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公开(公告)号:US20240378156A1
公开(公告)日:2024-11-14
申请号:US18779666
申请日:2024-07-22
Applicant: Micron Technology, Inc.
Inventor: Sushanth Bhushan , Dheeraj Srinivasan
IPC: G06F12/0891
Abstract: Control logic in a memory device executes a first programming operation to program the set of memory cells to a set of programming levels. A first cache ready signal is generated, the first cache ready signal indicating to a host system to send first data associated with a second programming operation to an input/output (I/O) data cache of the memory device. A second cache ready signal is generated, the second cache ready signal indicating to the host system to send second data associated with the next programming operation to the I/O data cache. The first data associated with the second programming operation is caused to be stored in a cache storage of the memory device.
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公开(公告)号:US12079134B2
公开(公告)日:2024-09-03
申请号:US18178105
申请日:2023-03-03
Applicant: Micron Technology, Inc.
Inventor: Sushanth Bhushan , Dheeraj Srinivasan
IPC: G06F12/08 , G06F12/0891
CPC classification number: G06F12/0891
Abstract: Control logic in a memory device executes a first programming operation to program the set of memory cells to a set of programming levels. A first cache ready signal is generated, the first cache ready signal indicating to a host system to send first data associated with a second programming operation to an input/output (I/O) data cache of the memory device. A first encoded data value and a second encoded data value associated with each memory cell of the set of memory cells are generated. A second cache ready signal is generated, the second cache ready signal indicating to the host system to send second data associated with the next programming operation to the I/O data cache. The first data associated with the second programming operation is caused to be stored in a third data cache of the cache storage. A third cache ready signal is generated, the third cache ready signal indicating to the host system to send third data associated with the second programming operation to the I/O data cache.
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公开(公告)号:US20240231675A1
公开(公告)日:2024-07-11
申请号:US18611094
申请日:2024-03-20
Applicant: Micron Technology, Inc.
Inventor: Eric N. Lee , Dheeraj Srinivasan
IPC: G06F3/06
CPC classification number: G06F3/0653 , G06F3/0604 , G06F3/0673
Abstract: A memory system includes a ready busy pin coupled with a plurality of dice and a processing device coupled with the ready busy pin. The processing device is to perform controller operations including waiting to perform any status checks until after assertion of a pulse on a status indicator signal received from the ready busy pin; detecting the pulse being asserted is an extended pulse comprising at least a partial overlap of a first pulse asserted by a first die and a second pulse asserted by a second die of the plurality of dice; initiating a polling delay period in response to detecting assertion of the extended pulse, wherein the polling delay period is greater than a pulse width of the first pulse; and initiating a first status check of dice operations being performed by the plurality of dice in response to detecting expiration of the polling delay period.
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公开(公告)号:US20230367680A1
公开(公告)日:2023-11-16
申请号:US18143937
申请日:2023-05-05
Applicant: Micron Technology, Inc.
Inventor: Lu Tong , Ashish Ghai , Chai Chuan Yao , Ekamdeep Singh , Lakshmi Kalpana Vakati , Sheng Huang Lee , Matthew Ivan Warren , Dheeraj Srinivasan , Jeffrey Ming-Hung Tsai
CPC classification number: G06F11/2023 , G06F3/0617 , G06F3/064 , G06F3/0673 , G06F2201/805
Abstract: Control logic in a memory device executes a programming operation to program the set of memory blocks of the set of memory planes to a set of a programming levels. In response to determining at least a portion of a first memory block passed a program verify operation associated with a last programming level of the set of programming levels, the control logic executes a first program sub-operation to terminate the programming operation with respect to a first subset of one or more memory planes of the set of memory planes that passed the program verify operation associated with the last programming level and identify a second subset of one or more memory planes that failed the program verify operation associated with the last programming level. The control logic executes a second program sub-operation to apply a trim set to the second subset of one or more memory planes that failed the program verify operation of the last programming level.
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公开(公告)号:US20230298680A1
公开(公告)日:2023-09-21
申请号:US18110489
申请日:2023-02-16
Applicant: MICRON TECHNOLOGY, INC.
Inventor: Umberto Siciliani , Violante Moschiano , Walter Di Francesco , Dheeraj Srinivasan
CPC classification number: G11C16/3459 , G11C16/102 , G11C16/20
Abstract: Memories might include a controller configured to cause the memory to prepare a first plurality of memory cells of a block of memory cells for programming from an initialization state of the block of memory cells, program the first data to the first plurality of memory cells, and, in response to receiving a write command associated with a second address corresponding to the block of memory cells and with second data before successfully verifying programming of the first data to the first plurality of memory cells, prepare a second plurality of memory cells of the block of memory cells corresponding to the second address for programming without returning the block of memory cells to the initialization state after programming the first data to the first plurality of memory cells.
