摘要:
An electronic device has a plurality of electrically conductive first nanowires, a layer system applied on the first nanowires, and also second nanowires applied on the layer system. The first and second nanowires are arranged skew with respect to one another. The layer system is set up in such a way that charge carriers generated by the nanowires can be stored in the layer system.
摘要:
A memory cell containing at least three vertical transistors. A first transistor and a second transistor, or a third transistor are arranged over each other with reference to a y-axis proceeding perpendicularly to a surface of a substrate. The second transistor and the third transistor can be arranged at opposite sides of a semiconductor structure, while the first transistor is arranged at both sides. Source/drain regions of the transistors can overlap.
摘要:
A semiconductor device formed in a semiconductor substrate having a first main surface comprises a transistor array and a termination region. The transistor array comprises a source region, a drain region, a body region, a drift zone, and a gate electrode at the body region. The gate electrode is configured to control a conductivity of a channel formed in the body region. The gate electrode is disposed in first trenches. The body region and the drift zone are disposed along a first direction between the source region and the drain region, the first direction being parallel to the first main surface. The body region has a shape of a first ridge extending along the first direction. The termination region comprises a termination trench, a portion of the termination trench extending in the first direction, a length of the termination trench being larger than a length of the first trenches, the length being measured along the first direction.
摘要:
Semiconductor devices are formed with a silicide interface between the work function layer and polycrystalline silicon. Embodiments include forming a high-k/metal gate stack by: forming a high-k dielectric layer on a substrate, forming a work function metal layer on the high-k dielectric layer, forming a silicide on the work function metal layer, and forming a poly Si layer on the silicide. Embodiments include forming the silicide by: forming a reactive metal layer in situ on the work function layer, forming an a-Si layer in situ on the entire upper surface of the reactive metal layer, and annealing concurrently with forming the poly Si Layer.
摘要:
Generally, the subject matter disclosed herein relates to a semiconductor device with embedded low-k metallization. A method is disclosed that includes forming a plurality of copper metallization layers that are coupled to a plurality of logic devices in a logic area of a semiconductor device and, after forming the plurality of copper metallization layers, forming a plurality of capacitors in a memory array of the semiconductor device. The capacitors are formed using a non-low-k dielectric material (k value greater than 3), while the copper metallization layers are formed in layers of low-k dielectric material (k value less than 3). A semiconductor device is also disclosed which includes a plurality of logic devices, a memory array comprising a plurality of capacitors, a conductive contact plate coupled to the plurality of capacitors, and a plurality of copper metallization layers coupled to the logic devices, wherein the plurality of copper metallization layers are positioned at a level that is below a level of a bottom surface of the contact plate. A material other than a low-k dielectric material is positioned between the plurality of capacitors in the memory array.
摘要:
An integrated circuit with buried control line structures. In one embodiment, the control lines are subdivided into sections, wherein regions free of switching transistors are provided at intervals along the control lines. Connections for feeding the control potentials into the sections of the control lines are provided at least in a subset of the regions free of switching transistors. The isolations lines are connected to one another by an interconnect running transversely with respect to the control lines.
摘要:
An integrated circuit including a memory cell array comprises active area lines, bitlines, the bitlines being arranged so that an individual one intersects a plurality of the active area lines to form bitline-contacts, respectively, the bitlines being arranged at a bitline pitch, wordlines being arranged so that an individual one of the wordlines intersects a plurality of the active area lines, and an individual one of the wordlines intersects a plurality of the bitlines, the wordlines being arranged at a wordline pitch, wherein neighboring bitline-contacts, each of which is connected to one of the active area lines, are connected with different bitlines, and the bitline pitch is different from the wordline pitch.
摘要:
An integrated circuit including a memory cell array comprises transistors being arranged along parallel active area lines, bitlines, the bitlines being arranged so that an individual one intersects a plurality of the active area lines to form bitline-contacts, respectively, the bitlines being formed as wiggled lines, wordlines being arranged so that an individual one of the wordlines intersects a plurality of the active area lines, and an individual one of the wordlines intersects a plurality of the bitlines, wherein neighboring bitline-contacts, each of which is connected to one of the active area lines, are connected with different bitlines.
摘要:
An integrated circuit having a memory cell array and a method of forming an integrated circuit is disclosed. One embodiment provides bitlines running along a first direction, wordlines running along a second direction substantially perpendicular to the first direction, active areas and bitline contacts. The bitline contacts are arranged in columns extending in the second direction and in rows extending in the first direction. A distance between neighboring bitlines is DL, and a distance between neighboring bitline contacts is DC, DC being measured parallel to the first direction. The following relation holds: 1/2.25≦DL/DC≦1/1.75.
摘要:
A transistor, memory cell array and method of manufacturing a transistor are disclosed. In one embodiment, the invention refers to a transistor, which is formed at least partially in a semiconductor substrate, comprising a first and a second source/drain regions, a channel region connecting said first and second source/drain regions, said channel region being disposed in said semiconductor substrate, and a gate electrode disposed along said channel region and being electrically insulated from said channel region, for controlling an electrical current flowing between said first and second source/drain regions, wherein said channel region comprises a fin-region in which the channel has the shape of a ridge, said ridge comprising a top side and two lateral sides in a cross section perpendicular to a line connecting said first and second source/drain regions, wherein said top side is disposed beneath a surface of said semiconductor substrate and said gate electrode is disposed along said top side and said two lateral sides.