Abstract:
The contact opening through an insulating layer is formed having a straight sidewall portion and a bowl shaped sidewall portion. The bowl shaped sidewall portion is near the top of the insulation layer to provide an enlarged diameter of the contact opening at the top relative to the bottom. A conductive material is then formed in the contact opening in electrical contact with a lower conductive layer. The conductive material forms a plug having an enlarged head, such as a nail head or a flat heat screw shape. The enlarged head protects the silicon and a barrier layer, if present, within the contact from being etched by any subsequent anisotropic etches. Thus, when an electrical interconnection layer such as aluminum is formed overlying the contact plug, the plug acts as an etch stop to prevent etching of a barrier layer of the barrier layer within the contact opening.
Abstract:
A circuit and method are disclosed for a memory device, such as a phase change memory. Specifically, there is disclosed a memory having a plurality of columns of memory cells, with each column of memory cells being coupled to a bit or data line. Each memory cell includes a programmable resistive element coupled in series with a select transistor. Each bit line is coupled to a distinct reference cell and a distinct transistor. The transistor is coupled between the corresponding bit line and a reference voltage, such as ground. During a memory read operation, the transistor, reference cell and addressed memory cell form a differential amplifier circuit. The output of the differential amplifier circuit is coupled to the data output terminals of the phase change memory.
Abstract:
A voltage regulator having a plurality of current sources and adapted to make available current to a circuit, such as a memory device. One or more of the plurality of current sources is selectively enabled/disabled to provide either of two non-zero, distinct current levels to the circuit depending on a logic value of the chip enable signal. The chip enable signal is input to the circuit to enable/disable the circuit to perform various operations.
Abstract:
There is disclosed a data processor for stalling the instruction execution pipeline after a cache miss and re-loading the correct cache data into any bypass devices before restarting the pipeline. The data processor comprises: 1) an instruction execution pipeline comprising N processing stages, each of the N processing stages performing one of a plurality of execution steps associated with a pending instruction being executed by the instruction execution pipeline; 2) a data cache for storing data values used by the pending instruction; 3) a plurality of architectural registers for receiving the data values from the data cache; 4) bypass circuitry for transferring a first data value from the data cache directly to a functional unit in one of the N processing stages without first storing the first data value in a destination one of the plurality of architectural registers; and 5) a cache refill controller for detecting that a cache miss has occurred at a first address associated with the first data value, receiving a missed cache line from a main memory coupled to the data processor, and causing the first data value to be transferred from the missed cache line to the functional unit.
Abstract:
An integrated circuit burn-in test system includes an integrated circuit and a tester. The integrated circuit includes operating circuitry, a heater for heating the operating circuitry, and burn-in test circuitry for testing the operating circuitry while being heated. A package surrounds the operating circuitry, the heater and the burn-in test circuitry. The burn-in test circuitry causes the operating circuitry to operate and generate data related thereto. The tester receives data from the burn-in test circuitry. The heater may be configured within the package to heat at least one predetermined portion of the operating circuitry.
Abstract:
A programmable logic device (PLD) and method for fabricating the PLD are disclosed. The PLD includes an array of PLD cells. Each PLD cell may include a programmable transistor and a select transistor. The PLD array is divided into at least one first area and at least one second area adjacent the at least one first area. The at least one first area includes the programmable transistors and the at least one second area includes the select transistors.
Abstract:
A device and method that determine a freewheeling rotation of an electric motor. The method includes steps of measuring first and second signals from respective first and second windings of an unenergized motor, and determining from the first and second signals whether the unenergized motor is rotating. The method may also include determining from the first and second signals the direction of rotation if the unenergized motor is rotating. The method may further include measuring a third signal from a third winding of the unenergized motor, and determining whether the motor is rotating may include determining that the motor is not rotating if the first, second, and third signals are equal. The first and second signals may each comprise a respective back voltage.
Abstract:
A cell library for designing integrated domino circuits has a first library portion with a plurality of selectable logic circuits having different transistor sizes and/or logic functions for selection according to desired logic function and parametric characteristics. A second library portion includes a plurality of selectable prechargeable driver circuits. Each of the driver circuits is configured to be connectable to an output of a selected one of the logic circuits. The driver circuits also have at least different transistor sizes. Standard FET devices may be constructed to precharge the output node of the selected logic circuit in the design of a domino logic circuit.
Abstract:
An apparatus and method is provided that reduces the propagation delay in a conductor carrying an electrical signal from a first area of a circuit to a second area of the circuit. The conductor is fabricated to include a first conductor extending from the first area to the second area. The conductor also includes a second conductor extending substantially parallel and along the first conductor and electrically connected to the first conductor. A third and additional conductors may also be used which extend substantially parallel and along the first conductor and are electrically connected to the first conductor. The additional second conductor (and any additional conductors) reduces the capacitance of the conductor thereby reducing the propagation delay in the conductor (increasing the speed of the signal). The additional conductor(s) effectively “shield” the first conductor from some capacitance that the first conductor would normally “see” without the use of such additional conductors.
Abstract:
A driver circuit includes a CMOS stage and switch functionalities for performing certain tasks. One task is to selectively block exposure of the CMOS stage to reference voltage(s). Another task is to selectively protect the CMOS stage during transient operation. Yet another task is to block leakage current from flowing from the CMOS stage to ground.