Lithographic apparatus and device manufacturing method

    公开(公告)号:US20060114441A1

    公开(公告)日:2006-06-01

    申请号:US11335681

    申请日:2006-01-20

    CPC classification number: G03F7/70008 G03F7/7005

    Abstract: A lithographic apparatus includes an illumination system configured to provide a beam of radiation, a support configured to support a patterning device, a substrate table and a projection system. Furthermore, the lithographic apparatus includes a plurality of EUV sources for providing EUV radiation to the illumination system and a distributor which is arranged to convert the EUV radiation from each of the EUV sources into an intermediate beam of radiation. The intermediate beam of radiation is directed from the distributor in a first direction by a mirror surface. The distributor may include a rotationally driven mirror arrangement, the axis of rotation being non-parallel to the mirror surface.

    Lithographic apparatus and device manufacturing method
    42.
    发明申请
    Lithographic apparatus and device manufacturing method 有权
    平版印刷设备和器件制造方法

    公开(公告)号:US20060109442A1

    公开(公告)日:2006-05-25

    申请号:US10995536

    申请日:2004-11-24

    CPC classification number: G03F7/70141 G03F7/70091

    Abstract: A lithographic apparatus includes an illumination system configured to provide a beam of radiation and projection system configured to project the radiation beam onto a target portion of a substrate. At least one of the illumination system and the projection system includes a focusing element for reflecting or refracting the beam. A plurality of stop discs is provided, each having an aperture therethrough, together with a disc positioner configured to place one of the stop discs adjacent the focusing element to control the numerical aperture (NA) of the projection system or illumination system. The apparatus further includes a disc changer configured to select one of the stop discs and provide the selected stop disc to the disc positioner, the disc changer being external to the projection system or illumination system.

    Abstract translation: 光刻设备包括被配置为提供辐射束和投影系统的照明系统,其配置成将辐射束投影到基板的目标部分上。 照明系统和投影系统中的至少一个包括用于反射或折射光束的聚焦元件。 提供了多个止动盘,每个具有穿过其中的孔,以及配置成将止动盘中的一个邻近聚焦元件放置的盘定位器,以控制投影系统或照明系统的数值孔径(NA)。 该装置还包括一个换盘器,其被配置为选择一个停止盘并将所选择的停止盘提供给盘定位器,换盘器位于投影系统或照明系统的外部。

    Lithographic apparatus
    45.
    发明申请
    Lithographic apparatus 有权
    平版印刷设备

    公开(公告)号:US20050157285A1

    公开(公告)日:2005-07-21

    申请号:US10848586

    申请日:2004-05-19

    CPC classification number: G03F7/70066 G03F7/70191

    Abstract: A lithographic apparatus including means for selectively transmitting a projection beam before imaging the patterned projection beam onto a substrate. The means may include any of the following: a selectively transmitting device disposed downstream of a patterning device in the direction of the projection beam, a fixed and a moving set of masking blades in a scanning system or an array of switchable elements. The means may be provided to a mask table/holder or to a frame or structure of the lithographic projection apparatus.

    Abstract translation: 一种光刻设备,包括用于在将图案化的投影光束成像到衬底上之前选择性地透射投影光束的装置。 该装置可以包括以下任何一种:在投影光束的方向上布置在图案形成装置的下游的选择性发射装置,扫描系统中的固定的和可移动的掩蔽刀片组,或可切换元件的阵列。 该装置可以提供给掩模台/保持器或光刻投影装置的框架或结构。

    Method for exposing a substrate, patterning device, and lithographic apparatus
    46.
    发明申请
    Method for exposing a substrate, patterning device, and lithographic apparatus 审中-公开
    曝光基板,图案形成装置和光刻装置的方法

    公开(公告)号:US20050134820A1

    公开(公告)日:2005-06-23

    申请号:US10740830

    申请日:2003-12-22

    CPC classification number: G03F7/70075 G03F7/701 G03F7/70425 G03F7/70566

    Abstract: A method using a lithographic apparatus comprising a reflective integrator is claimed that optimizes the exposure of features on a target area of a substrate, when the features make an angle between 5 and 85 degrees with respect to the target area. The method comprises rotating the reflective integrator with respect to the target area providing a rotated mirror-symmetric pupil shape, which is implemented by either rotating the substrate or rotating the reflective integrator with respect to the machine or the patterning device. The patterning device comprises a maximum usable area and a patterned area which are rotated with respect to each other if a rotated substrate is employed. The method can be used in single exposure or double exposure mode. A further advantage of the method of using a rotated wafer is that it can be used for exposing features on a substrate in any direction even when the projection system of the lithographic apparatus shows a preferred polarization direction.

    Abstract translation: 要求使用包括反射积分器的光刻设备的方法,当特征相对于目标区域形成5至85度的角度时,可优化基板目标区域上的特征的曝光。 该方法包括使反射积分器相对于目标区域旋转,从而提供旋转的对称瞳孔形状,其通过旋转基底或相对于机器或图案形成装置旋转反射积分器来实现。 如果使用旋转的衬底,则图案形成装置包括相对于彼此旋转的最大可用面积和图案化区域。 该方法可用于单次曝光或双曝光模式。 使用旋转晶片的方法的另一个优点是,即使当光刻设备的投影系统显示优选的偏振方向时,其可以用于在任何方向上曝光衬底上的特征。

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