Abstract:
The invention provides an interpolation apparatus for improving the resolution of an optical encoder. The optical encoder outputs an encoding signal, and the encoding signal corresponds to a first resolution. The interpolation apparatus comprises a comparing circuit and a lookup table circuit. The comparator receives the encoding signal and produces a plurality of comparison signals. The lookup table circuit receives a plurality of comparison signals and produces an outputted signal, wherein the outputted signal corresponds to second resolution. The second resolution is greater than the first resolution.
Abstract:
An analog-to-digital conversion apparatus which has a variable resolution and allows a reduction in power consumption. This apparatus comprises an analog-to-digital converter (ADC) of parallel type, a controller, and an interpolation circuit. The analog-to-digital converter has a plurality of comparators connected in parallel, each for comparing potentials of an analog input signal and a reference signal. The controller generates a control signal for controlling the resolution of the analog-to-digital converter. Specifically, the controller controls the number of comparators (CMP) to operate by means of the control signal, thereby determining the resolution. The interpolation circuit interpolates the output data of the comparators that are disabled depending on the resolution. The controller avoids simultaneous operation of two adjoining comparators when the analog-to-digital converter is operated at a resolution lower than its maximum resolution.
Abstract:
An apparatus and method for increasing the resolution of analog-to-digital conversion devices and systems is described. The described apparatus and method operate without significantly increasing the complexity or conversion time of conventional analog-to-digital conversion architectures. The improved resolution is accomplished by detecting the time-dependent response characteristics of comparators used within an analog-to-digital converter. The detected response characteristics, such as the response pattern or the response time, are used to estimate the overdrive voltage on the comparator of interest and to thereby provide additional bits to the analog-to-digital conversion process. In those applications where the response characteristics affect the settling characteristics of the converter output bits, additional resolution may be attained by detecting the settling characteristics, such as the settling pattern or settling time, of the converter output bits, particularly the least significant bit.
Abstract:
An analog voltage averaging circuit using active devices increases speed and resolution in analog to digital converters. The analog to digital converters combine the concepts of residue amplification and averaging to simplify the circuit implementation of high order, high speed analog to digital converters.
Abstract:
Employed is a thermometer-code-to-one-of-n converter having a number of similar portions each of which includes gates each configured to detect a zero-zero-one pattern and to develop a one-of-n signal, gates each configured to detect a one-zero-zero pattern (an invalid pattern) and to develop an error signal, gates configured to combine the error signals, and gates configured to gate the error signals with the one-of-n pattern signals to block (inhibit) one-of-n signals.
Abstract:
A SAR ADC and an electronic device are disclosed. The SAR ADC includes a read clock generation circuit, configured to connect to a first output terminal and a second output terminal of a dynamic comparator, and generate a read clock signal for reading a first or a second comparison result based on the first and the second comparison result received from the dynamic comparator. The invention reads the comparison result using the read clock signal generated by grabbing the output of the comparator, and can improve the overall analog-to-digital conversion speed of the SAR ADC. Further, the present invention can detect the occurrence of metastable state of the comparator by judging that the output of the comparator has no pulse, and read the comparison result based on the backup clock generated by the operating clock of the comparator.
Abstract:
A comparison circuit is provided and includes first and second comparators and a first time-to-digital comparator. The first comparator with a first offset voltage receives an input signal and generates a first comparison signal and a first inverse comparison signal. The second comparator receives the input signal and generates a second comparison signal and a second inverse comparison signal. The first offset voltage is larger than the second offset voltage. The first time-to-digital comparator receives the first comparison signal and the second inverse comparison signal and generates first and second determination signals according to the first comparison signal and the second inverse comparison signal. The first and second determination signals indicate whether a voltage of the input signal is larger than a first middle voltage. The first middle voltage is equal to a half of the sum of the first offset voltage and the second offset voltage.
Abstract:
Disclosed are various embodiments of front-end analog circuitry for use in conjunction with optical encoders. Highly accurate analog output signals are provided by front-end analog circuitry in incremental or absolute motion encoders to interpolation circuitry, which is capable of providing high interpolation factor output signals having high timing accuracy. The disclosed interpolation circuits may be implemented using CMOS or BiCMOS processes without undue effort.
Abstract:
The conventional A/D converter has a drawback that the conversion precision is degraded when the operation periods of the constituents of the A/D converter are shortened due to the duty ratio of an external input clock because the operation periods of the constituents of the A/D converter depend on the pulse width of the external input clock. However, a highly-precise A/D conversion operation independent of the duty ratio of the external input clock can be realized by providing a circuit for detecting the operation periods of the constituents of the A/D converter, and adjusting the duty ratio of the operation clock according to the detected operation periods of the constituents of the A/D converter.
Abstract:
The digitization apparatus includes, as a main scale, a pulse delay circuit constituted by a plurality of delay units connected in series or in ring form, a latch/encoder, a circulation number counter, and a latch circuit, and includes, as a vernier, a reverse timing extraction circuit detecting a reverse timing at which any one of the delay units has reversed, and an interpolation circuit. The main scale digitizes a time interval between two successive measurement signals in a resolution equal to a delay time per one delay unit. The vernier digitizes a time difference between a measurement timing indicated by the measurement signal and the reverse timing in a resolution equal to 1/M (M being an integer not smaller than 2). The interpolation circuit includes two delay lines each constituted by a plurality of delay units connected in series or in ring form.