APPARATUS AND METHOD FOR TREATING A SUBSTRATE
    323.
    发明申请

    公开(公告)号:US20170114456A1

    公开(公告)日:2017-04-27

    申请号:US15296474

    申请日:2016-10-18

    CPC classification number: C23C16/4412 C23C16/455 H01L21/0274 H01L21/67017

    Abstract: An apparatus and a method for treating a substrate are disclosed. The apparatus may include a process chamber including an upper chamber and a lower chamber that are coupled to each other to define a treatment space, a supporting unit provided within the treatment space to support a substrate, and an exhausting element configured to exhaust an air from the treatment space or a neighboring region of the treatment space. The exhausting element may include an outer exhausting line connected to an outer exhausting hole, and the outer exhausting hole may be formed in or through the upper or lower chamber and may be connected to a contact surface, at which the upper and lower chambers are in contact with each other.

    Substrate treating apparatus
    324.
    发明授权

    公开(公告)号:US09627236B2

    公开(公告)日:2017-04-18

    申请号:US14681506

    申请日:2015-04-08

    CPC classification number: H01L21/6719 H01L21/67051 H01L21/67126

    Abstract: A substrate treating apparatus is provided which includes housing and a door assembly. The housing provides a process space for treating a substrate therein and has an opening formed at a sidewall thereof. The door assembly opens and closes the opening. The door assembly includes a shutter, a driving member, and a gap maintaining unit. The driving member transfers the shutter to an open position where the shutter faces to the opening and to a blocking position where the shutter gets out of the open position. The gap maintaining unit maintains a constant gap between the shutter and the sidewall.

    METHOD AND APPARATUS FOR TREATING SUBSTRATE
    327.
    发明申请
    METHOD AND APPARATUS FOR TREATING SUBSTRATE 审中-公开
    用于处理基板的方法和装置

    公开(公告)号:US20170001221A1

    公开(公告)日:2017-01-05

    申请号:US15195262

    申请日:2016-06-28

    Inventor: Taekyoub Lee

    Abstract: A method for treating a substrate with a treatment liquid is disclosed, wherein the substrate is treated while a location at which the treatment liquid is supplied onto the substrate that is rotated is moved in an outward direction from a central area of the substrate towards a peripheral area of the substrate and in an inward direction from a peripheral area of the substrate towards a central area of the substrate a plurality of times, and wherein the movement distances of some of the plurality of movements are different from each other.

    Abstract translation: 公开了一种用处理液处理基板的方法,其中处理液体的处理液体被供给到旋转的基板上的位置从基板的中心区域向外侧向周向移动 并且从衬底的周边区域到衬底的中心区域的向内方向多次,并且其中多个运动中的一些运动的移动距离彼此不同。

    METHOD AND APPARATUS FOR DRYING SUBSTRATE
    328.
    发明申请
    METHOD AND APPARATUS FOR DRYING SUBSTRATE 审中-公开
    干燥基材的方法和装置

    公开(公告)号:US20160334162A1

    公开(公告)日:2016-11-17

    申请号:US15152979

    申请日:2016-05-12

    Abstract: Disclosed is a substrate drying apparatus of substrate processing apparatus including a chamber that provides a space for processing a substrate, and a fluid supply unit that supplies a process fluid to the chamber, wherein the liquid supply unit includes a supply tank in which the fluid is stored, a supply line that connects the supply tank and the chamber, a branch line branched from a first point of the supply line and connected to a second point of the supply line, and a temperature control unit that adjusts the temperature of the fluid such that the temperatures of the fluids flowing through the supply line and the branch line between the first point and the second point are different.

    Abstract translation: 本发明公开了一种基板处理装置的基板干燥装置,其包括:提供用于处理基板的空间的室;以及向该室供给处理流体的流体供给单元,其中,所述液体供给单元包括: 存储有连接供应罐和室的供应管线,从供应管线的第一点分支并连接到供应管线的第二点的分支管线以及调节流体温度的温度控制单元 流经供应管线的流体和第一点与第二点之间的分支管线的温度不同。

    Apparatus and method for cleaning substrate
    329.
    发明授权
    Apparatus and method for cleaning substrate 有权
    清洗基板的装置及方法

    公开(公告)号:US09406501B2

    公开(公告)日:2016-08-02

    申请号:US13905634

    申请日:2013-05-30

    CPC classification number: H01L21/02041 H01L21/02052 H01L21/67051

    Abstract: Provided are an apparatus and a method of cleaning a substrate. The apparatus includes a substrate supporting unit supporting a substrate, a container surrounding the substrate supporting unit and collecting an organic solvent scattered from the substrate, and a fluid supplying unit provided on one side of the container and spraying a liquid organic solvent with bubbles to the substrate. The fluid supplying unit includes a nozzle head ejecting the organic solvent to the substrate, an organic solvent supplying line supplying the organic solvent from an organic solvent storage tank to the nozzle head, and a bubble providing element provided on the organic solvent supplying line and providing bubbles to the liquid organic solvent.

    Abstract translation: 提供一种清洗基板的装置和方法。 该装置包括支撑基板的基板支撑单元,围绕基板支撑单元并收集从基板散射的有机溶剂的容器以及设置在容器的一侧上的流体供给单元,并且向液体有机溶剂喷射气泡 基质。 流体供给单元包括将有机溶剂喷射到基板的喷嘴头,将有机溶剂从有机溶剂容器供给到喷嘴头的有机溶剂供给管线和设置在有机溶剂供给管线上的气泡供给元件, 气泡到液体有机溶剂。

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