公开(公告)号：US20170299631A1

公开(公告)日：2017-10-19

申请号：US15511733

申请日：2015-09-18

Applicant: NHK Spring Co., Ltd.

Inventor： Yoshio Yamada ,  Kohei Hironaka

IPC: G01R1/073 ,  G01R1/067

CPC classification number: G01R1/07357 ,  G01N2201/00 ,  G01R1/06722 ,  G01R1/07378 ,  H01L21/00 ,  H01L2221/00 ,  H01R13/2421 ,  H01R2201/20

Abstract: A probe unit according to the present invention is suitable for allowing a large current to flow. In the probe unit that accommodates a plurality of contact probes for electrically connecting an inspection target object and a signal processing device used to output an inspection signal, both ends of a large current probe (3) are electrically connected to electrodes of a contact target object, and a large current is made to flow via a metal block (50) that comes into contact with both end portions of the large current probe (3).

公开(公告)号：US20160282403A1

公开(公告)日：2016-09-29

申请号：US15055325

申请日：2016-02-26

Applicant: HITACHI METALS, LTD.

Inventor： Hidehito HANAWA

IPC: G01R31/14

CPC classification number: G01R31/14 ,  G01N1/00 ,  G01N2201/00 ,  G01R1/00 ,  G01R31/022 ,  G01R31/1272

Abstract: A partial discharge measurement method includes: a moving step of moving an insulated wire including an insulating layer on a surface of the insulated wire; a voltage applying step of bringing an electrode which is connected to a power supply into contact with the insulating layer of the insulated wire which is moving, and applying a predetermined test voltage to the insulating layer while moving the insulated wire; a detection step of detecting, as a partial discharge signal, a signal which is more than or equal to a threshold value among signals involved in partial discharge events occurring from the insulating layer due to application of the predetermined test voltage; and a determination step of determining, based on a result in the detection step, frequency of occurrence of partial discharge events at the predetermined test voltage.

Abstract translation: 局部放电测量方法包括：移动步骤，在绝缘电线的表面上移动包括绝缘层的绝缘线; 电压施加步骤，使与电源连接的电极与正在移动的绝缘线的绝缘层接触，并且在移动绝缘线的同时向绝缘层施加预定的测试电压; 检测步骤，由于施加了预定的测试电压，检测出从绝缘层发生的局部放电事件所涉及到的信号之中大于或等于阈值的信号作为局部放电信号; 以及确定步骤，基于检测步骤的结果，确定在预定测试电压下的局部放电事件的发生频率。

公开(公告)号：US20150102823A1

公开(公告)日：2015-04-16

申请号：US14576642

申请日：2014-12-19

Applicant: Sunbeam Products, Inc.

Inventor： Gabriel Kohn ,  Leonard Horey ,  William G. McCoy ,  Lei Feng ,  Xiao Bao Yang ,  Fei Ma

IPC: G01R31/28 ,  H05B1/02 ,  G01K13/00 ,  H05B3/34

CPC classification number: G01R31/026 ,  G01K7/16 ,  G01K13/00 ,  G01K15/007 ,  G01N1/00 ,  G01N2201/00 ,  G01R31/021 ,  G01R31/2829 ,  H01L2221/00 ,  H05B1/0272 ,  H05B3/342 ,  H05B2203/019 ,  H05B2203/02

Abstract: A circuit integrity detection system for use in detecting the integrity of a sensing wire in a heating pad wherein the integrity of the sensing wire is checking the inputs from a first and second A/D converter connected to opposite ends of the sensing wire.

Abstract translation: 一种电路完整性检测系统，用于检测加热垫中的感测线的完整性，其中感测线的完整性检查来自连接到感测线的相对端的第一和第二A / D转换器的输入。

公开(公告)号：US20130207673A1

公开(公告)日：2013-08-15

申请号：US13851795

申请日：2013-03-27

Applicant: ALPS ELECTRIC CO., LTD.

Inventor： Atsushi TONDOKORO ,  Satoshi WAGA ,  Takashi SATO ,  Shinya YOKOYAMA ,  Sumihito MORITA

IPC: G01N27/22

CPC classification number: G01N27/223 ,  G01N1/00 ,  G01N2201/00 ,  H01L21/00 ,  Y10T29/49

Abstract: A humidity detection sensor includes a lower electrode provided on a board, an upper electrode provided so as to face the lower electrode, a humidity sensing film which is formed at least between the lower electrode and the upper electrode and whose dielectric constant changes in response to humidity, and a protective film provided so as to cover the upper electrode. Each of the upper electrode and the protective film has an opening through which the humidity sensing film is partially exposed to the outside. In the opening, the humidity sensing film is provided so as to reach at least a position higher than the position of the lower surface of the protective film.

