Abstract:
A method and apparatus for adjusting the coating diameter and/or thickness during production of an elongated member being coated. In the preferred embodiment, the elongated member is an optical fiber. The apparatus includes a coating unit having a sizing die with an orifice through which the elongated member is conveyed, the diameter the orifice being adjustable. This is achieved by providing a helical spring in the sizing die with the inside of the spring defining the orifice. A tensioning mechanism adjusts the tension of the spring by causing relative rotation between opposite ends of the spring to change the diameter of the orifice. The apparatus further includes a measuring device, disposed downstream of the coating unit, for measuring the diameter of the coating; and a controller for adjusting the diameter of the orifice in response to the measured diameter of the coating.
Abstract:
A stabilized window structure includes a window frame, a shattered window pane disposed in the window frame, and a layer of unifying material bonded to the window pane to form a cohesive mass removable from the frame as one or more integral and unitary pieces. A method of stabilizing and removing a shattered window pane from a window frame includes the steps of applying a layer of unifying material to an exterior surface and/or an interior surface of the shattered window pane, bonding the layer of unifying material to the window pane to form a cohesive mass therewith, and removing the cohesive mass from the window frame as one or more integral and unitary pieces.
Abstract:
A plasma processing apparatus includes a plurality of plasma processing units. Each of the plasma processing units has a plasma excitation electrode, a radiofrequency generator connected to the plasma excitation electrode, and a matching circuit which matches the impedance between the radiofrequency generator and the plasma processing unit. The absolute value nullnullRAnull of the difference nullRA between the AC resistance RA0 at a time t0 and the AC resistance RA1 at a later time t1 and the absolute value nullnullRBnull of the difference nullRB between the AC resistance RB0 at the time t0 and the AC resistance RB1 at the later time t1 are maintained at a value less than an upper limit. Based on these values, whether or not the plasma processing apparatus which is reassembled or used at a user site maintains a required level of performance is evaluated.
Abstract:
A processing system for processing a substrate with a plasma comprises a processing chamber configured for containing a plasma and a substrate support. Electrodes are coupled to the substrate support and an RF power source is coupled to each of the electrodes for biasing the electrodes to create a DC bias on a substrate positioned on the supporting surface. A first comparator having first and second inputs is electrically coupled to one of the electrodes with an isolating device being coupled between the first and second inputs to isolate the first input from the bias on the one electrode. The comparator has an output reflective of a voltage difference between the first and second inputs. A second comparator has a first input coupled to the first electrode and a second input coupled to the second electrode, and has an output reflective of a voltage difference between the first and second inputs resulting from the bias difference between the first and second electrodes.
Abstract:
The invention is a tunable light source. Techniques for multiplexing various wavelengths into one fiber are provided. A thin film deposition optical monitoring system is provided that utilizes a multiplexer according to the present invention. Light from a multiplexed light source is passed through a fiber optic and emerges from the fiber tip. The light beam is collimated and passes through the substrate where a lens then focuses the transmitted light into a photo-detector. After signal processing, information is sent to the deposition flux source controller to control the deposition rate, coating material and whether deposition should be terminated. An advantage of the present invention over tunable lasers is realized in the low cost of the present invention.
Abstract:
A system for applying a fluid coating onto a substrate includes forming a fluid wetting line by introducing a stream of fluid onto a first side of the substrate along a laterally disposed fluid-substrate contact area. An electrical force is created on the fluid from an electrical field (originating from electrical charges which are on the second side of the substrate) that is substantially at and downstream of the fluid wetting line. The electrical field can be generated by charges that have been transferred to the second side of the substrate from a remote charge generator.
Abstract:
A treatment solution supply apparatus according to the present invention is a treatment solution supply apparatus for supplying a treatment solution onto a substrate which is disposed in a predetermined processing position on a mounting portion, comprising a treatment solution supply nozzle for supplying the treatment solution onto the substrate and a nozzle holder for releasably holding the treatment solution supply nozzle. The treatment solution supply nozzle is disposed in a predetermined stand-by position and the nozzle holder is movable in three dimensions. The movability of the nozzle holder in three dimensions makes it possible to finely adjust the position of the treatment solution supply nozzle and thereby, supply the treatment solution accurately to an appropriate position on the substrate.
Abstract:
A method for controlling uniformity of applied film thickness of clear protective coatings by means of a color-dissipatable dye additive which dissipates within a reasonable timeframe, generally from hours to a few days, leaving the applied film with no evidence of its use during the application phase. The color additives temporarily impart color to an otherwise clear coating, and subsequently dissipate over a short period of time. An embodiment of this technology includes the addition of a compatibilizer carrier solution to increase the ease of measuring the dye for addition to the clear coating.
Abstract:
Since a widely applicable high quality plasma display equipped with a phosphor layer suitable as a highly precise plasma display can be produced continuously at a high productivity level, an industrially advantageous method and apparatus for producing a plasma display can be provided. The highly precise plasma display obtained in the present invention can be widely used in the display field, for example, for wall mounted television sets, information displays, etc. The method for producing a plasma display of the present invention comprises the step of continuously applying a phosphor paste containing a phosphor powder and an organic compound onto a substrate with a plurality of barrier ribs from a paste applicator with a plurality of outlet holes. Furthermore, the present invention comprises the steps of coating a substrate with a plurality of barrier ribs, with three phosphor pastes respectively containing a phosphor powder emitting light of red, green or blue, as stripes in the spaces between the respectively adjacent barrier ribs on the substrate, from a paste applicator with outlet holes, and heating to form a phosphor layer. Moreover, the apparatus for producing a plasma display of the present invention comprises a table for fixing a substrate with a plurality of barrier ribs, a paste applicator with a plurality of outlet holes to face the barrier ribs of the substrate, a supply means for supplying a phosphor paste to the paste applicator, and a moving means for three-dimensionally moving the table and the paste applicator relatively each other.
Abstract:
Planarizing High Temperature Superconductor (HTS) surfaces, especially HTS thin film surfaces is crucial for HTS thin film device processing. Disclosed is a method of surface planarization for HTS film. The method includes first smoothing the HTS surface by Gas Cluster Ion Beam bombardment, followed by annealing in partial pressure of oxygen to regrow the damaged surface layer. A rough HTS surface can be planarized down to a smoothness with a standard deviation of one nanometer or better.