Device for protection against the formation of parasitic transistors in
an integrated circuit for driving an inductive load
    481.
    发明授权
    Device for protection against the formation of parasitic transistors in an integrated circuit for driving an inductive load 失效
    用于在用于驱动感应负载的集成电路中形成PARASITIC TRANSISTORS的保护装置

    公开(公告)号:US5132866A

    公开(公告)日:1992-07-21

    申请号:US553455

    申请日:1990-07-17

    CPC classification number: H01L27/0248

    Abstract: A monolithic integrated circuit (M) includes a power device (Q3, Q4) for driving an inductive load (L) and a control device for the power device. The control device comprises a voltage limiting circuit which includes a first transistor (Q2) responsive to negative impulses of the supply voltage and a second transistor (Q5) which is controlled by the first transistor for controlling re-firing of the power device in case of a negative pulse of the power voltage during a quenching period of the power device. The monolithic integrated circuit includes a substrate (5) having a substrate surface forming a supply voltage terminal of the power device and having a substrate voltage. An annular pocket (40) is formed in the substrate to surround or at least partially contain at least the first transistor (Q2) of the voltage limiting circuit. According to differing modes of the invention, the annular pocket (40) is biased at a voltage depending on that of the supply voltage terminal of the power device; is left at a floating potential. In one embodiment a pocket (3) is surrounded by an area of a different conductivity type (70) which has a grounded contact distributed along an emerging portion thereof.

    Monolithic integrated structure for a two-stage driving system with
level translator circuit component of the driving signal for power
transistors
    485.
    发明授权
    Monolithic integrated structure for a two-stage driving system with level translator circuit component of the driving signal for power transistors 失效
    用于功率晶体管驱动信号的电平转换器电路的两级驱动系统的单片集成结构

    公开(公告)号:US5072278A

    公开(公告)日:1991-12-10

    申请号:US480162

    申请日:1990-02-14

    CPC classification number: H01L27/0623

    Abstract: The monolithic integrated structure comprises a semiconductor substrate, a superimposed first epitaxial stratum having characteristics such as to withstand a high supply voltage applied to the driving system and a first and a second isolation pocket which may be connected to a high voltage and to ground, respectively, and diffused in said first epitaxial stratum at a distance such as to define an interposed area of said first stratum capable of isolating said isolating pockets from one another. Within the latter pockets, there are provided respective embedded strata and superimposed regions of a second epitaxial stratum having characteristics such as to withstand the low voltage applied across the two driving stages. A further region of said second epitaxial stratum is superimposed over said area of said first epitaxial stratum. The above regions of isolation pockets are designed for the formation of two high and low voltage driving stages, while the above further region of the second epitaxial stratum may be used for the formation of a level translator circuit component. Means are provided for the protection of said circuit component against high supply voltages.

    Process for excavating trenches with a rounded bottom in a silicon
substrate for making trench isolation structures
    486.
    发明授权
    Process for excavating trenches with a rounded bottom in a silicon substrate for making trench isolation structures 失效
    用于制造耐热隔离结构的硅基底中的圆形底部的冲击过程

    公开(公告)号:US5068202A

    公开(公告)日:1991-11-26

    申请号:US448883

    申请日:1989-12-12

    Abstract: Encased (BOX) trench insolation structures in a silicon substrate are formed by firstly RIE etching an ONO multilayer (Oxide-Nitrite-Oxide) formed on the surface of a monocrystalline silicon substrate through a mask defining the active areas until exposing the silicon. A successive deposition of a conformable TEOS oxide layer followed by a "blanket" RIE etching, leave tapered "spacers" on the vertical etched flanks of the ONO multilayer. Through such a self-aligned "aperture" an isotropic plasma etching (round-etch) of the silicon is performed until the lateral, under-cut, etch front below the oxide spacers reaches the bottom layer of the isolation area defining etching previously conducted through the ONO multilayer. The peculiarities of the round-etch profile are thus fully exploited for more easily implanting the walls and bottom of the trench and avoiding the presence of electric field affecting sharp corners. The process maintains a precise lateral dimensional control and does not require special high resolution apparatuses.

    Hollow plastic package for semiconductor devices
    490.
    发明授权
    Hollow plastic package for semiconductor devices 失效
    用于半导体器件的空心塑料封装

    公开(公告)号:US5034800A

    公开(公告)日:1991-07-23

    申请号:US366840

    申请日:1989-06-15

    Abstract: A hollow-type package of optically and non-optically active semiconductor devices is entirely made of moldable plastic material by utilizing a preformed box-like shell of a rigid plastic material for enclosing the semiconductor dye and the electrical connection wires before molding the shell in an epoxy resin. The protective shell is composed of two corresponding half parts and, in the case of optically active devices, the top half of the shell is provided with a window closed by a transparent pane which is sealed during the encapsulation. Preferably, the two halves of the protection shell have two spaced lateral walls forming two spaced sealing perimeters and a perimetral chamber which is formed therebetween and surrounds a central cavity of the shell for accommodating any encapsulating resin which may eventually enter through the outer sealing perimeter during molding. The central cavity of the shell may be filled with a nonrigid silicon resin before molding for further increasing the protection. The entirely plastic hollow package may be formed through a normal plastic molding process.

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