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120 条记录 (耗时 0.036 秒)

    PARTICLE CHARACTERIZATION DEVICE
    44.
    发明申请
    PARTICLE CHARACTERIZATION DEVICE 有权
    颗粒特征装置

    公开(公告)号：US20110181869A1

    公开(公告)日：2011-07-28

    申请号：US13121170

    申请日：2009-09-25

    申请人： Tetsuji Yamaguchi ,  Tatsuo Igushi ,  Takuji Kurozumi

    发明人： Tetsuji Yamaguchi ,  Tatsuo Igushi ,  Takuji Kurozumi

    IPC分类号： G01N15/02 ,  G01N27/26

    CPC分类号： G01N15/0205 ,  G01N21/21 ,  G01N21/53 ,  G01N2015/0294 ,  G01N2015/03

    摘要： Provided is a particle characterization device that can ensure measurement accuracy even though light detecting means has a single configuration, and enables the number of optical elements to be decreased as much as possible to suppress cost increase and reduce the number of adjustment places, and the particle characterization device has an incident side polarizer and an incident side ¼ wavelength plate as an illumination optical system mechanism and, as a light receiving optical system mechanism, an exit side ¼ wavelength plate and an exit side polarizer that can be rotated to a plurality of angle positions around a cell, wherein light attenuating means that prevents a polarization state from being changed is provided on a light path, and a light attenuation rate by the light attenuating means is controlled such that a detected light intensity at each measurement position falls within a measurement range of light detecting means.

    摘要翻译： 提供了即使光检测装置具有单一结构也能够确保测量精度的粒子表征装置，并且能够尽可能多地减少光学元件的数量以抑制成本增加并减少调整位置的数量，并且粒子 表征装置具有入射侧偏振器和入射侧¼波长板作为照明光学系统机构，并且作为光接收光学系统机构，出射侧¼波长板和出射侧偏振器可以旋转到多个角度 在光通路上设置有围绕电池的位置，其中防止偏振状态改变的光衰减装置被设置在光路上，并且控制光衰减装置的光衰减率，使得每个测量位置处的检测光强度落入测量 光检测装置的范围。

    SOLID-STATE IMAGING DEVICE, METHOD FOR MANUFACTURING SOLID-STATE IMAGING DEVICE, AND IMAGING APPARATUS
    45.
    发明申请
    SOLID-STATE IMAGING DEVICE, METHOD FOR MANUFACTURING SOLID-STATE IMAGING DEVICE, AND IMAGING APPARATUS 有权
    固态成像装置，制造固态成像装置的方法和成像装置

    公开(公告)号：US20100128161A1

    公开(公告)日：2010-05-27

    申请号：US12622652

    申请日：2009-11-20

    申请人： Tetsuji Yamaguchi

    发明人： Tetsuji Yamaguchi

    IPC分类号： H04N5/225 ,  H01L31/14 ,  H01L31/18

    CPC分类号： H01L27/14603 ,  H01L27/14609 ,  H01L27/1463 ,  H01L27/14687

    摘要： A solid-state imaging device includes, on a semiconductor substrate, a pixel portion having a plurality of pixels provided with a photoelectric conversion portion, which photoelectrically converts incident light to obtain a signal charge and a pixel transistor portion, which converts the signal charge read from the photoelectric conversion portion to a voltage, wherein an element isolation region disposed in the pixel portion includes an insulating film buried in a trench disposed in the semiconductor substrate, and the insulating film includes an insulating film having a negative charge.

    摘要翻译： 固态成像装置在半导体基板上具有具有设置有光电转换部的多个像素的像素部，该光电转换部对光入射光进行光电转换以获得信号电荷和像素晶体管部，该像素部将转换信号电荷读数 从所述光电转换部到电压，其中设置在所述像素部中的元件隔离区域包括埋设在所述半导体衬底中的沟槽中的绝缘膜，并且所述绝缘膜包括具有负电荷的绝缘膜。

    IMAGE FORMING SYSTEM, IMAGE FORMING APPARATUS AND METHOD FOR SETTING PRINTING FUNCTION
    47.
    发明申请
    IMAGE FORMING SYSTEM, IMAGE FORMING APPARATUS AND METHOD FOR SETTING PRINTING FUNCTION 失效
    图像形成系统，图像形成装置和设置打印功能的方法

    公开(公告)号：US20080166138A1

    公开(公告)日：2008-07-10

    申请号：US11969512

    申请日：2008-01-04

    申请人： Hiroyuki Hanano ,  Toru Yasui ,  Tetsuji Yamaguchi

    发明人： Hiroyuki Hanano ,  Toru Yasui ,  Tetsuji Yamaguchi

    IPC分类号： G03G15/00 ,  G03G15/08

    CPC分类号： G03G15/0875 ,  G03G15/0863 ,  G03G15/0868 ,  G03G2215/0697

    摘要： Disclosed is an image forming system, which comprises an image forming apparatus, and a toner container mountable to the image forming apparatus. The image forming apparatus includes a control section, and an information acquisition section which acquires the toner-quality information about a toner container which is demountably mounted thereto. The control section is operable, based on the toner-quality information acquired by the information acquisition section, to identify the quality of the toner contained in the toner container and set a printing function based on the identified toner quality.

