摘要:
A resistive memory device includes a column decoder having a first switch unit, including at least one pair of switches arranged in correspondence to each of a plurality of signal lines, and a second switch unit including a pair of switches arranged in correspondence to the at least one pair of switches of the first switch unit. A first pair of switches of the first switch unit includes a first switch and a second switch that are of the same type, and a second pair of switches of the second switch unit includes a third switch and a fourth switch that are connected to the first pair of switches. A selection voltage is provided to the first signal line by passing through the first switch, and an inhibit voltage is provided to the first signal line by selectively passing through the first switch or the second switch.
摘要:
A memory device includes a memory cell array having multiple memory cells arranged respectively in regions where first signal lines cross second signal lines. The memory device further includes a decoder having multiple line selection switch units connected respectively to the of first signal lines. Each of the multiple line selection switch units applies a bias voltage to a first signal line corresponding to each of the multiple line selection switch units in response selectively to a first switching signal and a second switching signal, voltage levels of which are different from each other in activated states.
摘要:
A non-volatile memory device comprises a memory cell array comprising memory cells arranged in rows connected to corresponding word lines and columns connected to corresponding bit lines, a page buffer that stores a program data, a read-write circuit that programs and re-programs the program data into selected memory cells of the memory cell array and reads stored data from the programmed memory cells, and a control circuit that controls the page buffer and the read-write circuit to program the selected memory cells by loaded the program data from in page buffer and to re-program the selected memory cells by re-loaded the program data in the page buffer.
摘要:
A three-dimensional (3D) non-volatile memory includes a memory cell array and a merge driver configured to apply a merge voltage at the same level to a common source line and a bulk in the memory cell array.
摘要:
A flash memory device includes a program data buffer configured to buffer program data to be programmed in a memory cell array, and a verify data buffer configured to compare verify data to confirm whether the program data is accurately programmed in the memory cell array, wherein at least a portion of the verify data buffer is selectively enabled as a verify data buffer or a program data buffer responsive to a buffer control signal.
摘要:
In a method of driving a nonvolatile memory device a first data state is determined from among the plurality of data states. The number of simultaneously programmed bits is set according to the determined first data state and a scanning operation is performed on data input from an external device to search data bits to be programmed. The searched data bits are programmed in response to the number of simultaneously programmed bits. The number of simultaneously programmed bits corresponding to the first data state is different from a number of simultaneously programmed bits corresponding to at least a second of the plurality of data states.
摘要:
In one aspect, a program method is provided for a flash memory device including a plurality of memory cells each being programmed in one of a plurality of data states. The program method of this aspect includes programming selected memory cells in a first data state, verifying a result of the programming, successively programming selected memory cells in at least two or more data states corresponding to threshold voltages which are lower than a threshold voltage corresponding to the first data state, and verifying results of the successive programming.
摘要:
A flash memory device includes a memory cell array, an address buffer circuit including address buffers, each address buffer configured to store an address for a random read operation, a read circuit configured to sense data from the memory cell array in response to an address output from the address buffer circuit, an output data latch circuit configured to receive data sensed by the read circuit, and a control logic coupled to the address buffer circuit, the read circuit, and the output data latch circuit, and configured to control the output data latch circuit and the read circuit such that the output data latch circuit outputs first data read from the memory cell array substantially simultaneously as the read circuit senses second data from the memory cell array.
摘要:
Disclosed is a nonvolatile memory device and programming method of a nonvolatile memory device. The programming method of the nonvolatile memory device includes conducting a first programming operation for a memory cell, retrieving original data from the memory cell after the first programming operation, and conducting a second programming operation with reference to the original data and a second verifying voltage higher than a first verifying voltage of the first programming operation.
摘要:
An erase operation for a flash memory device includes identifying a sector group including a plurality of sectors based on an address, simultaneously pre-programming the sectors in the sector group, simultaneously erasing the sectors the sector group, and simultaneously post-programming the sectors in the sector group.