摘要:
A temperature sensing circuit and method are provided. An example temperature sensing circuit includes a temperature sensing unit that outputs a temperature signal indicating whether the temperature in the semiconductor device is higher or lower than a reference temperature in response to a first current control signal or a second current control signal by using a first current level that is increased when the temperature rises and a second current level that is reduced when the temperature rises. The temperature sensing unit also includes a storage unit that stores and outputs the temperature signal, and a controller that changes the first current level or the second current level in response to the temperature signal output from the storage unit and generates the first current control signal or the second current control signal used to control the reference temperature.
摘要:
A memory core of a resistive type memory device includes at least a first resistive type memory cell coupled to a bit-line, a first resistance to voltage converter and a bit-line sense amplifier. The first resistance to voltage converter is coupled to the bit-line at a first node. The first resistance to voltage converter converts a resistance of the first resistive type memory cell to a corresponding voltage based on a read column selection signal. The bit-line sense amplifier is coupled to the bit-line at the first node and is coupled to a complementary bit-line at a second node. The bit-line sense amplifier senses and amplifies a voltage difference of the bit-line and the complementary bit-line in response to a sensing control signal.
摘要:
A resistive memory device may include first and second resistive memory cells, a reference current generator, and first and second bitline sense amplifiers. The reference current generator may be configured to apply the first and second reference currents to a first common node. A total reference current of the first reference current and the second reference current provided to the first common node may be divided into a first sensing current and a second sensing current by the first common node. The first and second sensing currents may be provided to the first and second bitline sense amplifiers by the first common node, respectively. The first and second bitline sense amplifiers may be configured to sense first data of the first resistive memory cell and second data of the second resistive memory cell based on the first and second sensing currents, respectively.
摘要:
A resistive memory device may include a resistive cell array and an on-chip resistance measurement circuit. The resistive cell array may include a plurality of resistive memory cells. The on-chip resistance measurement circuit may be configured to generate a first current and a second current greater or less than the first current based on a cell current corresponding to a cell resistance of a first memory cell of the resistive memory cells, and to generate first and second digital signals based on the first and second current, respectively.
摘要:
Example embodiments include a resistive type memory sense amplifier circuit including differential output terminals, first and second input terminals, a pre-charge section, and other components arranged so that current is re-used during at least a “set” or “amplification” stage of the sense amplifier circuit, thereby reducing overall current consumption of the circuit, and improving noise immunity. A voltage level of a high-impedance output terminal is caused to swing in response to a delta average current between a reference line current and a bit line current. During a “go” or “latch” stage of operation, a logical value “0” or “1” is latched at the differential output terminals based on positive feedback of a latch circuit. Also disclosed is a current mirror circuit, which can be used in conjunction with the disclosed sense amplifier circuit. In yet another embodiment, a sense amplifier circuit includes the capability of read/re-write operation.
摘要:
A magneto-resistive random access memory (MRAM) comprising an MRAM cell array having an MRAM cell, and a control and voltage generation unit configured to generate a back bias voltage for the MRAM cell. The control and voltage generation unit comprising a command decoder configured to generate a decoding signal in response to a command output from a memory controller, and a voltage controller and generator configured to generate the back bias voltage with a magnitude based on the decoding signal and a reset signal output from the memory controller.
摘要:
One embodiment of the oscillator includes a first starved inverter and a second starved inverter. An inner inverter of the second starved inverter is cross-coupled to an inner inverter of the first starved inverter. The oscillator further includes a first inverter connected to output of the inner inverter of the first starved inverter, and a second inverter connected to output of the inner inverter of the second starved inverter.
摘要:
A non-volatile memory device including a cell array, which includes a plurality of memory cells, and a sense amplification circuit. The sense amplification circuit is configured to receive a data voltage of a memory cell, a first reference voltage and a second reference voltage during a data read operation of the memory cell, generate differential output signals based on a voltage level difference between the data voltage and the first and second reference voltages, and output the differential output signals as data read from the memory cell.
摘要:
A signal transceiver may include three transmission lines, a signal transmission unit, and/or a signal reception unit. The signal transmission unit may be configured encode first through third transmission data to generate first through third data and transmit the first through third data through the three transmission lines. The signal transmission unit may be configured to generate each of the first through third data at one of four or more voltage level. The signal reception unit may be configured to receive the first through third data and monitor voltage differences between the first through third data to restore the first through third data into first through third reception data.
摘要:
A voltage-controlled oscillator comprises a first oscillator and a second oscillator. The first oscillator may generate a plurality of intermediate clock signals at a plurality of first nodes, multiply connected to a plurality of first ring shape circuits, in response to a control voltage. The plurality of intermediate clock signals may have a different phase from each other and a same phase difference with each other. The second oscillator may generate a plurality of output clock signals at a plurality of second nodes, multiply connected to a plurality of second ring shape circuits, by changing a voltage level of the intermediate clock signals. The plurality of second ring shape circuits may pass the plurality of first nodes.