Abstract translation: 湿度检测传感器包括设置在板上的下电极，设置成面向下电极的上电极，至少形成在下电极和上电极之间并且其介电常数响应于 湿度和设置成覆盖上电极的保护膜。 上部电极和保护膜中的每一个具有开口，湿度感测膜通过该开口部分地暴露于外部。 在开口中，湿度感测膜被设置成至少达到比保护膜的下表面的位置更高的位置。

公开(公告)号：US20130057294A1

公开(公告)日：2013-03-07

申请号：US13602604

申请日：2012-09-04

Applicant: Hayato MIZOGUCHI ,  Yasuhiro Kamiya ,  Takumi Shimizu

Inventor： Hayato MIZOGUCHI ,  Yasuhiro Kamiya ,  Takumi Shimizu

IPC: G01R31/36

CPC classification number: G01R31/362 ,  B60L1/00 ,  B60L3/0046 ,  B60L11/1855 ,  B60L2200/00 ,  B60L2210/00 ,  B60L2240/547 ,  G01N1/00 ,  G01N2201/00 ,  G01N2203/00 ,  G01R1/00 ,  G01R31/026 ,  G01R31/3658 ,  H02J1/00 ,  Y02T10/7005

Abstract: A voltage monitoring device monitors voltage of each of battery cells connected in series to one another to configure an assembled battery. The device includes a capacitor circuit, a filter circuit, an input side connection switching unit, a potential difference detection unit, and an output side connection switching unit. The capacitor circuit includes a plurality of capacitors connected in series to one another. The filter circuit includes a plurality of resistors connected to an electrode terminal of each of the battery cells. The plurality of resistors are divided into a first resistor group and a second resistor group. The first resistor group is connected to a connection end between adjacent capacitors of the plurality of capacitors. The second resistor group is connected to an independent end of the plurality of capacitors. A resistance value of the first resistor group is smaller than a resistance value of the second resistor group.

Abstract translation: 电压监视装置监视彼此串联连接的每个电池的电压以配置组装的电池。 该装置包括电容器电路，滤波电路，输入侧连接切换单元，电位差检测单元和输出侧连接切换单元。 电容器电路包括彼此串联连接的多个电容器。 滤波电路包括连接到每个电池单元的电极端子的多个电阻器。 多个电阻器被分成第一电阻器组和第二电阻器组。 第一电阻器组连接到多个电容器的相邻电容器之间的连接端。 第二电阻器组连接到多个电容器的独立端。 第一电阻器组的电阻值小于第二电阻器组的电阻值。

公开(公告)号：US20100141285A1

公开(公告)日：2010-06-10

申请号：US12448355

申请日：2007-11-30

Applicant: Armin Wernet ,  Roland Dieterle

Inventor： Armin Wernet ,  Roland Dieterle

IPC: G01R31/02

CPC classification number: G01F23/24 ,  C12Q1/00 ,  C12Q2304/00 ,  G01F23/26 ,  G01N2201/00

Abstract: The invention relates to an apparatus for determining and/or monitoring at least one process variable of a medium (1). The apparatus includes at least one probe unit (3) and at least one electronics unit (4), which supplies the probe unit (3) with an electrical, exciter signal and which receives from the probe unit an electrical, measurement signal. The invention includes, that the probe unit (3) has at least one inner electrode (5) and at least one outer electrode (6) surrounding the inner electrode.

Abstract translation: 本发明涉及一种用于确定和/或监视介质（1）的至少一个过程变量的装置。 所述装置包括至少一个探针单元（3）和至少一个电子单元（4），所述至少一个电子单元（4）向所述探测单元（3）提供电激励器信号，并从所述探测单元接收电测量信号。 本发明包括探针单元（3）具有至少一个内部电极（5）和围绕内部电极的至少一个外部电极（6）。

公开(公告)号：US09995783B2

公开(公告)日：2018-06-12

申请号：US15195131

申请日：2016-06-28

Applicant: METRYX LIMITED

Inventor： Adrian Kiermasz

IPC: G01R31/00 ,  G01R31/26 ,  G01N5/02 ,  G01N15/08 ,  H01L21/66 ,  G01N5/00 ,  C30B7/00 ,  G01N1/00 ,  C30B1/00 ,  C30B23/00 ,  H01J49/26