    摘要翻译： 公开了一种图像形成系统，其包括图像形成装置和可安装到图像形成装置的调色剂容器。 图像形成装置包括控制部分和信息获取部分，其获取关于可拆卸地安装在其上的调色剂容器的调色剂质量信息。 控制部分基于由信息获取部分获取的调色剂质量信息来操作，以识别容纳在调色剂容器中的调色剂的质量，并且基于所识别的调色剂质量设置打印功能。

    Doping device
    49.
    发明申请
    Doping device 审中-公开
    兴奋剂

    公开(公告)号：US20070063147A1

    公开(公告)日：2007-03-22

    申请号：US11148287

    申请日：2005-06-09

    申请人： Shunpei Yamazaki ,  Junichi Koezuka ,  Hiroto Shinoda ,  Osamu Nakamura ,  Atsuo Isobe ,  Tetsuji Yamaguchi ,  Hiromichi Godo

    发明人： Shunpei Yamazaki ,  Junichi Koezuka ,  Hiroto Shinoda ,  Osamu Nakamura ,  Atsuo Isobe ,  Tetsuji Yamaguchi ,  Hiromichi Godo

    IPC分类号： H01J27/00 ,  H01J7/24 ,  H05B31/26

    CPC分类号： H01L27/127 ,  H01J37/3171 ,  H01L21/2652 ,  H01L21/26586 ,  H01L21/67213 ,  H01L27/1214 ,  H01L29/78621 ,  H01L29/78624 ,  H01L2029/7863

    摘要： According to the present invention, a manufacturing device of a semiconductor device provided with a device for uniformly doping with an impurity element a large area substrate capable of multiple patterns for the purpose of mass-production is provided. The present invention has a feature that a cross section of an ion current is to be a linear shape or a rectangle, and the large area substrate is moved in a direction perpendicular to a longitudinal direction of the ion current while keeping the large area substrate inclined at a predetermined tilt angle θ to the ion current. In this invention, an incident angle of an ion beam is adjusted as changing the tile angle θ. By making the large area substrate inclined to a horizontal plane, the width of the longitudinal direction of the ion current can be shortened than the length of a side of the substrate.

    摘要翻译： 根据本发明，提供了一种半导体器件的制造装置，其具有用于均匀掺杂杂质元素的装置，该装置能够进行批量生产的能够具有多种图案的大面积基板。 本发明的特征在于，离子电流的截面为直线形状或矩形，大面积基板沿垂直于离子电流的长度方向的方向移动，同时保持大面积基板倾斜 以离子电流的预定倾斜角θ。 在本发明中，随着瓦片角度θ的改变，离子束的入射角被调整。 通过使大面积基板倾斜于水平面，离子电流的长度方向的宽度可以比基板的一侧的长度缩短。

    Particle size distribution measuring apparatus and method
    50.
    发明授权
    Particle size distribution measuring apparatus and method 有权
    粒度分布测量装置及方法

    公开(公告)号：US07087885B1

    公开(公告)日：2006-08-08

    申请号：US09568907

    申请日：2000-05-11

    申请人： Tetsuji Yamaguchi

    发明人： Tetsuji Yamaguchi

    IPC分类号： G01V8/00

    CPC分类号： G01N15/0205

    摘要： The present invention provides an apparatus for measuring particle distribution for determining particle size distribution with higher precision by compensating for a reduction in scattering light due to the color of a sample and due to the particle size characterized by Mie scattering theory, and a method for measuring particle size distribution using such an apparatus. The apparatus for measuring particle distribution irradiates a laser beam to be measured, converts the resulting scattering light into an electrical detection signal, and performs inverse operation processes on the detection signal to calculate the particle size distribution of the sample. The measuring apparatus is provided with a laser light source that variably changes the wavelength of the laser beam depending on samples. The measuring apparatus is further provided with a particle size distribution analysis section for calculating the particle size distribution of the sample by using scattering light from the sample that are obtained upon application of the laser beam having a wavelength that allows measurement of the strongest from scattering light the sample.

    摘要翻译： 本发明提供了一种用于通过补偿由于样品的颜色导致的散射光的减少以及由于以米氏散射理论表征的粒径的尺寸来测量粒度分布以更高精度测量粒子分布的装置，以及用于测量 使用这种装置的粒度分布。 用于测量粒子分布的装置照射要测量的激光束，将所得到的散射光转换成电检测信号，并对检测信号执行逆运算处理，以计算样品的粒度分布。 测量装置设置有根据样品可变地改变激光束的波长的激光光源。 测量装置还具有粒度分布分析部分，用于通过使用来自样品的散射光来计算样品的粒度分布，所述散射光在施加具有允许测量最强散射光的波长的激光束时获得 例子。