Abstract:
An active zone between a lower electrode deposited on a substrate and an upper electrode constitutes a portion of an amorphous semiconducting layer and is defined either by the dimensions of the upper electrode or by a window formed in an insulating layer. The method of fabrication consists in forming the two electrodes and the two active and insulating layers, the active layer and insulating layer being fabricated from amorphous compounds which are constituted either wholly or in part by the same elements.
Abstract:
An apparatus for marking identification symbols on a wafer including: a marking means for marking identification symbols on the wafer; a reading means for reading the marked identification symbols; a comparing means for comparing data of the identification symbols which are read by the reading means with basic data on which the identification symbols are marked on the wafer, and a judging means for inspecting and judging from a result of the comparison whether the desired identification symbols are marked on the wafer or not.
Abstract:
An amplifier for use as on the output buffer for semiconductor memories including a fusible element added to a push-pull configuration to allow permanent conversion to an open collector configuration by blowing the fusible element or including a semiconductor element added to a push-pull configuration to cause it to have an open collector configuration and being permanently converted to a push-pull configuration by shorting the semiconductor element.
Abstract:
a semiconductor die having bump type contact areas thereon with film strip leads bonded thereto and fired glass encapsulating only the active side of the die and the bump contact areas. The method of encapsulation includes bonding the film strip leads to the bumps of the die, coating the bumps and active area with unfired glass and firing the glass at a temperature generally below 450.degree. C. The method also includes bonding the film strip leads to the bumps and firing the glass simultaneously or firing the glass and remelting glass covering the bumps to bond the leads to the bumps through the fired glass.
Abstract:
An efficient electron emitter cold cathode is formed by first placing an ype monocrystalline substrate of about 100 to about 500 microns in thickness in a furnace. The furnace is heated to about 850.degree. C. to about 900.degree. C. and an N-type layer of about 10 to 15 microns of SnO.sub.2 is deposited onto the top surface of the substrate using a suitable carrier gas. Then, a P-type layer of about 10 microns of SnO.sub.2 is deposited on the N-type layer. The furnace is then cooled at a rate of about 10.degree. C. per minute to about 600.degree. C. to form the emitter. The furnace is then cooled to room temperature and the emitter removed from the furnace. The emitter is subjected to etching and polishing to obtain a P-type layer of about 2 to 4 microns, and a nonreactive metal contact is then deposited on the P-type layer. The emitter is then completed by bonding a metal contact to the base of the N-type monocrystalline substrate.
Abstract:
A method and resulting structure for a relative humidity monitor which can be built into an integrated circuit chip. A small area on a silicon chip is made porous by anodic etching. This region is then oxidized and a metal counter electrode is deposited over part of the porous area. The surface area in the dielectric under the counter electrode is very high and because of the openness of the structure, ambient moisture can quickly diffuse into the dielectric under the electrode and adsorb onto the silicon dioxide surface. Changes in ambient humidity will then be reflected by measurable changes in capacitance or conductance of the device.
Abstract:
A process for the manufacture of a light energy converter involves forming of a plurality of photovoltaic sources wherein first bodies of a first conductivity type semiconductor material each has a surface layer of a second conductivity type material and second bodies of said second conductivity type semiconductor material each has a surface layer of said first conductivity type material. The first and second bodies are intermingled in a one level layer in an insulating support. A conductive layer is applied to interconnect the first conductivity type material of all said first bodies with the second conductivity type material of all said second bodies. An electrolyte may wet such sources where, upon exposure to light, the sources cause a current to flow in the electrolyte producing an electrochemical reaction. The products of this reaction where the electrolyte is a solution such as aqueous hydrogen iodide, and the hydrogen produced by the electrochemical reaction may be stored, burned as a fuel or used in a fuel cell to produce electrical energy.
Abstract:
A heterojunction or Schottky barrier photovoltaic device comprising a conductive base metal layer compatible with and coating predominately the exposed surface of the p-type substrate of the device such that a back surface field region is formed at the interface between the device and the base metal layer, a transparent, conductive mixed metal oxide layer in integral contact with the n-type layer of the heterojunction or Schottky barrier device having a metal alloy grid network of the same metal elements of the oxide constituents of the mixed metal oxide layer embedded in the mixed metal oxide layer, an insulating layer which prevents electrical contact between the conductive metal base layer and the transparent, conductive metal oxide layer, and a metal contact means covering the insulating layer and in intimate contact with the metal grid network embedded in the transparent, conductive oxide layer for conducting electrons generated by the photovoltaic process from the device.
Abstract:
In a method for fabricating a semiconductor device, a polycrystalline film deposited on a main surface of a substrate is subjected to selective oxidation to form polycrystalline silicon electrode wiring paths separated by silicon oxide. An impurity of a conductivity type opposite to that of the substrate is introduced through at least one of the wiring paths into the substrate. Also disclosed is a novel semiconductor device fabricated according to this process which has a reduced junction area and a shortened junction-to-electrode distance.