CPC classification number: G01R31/2601 ,  C30B1/00 ,  C30B7/00 ,  C30B23/00 ,  G01N1/00 ,  G01N5/00 ,  G01N5/02 ,  G01N15/0893 ,  G01N2201/00 ,  G01N2203/00 ,  H01J49/26 ,  H01L22/12

Abstract: A method and apparatus for extracting the contents of voids and/or pores present in a semiconductor device to obtain information indicative of the nature of the voids and/or pores, e.g. to assist with metrology measurements. The method includes heating the semiconductor wafer to expel the contents of the voids and/or pores, collecting the expelled material in a collector, and measuring a consequential change in mass of the semiconductor wafer and/or the collector, to extract information indicative of the nature of the voids. This information may include information relating to the distribution of the voids and/or pores, and/or the sizes of the voids and/or pores, and/or the chemical contents of the voids and/or pores. The collector may include a condenser having a temperature-controlled surface (e.g. in thermal communication with a refrigeration unit) for condensing the expelled material.

公开(公告)号：US09989666B2

公开(公告)日：2018-06-05

申请号：US14901614

申请日：2014-04-02

Applicant: BAKER HUGHES INCORPORATED

Inventor： Sergey A. Terentev ,  Yuliy Dashevsky

IPC: G01V3/00 ,  G01V3/30 ,  E21B49/00 ,  E21B49/08 ,  H01L21/00

CPC classification number: G01V3/30 ,  E21B49/00 ,  E21B49/08 ,  G01N2201/00 ,  H01L21/00 ,  H01L2221/00

Abstract: A method for determining at least one electrical property of an earth formation includes emitting an electromagnetic signal into the earth formation from an antenna and measuring an electromagnetic signal from the earth formation. The antenna is a broadband log antenna mounted on a substrate having at least a high dielectric permittivity, defined as a dielectric permittivity of about ∈=100 to ∈=1000 or a gigantic dielectric permittivity, defined as a dielectric permittivity of about ∈=1000 or greater. The antenna has a radius between about 2.5 millimeters (mm) and 10 centimeters (cm). The method further includes determining at least one electrical property of one or more of a borehole, a borehole fluid, and the earth formation based on measuring the electromagnetic signal.

公开(公告)号：US09891263B2

公开(公告)日：2018-02-13

申请号：US15055325

申请日：2016-02-26

Applicant: HITACHI METALS, LTD.

Inventor： Hidehito Hanawa

IPC: H01H31/12 ,  G01R31/14 ,  G01R1/00 ,  G01N1/00

CPC classification number: G01R31/14 ,  G01N1/00 ,  G01N2201/00 ,  G01R1/00 ,  G01R31/022 ,  G01R31/1272

Abstract: A partial discharge measurement method includes: a moving step of moving an insulated wire including an insulating layer on a surface of the insulated wire; a voltage applying step of bringing an electrode which is connected to a power supply into contact with the insulating layer of the insulated wire which is moving, and applying a predetermined test voltage to the insulating layer while moving the insulated wire; a detection step of detecting, as a partial discharge signal, a signal which is more than or equal to a threshold value among signals involved in partial discharge events occurring from the insulating layer due to application of the predetermined test voltage; and a determination step of determining, based on a result in the detection step, frequency of occurrence of partial discharge events at the predetermined test voltage.

公开(公告)号：US20170278759A1

公开(公告)日：2017-09-28

申请号：US15461784

申请日：2017-03-17

Applicant: DISCO CORPORATION

Inventor： Naoya Sukegawa ,  Seiji Harada

IPC: H01L21/66 ,  G01N22/02 ,  H01L21/322

CPC classification number: H01L22/14 ,  G01N1/00 ,  G01N22/02 ,  G01N2201/00 ,  H01L21/3221 ,  H01L2221/00

Abstract: A workpiece evaluating method evaluates the gettering property of a device wafer having a plurality of devices formed on the front side of the wafer and having a gettering layer formed inside the wafer. The method includes the steps of applying excitation light for exciting a carrier to the wafer, applying microwaves to a light applied area where the excitation light is applied and also to an area other than the light applied area, measuring the intensity of the microwaves reflected from the light applied area and from the area other than the light applied area, subtracting the intensity of the microwaves reflected from the area other than the light applied area from the intensity of the microwaves reflected from the light applied area to thereby obtain a differential signal, and determining the gettering property of the gettering layer according to the intensity of the differential signal obtained above.