Abstract:
Provided is a novel semiconductor device, a semiconductor device with reduced area, or a versatile semiconductor device. The semiconductor device includes a pixel portion including a first pixel, a second pixel, a third pixel, and a fourth pixel; a first switch and a second switch located outside the first to fourth pixels; a first wiring located outside the first to fourth pixels; a second wiring electrically connected to the first and second pixels; and a third wiring electrically connected to the third and fourth pixels. A first terminal of the first switch is electrically connected to the first wiring. A second terminal of the first switch is electrically connected to the second wiring. A first terminal of the second switch is electrically connected to the first wiring. A second terminal of the second switch is electrically connected to the third wiring.
Abstract:
An imaging device with low power consumption is provided. The pixel of the imaging device includes first and second photoelectric conversion elements, and first to fifth transistors. A cathode of the first photoelectric conversion element is electrically connected to the first transistor. An anode of a second photoelectric conversion element is electrically connected to the second transistor. Imaging data of a reference frame is obtained using the first photoelectric conversion element, and then imaging data of a difference detection frame is obtained using the second photoelectric conversion element. After the imaging data of the difference detection frame is obtained, a first potential that is a potential of a signal output from the pixel and a second potential that is a reference potential are compared. Whether or not there is a difference between the imaging data of the reference frame and the imaging data of the difference detection frame is determined using the first potential and the second potential.
Abstract:
A power supply circuit includes: an analog/digital converter for converting an analog signal to a digital signal; a pulse width modulation signal control circuit for generating a setting control signal varying in accordance with the difference between a reference voltage and a feedback voltage and a control signal for controlling a pulse width modulation signal, which is based on the digital signal; and a pulse width modulation signal generation circuit for generating the pulse width modulation signal, to which the count signal and the control signal are input, in which the control signal controls the duty cycle of the pulse width modulation signal, and the setting control signal controls the cycle of updating the duty cycle of the pulse width modulation signal.
Abstract:
An imaging device whose dynamic range can be wide with a simple structure is provided. In a circuit configuration and an operation method of the imaging device, whether a charge detection portion provided in a pixel is saturated with electrons is determined and an operation mode is changed depending on the determination result. First imaging data is captured first, and is read out in the case where the charge detection portion is not saturated with electrons. In the case where the charge detection portion is saturated with electrons, the saturation of the charge detection portion is eliminated and second imaging data is captured and read out.
Abstract:
An imaging device that has a high degree of freedom for exposure time and is capable of taking an image with little distortion is provided. In an n-th frame period where n is a natural number of two or more, a potential of a first charge accumulation portion is reset; the first charge accumulation portion is charged with a potential in accordance with an output of a photoelectric conversion element and simultaneously, imaging data in the (n−1)-th frame that is output in accordance with a potential of a second charge accumulation portion is read; a potential of the second charge accumulation portion is reset; a potential of the first charge accumulation portion is transferred to the second charge accumulation portion, and a potential of the second charge accumulation portion is held. Through the steps, the degree of freedom for an exposure period is increased.
Abstract:
A memory device includes a first memory circuit including a silicon transistor, a selection circuit including a silicon transistor, and a second memory circuit including oxide semiconductor transistors and a storage capacitor, in which one terminal of the storage capacitor is connected to a portion where two oxide semiconductor transistors are connected in series, an output of the second memory circuit is connected to a second input terminal of the selection circuit, and an input of the second memory circuit is connected to a first input terminal of the selection circuit or an output terminal of the first memory circuit.
Abstract:
A novel semiconductor device and a driving method thereof are provided. In the semiconductor device, a (volatile) node which holds data that is rewritten by arithmetic processing as appropriate and a node in which the data is stored are electrically connected through a source and a drain of a transistor whose channel is formed in an oxide semiconductor layer. The off-state current value of the transistor is extremely low. Therefore, electric charge scarcely leaks through the transistor from the latter node, and thus data can be held in the latter node even in a period during which supply of power source voltage is stopped. In the semiconductor device, a means of setting the potential of the latter node to a predetermined potential is provided. Specifically, a means of supplying a potential corresponding to “1” or “0” that is data stored in the latter node from the former node is provided.
Abstract:
A holding circuit includes first to third input terminals, an output terminal, first to third switches, a capacitor, and a node. The first to third switches control conduction between the node and the first input terminal, conduction between the node and the output terminal, and conduction between the second input terminal and the output terminal, respectively. First and second terminals of the capacitor are electrically connected to the node and the third input terminal, respectively. The first to third switches are each a transistor comprising an oxide semiconductor layer comprising a semiconductor region. Owing to the structure, a potential change of the node in an electrically floating state can be suppressed; thus, the holding circuit can retain its state for a long time. The holding circuit can be used as a memory circuit for backup of a sequential circuit, for example.
Abstract:
To reduce power consumption, a memory circuit includes a latch unit in which first data and second data are rewritten and read in accordance with a control signal, a first switch unit that controls rewrite and read of the first data stored in the latch unit by being turned on or off in response to the control signal, and a second switch unit that controls rewrite and read of the second data stored in the latch unit by being turned on or off in response to the control signal. The latch unit includes a first inverter and a second inverter. At least one of the first inverter and the second inverter includes a first field-effect transistor, and a second field-effect transistor that has the same conductivity type as the first field-effect transistor and has a gate potential controlled in accordance with the control signal.
Abstract:
To supply a signal in which the occurrence of delays is prevented to a storage circuit. To provide a novel semiconductor device in which a load applied to a logic circuit is low. The following structure is completed: a storage circuit to which a plurality of data signals and a selection signal are supplied connects two combination circuits, and a storage circuit has a function of selecting one of a plurality of data signals in accordance with the selection signal. A selection circuit is not necessarily provided between the storage circuit and the combination circuit. As a result, the combination circuit can supply a signal in which the occurrence of delays is prevented to the storage circuit.