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公开(公告)号：US10275297B2
公开(公告)日：2019-04-30
申请号：US14531817
申请日：2014-11-03
Applicant: SK hynix memory solutions inc.
Inventor： Frederick K. H. Lee , Jason Bellorado , Marcus Marrow
Abstract: A plurality of bins and a plurality of soft read values are stored in a lookup table where those bins that are either a leftmost bin or a rightmost bin correspond to soft read values having a maximum magnitude. Bin identification information is received for a cell in solid state storage. A soft read value is generated for the cell in solid state storage, including by: accessing the lookup table, mapping the received bin identification information to one of the plurality of bins in the lookup table, and selecting the soft read value in the lookup table that corresponds to the bin which is mapped to.
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公开(公告)号：US09734066B1
公开(公告)日：2017-08-15
申请号：US14632725
申请日：2015-02-26
Applicant: SK hynix memory solutions inc.
Inventor： Suneel Kumar Indupuru , Zheng Wu , Arunkumar Subramanian , Jason Bellorado
IPC: G06F12/10 , G06F12/0831 , G06F12/128
CPC classification number: G06F12/0833 , G06F12/0246 , G06F12/0868 , G06F12/123 , G06F12/128 , G06F2212/1021 , G06F2212/466 , G06F2212/502 , G06F2212/62 , G06F2212/7201
Abstract: A workload level associated with an expandable data buffer is determined, where the expandable data buffer and an expandable mapping table cache are stored in internal memory and the expandable mapping table cache is used to store a portion of a mapping table that is stored on external storage. An amount of internal memory allocated to the expandable data buffer and an amount of internal memory allocated to the expandable mapping table cache are adjusted based at least in part on the workload level.
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23.发明授权公开(公告)号：US09336885B1
公开(公告)日：2016-05-10
申请号：US13900861
申请日：2013-05-23
Applicant: SK hynix memory solutions inc.
Inventor： Arunkumar Subramanian , Frederick K. H. Lee , Xiangyu Tang , Lingqi Zeng , Jason Bellorado
CPC classification number: G06F11/1068 , G11C16/0483 , G11C16/10 , G11C16/26 , G11C29/02 , G11C29/52 , G11C2029/0411
Abstract: A charge constrained bit sequence is processed to obtain a lower bound on a number of bit errors associated with the charge constrained bit sequence. The lower bound is compared against an error correction capability threshold associated with an error correction decoder. In the event the lower bound is greater than or equal to the error correction decoder threshold, an error correction decoding failure is predicted.
Abstract translation: 处理电荷约束位序列以获得与电荷约束位序列相关联的多个位错误的下限。 将下限与与纠错解码器相关联的纠错能力阈值进行比较。 在下限大于或等于纠错解码器阈值的情况下，预测出纠错解码失败。
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24.发明授权公开(公告)号：US09231623B1
公开(公告)日：2016-01-05
申请号：US14226369
申请日：2014-03-26
Applicant: SK hynix memory solutions inc.
Inventor： Naveen Kumar , Zheng Wu , Jason Bellorado
CPC classification number: H03M13/2963 , H03M13/453
Abstract: A set of error intersections is determined using at least a first set of error-containing codewords and a second set of error-containing codewords. A first set of bit locations is selected from the set of error intersections using soft information associated with the first set of error-containing codewords. Chase decoding is performed on the first set of error-containing codewords. The set of error intersections is updated, based at least in part on the Chase decoding, to obtain an updated set of error intersections. From the updated set of error intersections, a second set of bit locations is selected using soft information associated with the second set of error-containing codewords. Chase decoding is performed on the second set of error-containing codewords.
Abstract translation: 使用至少第一组含错误的码字和第二组含错误码字来确定一组错误交叉点。 使用与第一组含错误码字相关联的软信息，从该组错误交集中选择第一组位位置。 在第一组含错误码字上执行追踪解码。 至少部分地基于追逐解码来更新错误交集的集合，以获得更新的错误交集集合。 从更新的错误交集集合中，使用与第二组含错误码字相关联的软信息来选择第二组位位置。 对第二组含错误码字执行追踪解码。
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公开(公告)号：US20150332788A1
公开(公告)日：2015-11-19
申请号：US14602151
申请日：2015-01-21
Applicant: SK hynix memory solutions inc.
Inventor： Jason Bellorado , Zheng Wu , Lingqi Zeng
CPC classification number: G11C29/42 , G11C11/5642 , G11C29/36 , G11C29/52
Abstract: It is determined that a read count has reached one of a set of read count thresholds. An initial test page which corresponds to the read count threshold that has been reached is selected from a set of initial test pages. There is at least one page that is not in the set of initial test pages and is victimized by an offending page that also victimizes a page in the set of initial test pages. A test read is performed on the selected test page and the results of the test read of the selected test page are evaluated for read disturb noise.
Abstract translation: 确定读取计数已经达到一组读取计数阈值中的一个。 从一组初始测试页中选择对应于已经达到的读取计数阈值的初始测试页面。 至少有一个页面不在初始测试页面集合中，并且受到一个违规页面的伤害，该页面也会影响初始测试页面集中的页面。 对选定的测试页进行测试读取，并对所选测试页的测试结果进行读取干扰噪声。
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Patent Agency Ranking
公开(公告)号：US09142309B2
公开(公告)日：2015-09-22
申请号：US14071383
申请日：2013-11-04
Applicant: SK hynix memory solutions inc.