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公开(公告)号:US11662939B2
公开(公告)日:2023-05-30
申请号:US16946869
申请日:2020-07-09
Applicant: Micron Technology, Inc.
Inventor: Dheeraj Srinivasan , Ali Mohammadzadeh
CPC classification number: G06F3/0653 , G06F3/0608 , G06F3/0659 , G06F3/0673 , G06F13/1668
Abstract: A processing device in a memory sub-system determines whether to check a status of one or more memory dies of the memory device and sends a multi-unit status command to the memory device, the multi-unit status command specifying a plurality of memory units associated with the one or more memory dies of the memory device. The processing device further receives a response to the multi-unit status command, the response comprising a multi-bit value comprising a plurality of bits, wherein each bit of the plurality of bits represents a status of one or more parameters of a plurality of parameters for a corresponding one of the plurality of memory units.
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公开(公告)号:US20230162793A1
公开(公告)日:2023-05-25
申请号:US18095049
申请日:2023-01-10
Applicant: MICRON TECHNOLOGY, INC.
Inventor: Hao T. Nguyen , Tomoko Ogura Iwasaki , Erwin E. Yu , Dheeraj Srinivasan , Sheyang Ning , Lawrence Celso Miranda , Aaron S. Yip , Yoshihiko Kamata
CPC classification number: G11C16/0483 , G11C16/10 , G11C16/3459 , G11C16/26 , G11C11/5671
Abstract: Memory devices might include a first storage element, a second storage element, a data line, and a controller. The first storage element is to store a first data bit. The second storage element is to store a second data bit. The data line is selectively connected to the first storage element, the second storage element, and a memory cell. The controller is configured to apply one of four voltage levels to the data line based on the first data bit and the second data bit.
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公开(公告)号:US20230039026A1
公开(公告)日:2023-02-09
申请号:US17396825
申请日:2021-08-09
Applicant: MICRON TECHNOLOGY, INC.
Inventor: Hao T. Nguyen , Tomoko Ogura Iwasaki , Erwin E. Yu , Dheeraj Srinivasan , Sheyang Ning , Lawrence Celso Miranda , Aaron S. Yip , Yoshihiko Kamata
Abstract: Memory devices might include a first latch to store a first data bit; a second latch to store a second data bit; a data line selectively connected to the first latch, the second latch, and a string of series-connected memory cells; and a controller configured to bias the data line during a programing operation of a selected memory cell. The controller may with the first data bit equal to 0 and the second data bit equal to 0, bias the data line to a first voltage level; with the first data bit equal to 1 and the second data bit equal to 0, bias the data line to a second voltage level; with the first data bit equal to 0 and the second data bit equal to 1, bias the data line to a third voltage level; and with the first data bit equal to 1 and the second data bit equal to 1, bias the data line to a fourth voltage level.
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公开(公告)号:US11556251B2
公开(公告)日:2023-01-17
申请号:US17187066
申请日:2021-02-26
Applicant: Micron Technology, Inc.
Inventor: Ali Mohammadzadeh , Jung Sheng Hoei , Dheeraj Srinivasan , Terry M. Grunzke
IPC: G06F3/06 , G06F12/0811
Abstract: The present disclosure relates to apparatuses and methods to control memory operations on buffers. An example apparatus includes a memory device and a host. The memory device includes a buffer and an array of memory cells, and the buffer includes a plurality of caches. The host includes a system controller, and the system controller is configured to control performance of a memory operation on data in the buffer. The memory operation is associated with data movement among the plurality of caches.
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公开(公告)号:US11334265B2
公开(公告)日:2022-05-17
申请号:US16914547
申请日:2020-06-29
Applicant: Micron Technology, Inc.
Inventor: Dheeraj Srinivasan , Ali Mohammadzadeh
IPC: G06F3/06 , G11C11/56 , G11C16/10 , G06F12/02 , G06F12/0868 , G06F12/0811
Abstract: Apparatuses and methods for performing buffer operations in memory are provided. An example apparatus can include an array of memory cells, a page buffer, and a controller. The page buffer can be configured to store a number of pages of data in respective caches of the page buffer. The controller can be configured to program the number of pages of data to a first group of cells in the array. The programming operation can include programming the first group of cells to target states encoded with respective data patterns. The programming operation can include incrementally releasing a first of the respective caches of the page buffer responsive to completing programming of cells programmed to a particular first one of the target states.
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