Abstract:
A comparator used in a parallel-type A/D converter, wherein a comparator 100 includes reset transistors mra and mrb. When the comparator 100 is in the Reset state, the inverted signal /CLK of the clock signal is given to the PMOS reset transistors mra and mrb so as to forcibly reset both of the voltages at two internal nodes Va and Vb being a differential pair to a predetermined reset voltage by the reset transistors mra and mrb. The inverted signal /CLK of the clock signal is produced with a predetermined delay. Thus, when the comparator 100 is in the Reset state, the point in time at which to cancel the reset of the internal nodes Va and Vb is delayed from that at which the comparator performs a comparison operation. Therefore, even if the frequency of the clock signal and the frequency of the analog input signal are high, the voltages at the internal nodes forming a differential pair are well-balanced when the comparator is in the Reset state, thus improving the voltage comparison precision.
Abstract:
In a flash A/D converter including a plurality of differential amplifier circuits and a plurality of voltage comparator circuits, a regulator circuit is provided. The regulator circuit automatically regulates a bias voltage of each of the plurality of differential amplifier circuits in a differential amplifier circuit array to make an output dynamic range for the differential amplifier circuits match an input dynamic range for the plurality of voltage comparator circuits. Therefore, even if the input dynamic range for the voltage comparator circuits is narrowed with reduction in a power supply voltage, the output dynamic range for the differential amplifier circuits and the input dynamic range for the voltage comparator circuits match, thus resulting in a high A/D conversion accuracy.
Abstract:
The conventional A/D converter has a drawback that the conversion precision is degraded when the operation periods of the constituents of the A/D converter are shortened due to the duty ratio of an external input clock because the operation periods of the constituents of the A/D converter depend on the pulse width of the external input clock. However, a highly-precise A/D conversion operation independent of the duty ratio of the external input clock can be realized by providing a circuit for detecting the operation periods of the constituents of the A/D converter, and adjusting the duty ratio of the operation clock according to the detected operation periods of the constituents of the A/D converter.
Abstract:
A telescopic differential operational amplifier circuit for use in a pipelined A/D converter is provided with two auxiliary differential amplifiers connected to two cascode circuits, each including cascode-connected first to fourth transistors. During the sampling phase, first and second switches are turned on to apply a predetermined bias voltage to the gates of first and fourth transistors, and the input terminal of the differential operational amplifier circuit is set to a common mode voltage. During the hold phase, the first and second switches are turned off so that a voltage of each of the gates of the first and fourth transistors change to follow an input signal inputted via the input terminal with coupling capacitors operating as a level shifter of the input signal. Then the differential operational amplifier circuit performs push-pull operation operative only in a transconductance drive region, and is prevented from operating in a slewing region.
Abstract:
In a write driver circuit for switching the direction of a write current passing through a magnetic head or the like having an inductance component, an H-shaped bridge circuit is formed by using four NPN transistors in order to switch the write current at a high speed. Four switching means for controlling the base potentials of the four NPN transistors are provided and two switching means for rapidly decreasing the base potential of one of the two NPN transistors on the power source side, which is turned off when the write current passing through the magnetic head is switched are provided, thereby widening a voltage difference occurring between both terminals of the magnetic head.
Abstract:
An amplifier circuit for amplifying a change in a resistance value of a magnetic resistance element is formed by connecting a first and a second current mirror circuits having the same structure in cascode, so that a voltage change is amplified without using a capacitive coupling. Hence, a high-pass filter is not created as a parasitic circuit, whereby a gain is maintained high in the low frequency region and a low frequency characteristic is excellent. Further, since control electrodes of transistors which form each current mirror circuit are grounded through the capacitance, a noise is reduced without using a conventional feedback circuit. This eliminates an influence of the feedback circuit over a high frequency characteristic, and therefore, a high frequency characteristic becomes excellent.
Abstract:
A sample hold circuit is provided for use in a time-interleaved A/D converter apparatus including a plurality of low-speed pipeline A/D converters which are parallelized. The sample hold circuit includes a sampling capacitor and a sample hold amplifier, and operates to sample and hold an input signal by using a switched capacitor. An adder circuit of the sample hold circuit adds a ramp calibration signal to the input signal, by inputting the ramp calibration signal generated to have a frequency identical to that of a sampling clock signal and a predetermined slope based on the sampling clock signal, into a sample hold amplifier via a calibration capacitor having a capacitance smaller than that of the sampling capacitor.
Abstract:
A telescopic differential operational amplifier circuit for use in a pipelined A/D converter is provided with two auxiliary differential amplifiers connected to two cascode circuits, each including cascode-connected first to fourth transistors. During the sampling phase, first and second switches are turned on to apply a predetermined bias voltage to the gates of first and fourth transistors, and the input terminal of the differential operational amplifier circuit is set to a common mode voltage. During the hold phase, the first and second switches are turned off so that a voltage of each of the gates of the first and fourth transistors change to follow an input signal inputted via the input terminal with coupling capacitors operating as a level shifter of the input signal. Then the differential operational amplifier circuit performs push-pull operation operative only in a transconductance drive region, and is prevented from operating in a slewing region.
Abstract:
The conventional A/D converter has a drawback that the conversion precision is degraded when the operation periods of the constituents of the A/D converter are shortened due to the duty ratio of an external input clock because the operation periods of the constituents of the A/D converter depend on the pulse width of the external input clock. However, a highly-precise A/D conversion operation independent of the duty ratio of the external input clock can be realized by providing a circuit for detecting the operation periods of the constituents of the A/D converter, and adjusting the duty ratio of the operation clock according to the detected operation periods of the constituents of the A/D converter.
Abstract:
A sample hold circuit is provided for use in a time-interleaved A/D converter apparatus including a plurality of low-speed pipeline A/D converters which are parallelized. The sample hold circuit includes a sampling capacitor and a sample hold amplifier, and operates to sample and hold an input signal by using a switched capacitor. An adder circuit of the sample hold circuit adds a ramp calibration signal to the input signal, by inputting the ramp calibration signal generated to have a frequency identical to that of a sampling clock signal and a predetermined slope based on the sampling clock signal, into a sample hold amplifier via a calibration capacitor having a capacitance smaller than that of the sampling capacitor.