LIGHT DETECTION DEVICE
    501.
    发明公开

    公开(公告)号:US20230358610A1

    公开(公告)日:2023-11-09

    申请号:US18223209

    申请日:2023-07-18

    CPC classification number: G01J3/26 G01J3/0297 G01J3/45 G02B5/281 G02B26/001

    Abstract: A light detection device of the present invention includes: a wiring board; a first support part disposed on a mounting surface of the wiring board; a Fabry-Perot interference filter having a first mirror part and a second mirror part between which a distance is variable and having an outer edge portion disposed in a first support region of the first support part; a light detector disposed on the mounting surface to face the first mirror part and the second mirror part on one side of the first support part; and a temperature detector disposed on the mounting surface, wherein the temperature detector is disposed on the mounting surface such that at least a part of the temperature detector overlaps a part of the Fabry-Perot interference filter when seen in a first direction perpendicular to the mounting surface and such that at least a part of the temperature detector overlaps a part of the first support part when seen in a second direction in which the first support part and the light detector are aligned with each other, and wherein a first distance between the temperature detector and the first support part in the second direction is smaller than a first width of the first support region in the second direction.

    DEVICE AND METHOD FOR ONLINE MEASURING SPECTRUM FOR LASER DEVICE

    公开(公告)号:US20230194348A1

    公开(公告)日:2023-06-22

    申请号:US17915388

    申请日:2020-12-16

    CPC classification number: G01J3/45 G01J3/021 G01J2003/451

    Abstract: Provided are a device (4) and a method for online measuring a spectrum for a laser device. The device (4) for online measuring a spectrum for a laser device includes: a first optical path assembly (G1) and a second optical path assembly (G2), and the second optical path assembly (G2) and the first optical path assembly (G1) constitute a measurement optical path. The second optical path assembly (G2) includes: an FP etalon (15) and a grating (18). The homogenized laser beam passes through the FP etalon (15) to generate an interference fringe. The grating (18) is arranged after the FP etalon (15), or is arranged before the FP etalon (15) in the measurement optical path, and is configured to disperse the laser beam passing through the FP etalon (15). A high precision measurement in a wide range for a central wavelength of a laser beam and an accurate measurement for spectral parameters of a corresponding FWHM and E95 are achieved through an arrangement of the FP etalon and the grating “in series” in the measurement optical path. There is no moving element in the measurement optical path, the structure is simple and compact, the measurement precision is high, and the stability is high. The corresponding measurement algorithm is simple and efficient, and has an extremely high scientific research or commercial application value.

    Wavelength reference device
    504.
    发明授权

    公开(公告)号:US11662250B2

    公开(公告)日:2023-05-30

    申请号:US17112583

    申请日:2020-12-04

    CPC classification number: G01J3/0297 G01J3/0218 G01J3/0286 G01J3/45 H04B10/25

    Abstract: Described herein is a wavelength reference device comprising a housing defining an internal environment having a known temperature. A broadband optical source is disposed within the housing and configured to emit an optical signal along an optical path. The optical signal has optical power within a wavelength band of interest. An optical etalon is also disposed within the housing and positioned in the optical path to filter the optical signal to define a filtered optical signal that includes one or more reference spectral features having a known wavelength at the known temperature. The device also includes an optical output for outputting the filtered optical signal.

    FOURIER TRANSFORM INFRARED SPECTROPHOTOMETER
    506.
    发明申请

    公开(公告)号:US20190011357A1

    公开(公告)日:2019-01-10

    申请号:US16028531

    申请日:2018-07-06

    Abstract: The Fourier transform infrared spectrophotometer includes: a light source 11 for generating infrared light having a wavelength width including an absorption wavelength of a compound to be analyzed; an interferometer including a fixed mirror 15 and a movable mirror 16, for generating interfering light from the infrared light; a detector 25 for generating a voltage with a magnitude corresponding to the intensity of the interfering light, and for outputting a voltage obtained by subtracting, from the aforementioned voltage, a voltage with a predetermined magnitude; a high-pass filter 464 for allowing the passage of frequency components equal to or higher than a predetermined frequency in an output voltage from the detector 25; an amplifier 463 for amplifying an output voltage from the high-pass filter 464 by a predetermined multiplying factor; and an analogue-to-digital converter 27 for converting an output voltage from the amplifier 463 into a digital signal.

    MEASUREMENT DEVICE, ELECTRONIC APPARATUS, AND MEASUREMENT METHOD

    公开(公告)号:US20190003889A1

    公开(公告)日:2019-01-03

    申请号:US16106712

    申请日:2018-08-21

    Abstract: A spectroscopic camera includes a wavelength variable interference filter, and an image sensor that receives light which is transmitted through the wavelength variable interference filter. Measurement is implemented a plurality of times by causing measurement light to be incident to the wavelength variable interference filter and changing the wavelength of light that is transmitted by the wavelength variable interference filter. Reflectance based on the intensity of light when a first pixel of the image sensor receives light of a target wavelength, is predicted in the respective plurality of repetitions of measurement on the basis of a light reception central wavelength of light that the first pixel receives, and reflectance that is calculated on the basis of the intensity of light that is received by the first pixel.

    Interferometer for spatial chirp characterization

    公开(公告)号:US09964449B2

    公开(公告)日:2018-05-08

    申请号:US14887114

    申请日:2015-10-19

    CPC classification number: G01J11/00 G01J3/45 G02B5/122 G02B27/149

    Abstract: Spectral interferometric systems and methods to characterize lateral and angular spatial chirp to optimize intensity localization in spatio-temporally focused ultrafast beams are described. Interference between two spatially sheared beams in an interferometer leads to straight fringes if the wavefronts are curved. To produce reference fringes, one arm relative to another is delayed in order to measure fringe rotation in the spatially resolved spectral interferogram. Utilizing Fourier analysis, frequency-resolved divergence is obtained. In another arrangement, one beam relative to the other is spatially flipped, which allows the frequency-dependent beamlet direction (angular spatial chirp) to be measured. Blocking one beam shows the spatial variation of the beamlet position with frequency (i.e., the lateral spatial chirp).

    Sagnac Fourier Spectrometer (SAFOS)
    510.
    发明申请

    公开(公告)号:US20180120086A1

    公开(公告)日:2018-05-03

    申请号:US15341104

    申请日:2016-11-02

    Inventor: Matthias Lenzner

    Abstract: A technique and device to determine the spectrum of electromagnetic radiation in a certain range of wavelengths comprising: splitting said radiation into more than one beam; let these beams counter-propagate in a Sagnac-type ring interferometer; and imprinting a wavelength-dependent angular tilt onto the wavefront of each beam by at least one dispersive element which preferably is a transmission grating or grism; and re-combining the multiple beams on a detector that exhibits spatial resolution and can therefore resolve the fringes formed by interference; and perform the mathematical operations to determine the spectrum of said radiation from the obtained interferogram, wherein the dispersive element is mounted on a stage providing linear and/or rotational movement.

Patent Agency Ranking