Inventor： Jason Bellorado , Arunkumar Subramanian , Marcus Marrow , Zheng Wu , Lingqi Zeng
CPC classification number: G11C16/26 , G11C16/3418
Abstract: A victim group of one or more cells is read using a first read threshold to obtain a first raw read which includes one or more values. The victim group of cells is read using a second read threshold to obtain a second raw read which includes one or more values. A neighboring read, corresponding to a neighboring group of one or more cells associated with the victim group of cells, is obtained. A composite read is generated, including by selecting from at least the first raw read and the second raw read based at least in part on the neighboring read.
Abstract translation: 使用第一读取阈值读取一个或多个单元的受害者组，以获得包括一个或多个值的第一原始读取。 使用第二读取阈值读取小区的受害者组，以获得包括一个或多个值的第二原始读取。 获得对应于与受害者小组组相关联的一个或多个单元的相邻组的相邻读取。 生成复合读取，包括至少部分地基于相邻读取从至少从第一原始读取和第二原始读取中进行选择。
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公开(公告)号：US09105304B2
公开(公告)日：2015-08-11
申请号：US14266664
申请日：2014-04-30
Applicant: SK hynix memory solutions inc.
Inventor： Marcus Marrow , Jason Bellorado , Yu Kou
CPC classification number: G11B20/1833 , G11B20/1816 , G11B20/1879 , G11B2020/185 , H03M13/1111 , H03M13/612 , H03M13/6337
Abstract: Determining a parameter associated with whether a portion of a storage device is defective is disclosed. Determining comprises: obtaining known data associated with the portion; reading back from the portion to produce a read-back waveform; decoding the read-back waveform, including producing statistical information; and determining a parameter associated with whether the portion is defective based at least in part on the statistical information.
Abstract translation: 公开了确定存储设备的一部分是否有缺陷的参数。 确定包括：获得与该部分相关联的已知数据; 从该部分读回以产生回读波形; 解码回读波形，包括产生统计信息; 以及至少部分地基于所述统计信息来确定与所述部分是否有缺陷相关联的参数。
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28.发明授权Storage of read thresholds for NAND flash storage using linear approximation 有权使用线性近似来存储NAND闪存的读取阈值公开(公告)号：US09064595B2
公开(公告)日：2015-06-23
申请号：US14553745
申请日：2014-11-25
Applicant: SK hynix memory solutions inc.
Inventor： Arunkumar Subramanian , Xiangyu Tang , Jason Bellorado , Lingqi Zeng , Frederick K. H. Lee
CPC classification number: G11C16/26 , G11C11/5642 , G11C16/3404 , G11C16/349
Abstract: A first read threshold associated with a first page in a block and a second read threshold associated with a second page in the block are received, where the first page has a first page number and the second page has a second page number. A slope and a y intercept are determined based at least in part on the first read threshold, the second read threshold, the first page number, and the second page number. The slope and the y intercept are stored with a block identifier associated with the block.
Abstract translation: 接收与块中的第一页相关联的第一读取阈值和与块中的第二页相关联的第二读取阈值，其中第一页面具有第一页面编号，并且第二页面具有第二页面编号。 至少部分地基于第一读取阈值，第二读取阈值，第一页面编号和第二页面数量来确定斜率和y截距。 斜率和y截距用与块相关联的块标识符存储。
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公开(公告)号：US20140327981A1
公开(公告)日：2014-11-06
申请号：US14266664
申请日：2014-04-30
Applicant: SK hynix memory solutions inc.
Inventor： Marcus Marrow , Jason Bellorado , Yu Kou
IPC: G11B20/18
CPC classification number: G11B20/1833 , G11B20/1816 , G11B20/1879 , G11B2020/185 , H03M13/1111 , H03M13/612 , H03M13/6337
Abstract: Determining a parameter associated with whether a portion of a storage device is defective is disclosed. Determining comprises: obtaining known data associated with the portion; reading back from the portion to produce a read-back waveform; decoding the read-back waveform, including producing statistical information; and determining a parameter associated with whether the portion is defective based at least in part on the statistical information.
Abstract translation: 公开了确定存储设备的一部分是否有缺陷的参数。 确定包括：获得与该部分相关联的已知数据; 从该部分读回以产生回读波形; 解码回读波形，包括产生统计信息; 以及至少部分地基于所述统计信息来确定与所述部分是否有缺陷相关联的参数。
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公开(公告)号：US20140304480A1
公开(公告)日：2014-10-09
申请号：US14169877
申请日：2014-01-31
Applicant: SK hynix memory solutions inc.
Inventor： Xiangyu Tang , Frederick K.H. Lee , Jason Bellorado , Lingqi Zeng , Zheng Wu
CPC classification number: G06F11/00 , G06F3/0616 , G06F3/064 , G06F3/0679 , G06F11/3409 , G06F11/3471 , G06F12/121
Abstract: An address is received. One or more neighbors associated with the received address is/are determined. One or more neighboring hot metrics is/are determined for the one or more neighbors associated with the received address. A hot metric for the received address is determined based at least in part on the neighboring hot metrics.
Abstract translation: 收到一个地址。 确定与接收到的地址相关联的一个或多个邻居。 确定与接收到的地址相关联的一个或多个邻居的一个或多个相邻热度量。 至少部分地基于相邻的热指标来确定接收地址的热度量。
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