3) and containing p-type impurities of an impurity concentration higher than that of the n-type semiconductor layer (3) and an n+-type drain region layer (9) spaced from the p+-type gate region layer (7) by a predetermined distance and containing n-type impurities of an impurity concentration higher than that of the n-type semiconductor layer (3). With this structure, the lateral JFET can be provided that has an ON resistance further decreased while maintaining a high breakdown voltage performance.
摘要:
A charge pump circuit is disclosed in which a spike-shaped noise (glitch) generated in an output is reduced. The charge pump circuit comprises: a first transistor, one of the terminals of which is connected to a high electric potential power source, turned on and off according to a charge-up signal; a second transistor, one of the terminals of which is connected to a low electric potential power source, turned on and off according to a charge-down signal; a first current restricting element connected between the other terminal of the first transistor and the output of a charge pump; and a second current restricting element connected between the other terminal of the second transistor and the output of the charge pump.
摘要:
To present a clock generator capable of spreading the spectrum of oscillation frequency by simple control in a small additional circuit, and its control method. A phase locked loop circuit is provided from a frequency phase comparator 11, an output clock signal PO is outputted from a voltage control oscillator (VCO) 14 by way of a charge pump circuit (CP) 12 and a loop filter (LF) 13, and is returned to the frequency phase comparator 11 by way of a frequency divider (DIV) 15. Detecting the phase difference of reference clock signal R and divided clock signal D, and locking the oscillation frequency of the output clock signal PO to specified frequency, a modulation signal M is outputted from a modulation pulse generator 1 regardless of phase locked control of phase locked loop circuit, and is superposed on phase comparison signal P, and thereby the oscillation frequency of output clock signal PO is modulated. An output clock signal PO having a predetermined spectrum spread characteristic can be obtained.
摘要:
A SiC wafer comprises a 4H polytype SiC substrate 2 in which the crystal plane orientation is substantially {03-38}, and a buffer layer 4 composed of SiC formed over this SiC substrate 2. The {03-38} plane forms an angle of approximately 35° with respect to the axial direction in which micropipes and so forth extend, so micropipes and so forth are eliminated at the crystal sides, and do not go through to an active layer 6 on the buffer layer 4. Lattice mismatching between the SiC substrate 2 and the active layer 6 is suppressed by the buffer layer 4. Furthermore, anisotropy in the electron mobility is low because a 4H polytype is used. Therefore, it is possible to obtain a SiC wafer and a SiC semiconductor device with which there is little anisotropy in the electron mobility, and strain caused by lattice mismatching can be lessened, as well as a method for manufacturing these.
摘要:
A reference voltage circuit includes a first amplifier, a first load device and a first PN junction device, second and third load devices and a second PN junction device, an offset voltage reduction circuit, a coupling node potential takeout circuit, and an area adjustment circuit. The offset voltage reduction circuit is configured to reduce an offset voltage between the first and second input terminals at the first amplifier, and the coupling node potential takeout circuit is configured to take out potentials of the first and second coupling nodes. The area adjustment circuit is configured to adjust an area of the second PN junction device in accordance with the potentials of the first and second coupling nodes which are taken out by the coupling node potential takeout circuit.
摘要:
A silicon carbide (SiC) substrate is provided with an off-oriented {0001} surface whose off-axis direction is . A trench is formed on the SiC to have a stripe structure extending toward a direction. An SiC epitaxial layer is formed on an inside surface of the trench.
摘要:
A variable delay circuit comprising a first delay element configured to delay an input signal, a second delay element coupled to the first delay element in parallel and also configured to delay the input signal, a control current supply section configured to supply control currents for adjusting a delay amount of the first delay element and a delay amount of the second delay element, and an output signal selecting section configured to select any one of an output signal from the first delay element and an output signal from the second delay element according to a selecting signal for selecting delay time of the input signal.
摘要:
A lateral junction field effect transistor includes a first gate electrode layer arranged in a third semiconductor layer between source/drain region layers, having a lower surface extending on the second semiconductor layer, and doped with p-type impurities more heavily than the second semiconductor layer, and a second gate electrode layer arranged in a fifth semiconductor layer between the source/drain region layers, having a lower surface extending on a fourth semiconductor layer, having substantially the same concentration of p-type impurities as the first gate electrode layer, and having the same potential as the first gate electrode layer. Thereby, the lateral junction field effect transistor has a structure, which can reduce an on-resistance while maintaining good breakdown voltage properties.
摘要:
A lateral junction field effect transistor includes a first gate electrode layer arranged in a third semiconductor layer between source/drain region layers, having a lower surface extending on the second semiconductor layer, and doped with p-type impurities more heavily than the second semiconductor layer, and a second gate electrode layer arranged in a fifth semiconductor layer between the source/drain region layers, having a lower surface extending on a fourth semiconductor layer, having substantially the same concentration of p-type impurities as the first gate electrode layer, and having the same potential as the first gate electrode layer. Thereby, the lateral junction field effect transistor has a structure, which can reduce an on-resistance while maintaining good breakdown voltage properties.
摘要:
An object of this invention is to provide a band distribution inspecting device and band distribution inspecting method capable of carrying out inspection on whether or not a scattered oscillation signal oscillated containing a frequency variation from the fundamental frequency with the fundamental frequency as a reference point has a band distribution rapidly, with a simple way and at a cheap price. A scattered oscillation signal SSS inputted to a band distribution detecting section 22 is outputted as a predetermined band pass signal SBP through a band pass filter 17 having a predetermined pass band of a predetermined narrow-band width Δf within a band distribution. This signal is converted to a root-mean-square value by a smoother 19, smoothed by a capacitor C1 and transferred to a general purpose inspecting device 21 as a DC signal SAV. The DC signal SAV is compared with a predetermined voltage value VX by a comparator 25 and its comparison result is judged by a judging section 25 and then, an inspection result is outputted as a judging signal J. As a result, an edge frequency in the band distribution of the scattered oscillation signal SSS and disturbance of frequency variation within/out of the band and dullness in waveform and the like can be inspected for.