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    Semiconductor device and method of fabricating the same
    22.
    发明授权
    Semiconductor device and method of fabricating the same 有权

    公开(公告)号：US11728342B2

    公开(公告)日：2023-08-15

    申请号：US17659069

    申请日：2022-04-13

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Jae Hyun Park ,  Heonjong Shin

    IPC: H01L27/088 ,  H01L29/78 ,  H01L21/8234 ,  H01L29/66 ,  H01L21/768

    CPC classification number: H01L27/0886 ,  H01L21/823431 ,  H01L21/823437 ,  H01L29/66795 ,  H01L29/7851 ,  H01L21/76802

    Abstract: Disclosed are a semiconductor device and a method of fabricating the same. The semiconductor device includes first and second gate patterns that are spaced apart from each other in a first direction on a substrate and extend in the first direction, a separation pattern that is disposed between and being in direct contact with the first and second gate patterns and extends in a second direction intersecting the first direction, a third gate pattern that is spaced apart in the second direction from the first gate pattern and extends in the first direction, and an interlayer dielectric layer disposed between the first gate pattern and the third gate pattern. The separation pattern includes a material different from a material of the interlayer dielectric layer. A bottom surface of the separation pattern has an uneven structure.

    Apparatus related to metric-learning-based data classification and method thereof
    23.
    发明授权
    Apparatus related to metric-learning-based data classification and method thereof 有权

    公开(公告)号：US11568245B2

    公开(公告)日：2023-01-31

    申请号：US16760181

    申请日：2017-12-15

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Tae Kwon Chang ,  In Kwon Choi ,  Jae Hyun Park

    IPC: G10L15/00 ,  G06N3/08 ,  G06F40/30 ,  G06N3/04

    Abstract: The present invention provides artificial intelligence technology which has machine-learning-based information understanding capability, including metric learning providing improved classification performance, classification of an object considering a semantic relationship, understanding of the meaning of a scene based on the metric learning and the classification, and the like. An electronic device according to one embodiment of the present invention comprises a memory in which at least one instruction is stored, and a processor for executing the stored instruction. Here, the processor extracts feature data from training data of a first class, obtains a feature point by mapping the extracted feature data to an embedding space, and makes an artificial neural network learn in a direction for reducing a distance between the obtained feature point and an anchor point.

    Integrated circuits for controlling slew rates of signals
    26.
    发明授权
    Integrated circuits for controlling slew rates of signals 有权

    公开(公告)号：US10128822B2

    公开(公告)日：2018-11-13

    申请号：US15405893

    申请日：2017-01-13

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Jun Han Bae ,  Jae Hyun Park ,  Jong Shin Shin ,  Jin Ho Han

    IPC: H03B1/00 ,  H03K3/00 ,  H03K5/04

    Abstract: An integrated circuit includes a differential signal driver that receives a first signal from a first input terminal, receives a second signal, which is a differential signal of the first signal, from a second input terminal, outputs a first output signal corresponding to the first signal to a first output terminal, and outputs a second output signal corresponding to the second signal to a second output terminal. The integrated circuit further includes a first capacitor unit connected to the first output terminal and controlling a slew rate of the first output signal based on a first capacitance, a second capacitor unit connected to the second output terminal and controlling a slew rate of the second output signal based on a second capacitance, and a phase selection unit that receives the first signal and provides the first signal to the second capacitor unit, and that receives the second signal and provides the second signal to the first capacitor unit, so as to control the slew rates of the first and second output signals.

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