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    Switching power supply with increased efficiency at light load
    51.
    发明授权
    Switching power supply with increased efficiency at light load 有权
    开关电源在轻负载时效率更高

    公开(公告)号：US07911811B2

    公开(公告)日：2011-03-22

    申请号：US12246620

    申请日：2008-10-07

    申请人： William R. Wheeler ,  Wei-Liang Lin

    发明人： William R. Wheeler ,  Wei-Liang Lin

    IPC分类号： H02M3/335

    CPC分类号： H02M3/33507 ,  H02M2001/007

    摘要： A switching power supply with the increased efficiency at light load has a switching power circuit, a power monitoring circuit and a light load power supplying circuit. The switching power circuit converts an AC power to a stable DC power and sends the DC power to a load according to voltage variation of the load. When the power monitoring circuit detects the AC power and determines that the load is in a light state, the power monitoring circuit controls the light load power supplying circuit to output a small-power DC to the load. As the DC power provided by the light load power supplying circuit is small, the switching loss ratio is lower in its light load state. Therefore, the operating efficiency at the light load state is higher.

    摘要翻译： 具有提高轻负载效率的开关电源具有开关电源电路，功率监视电路和轻负载供电电路。 开关电源电路将交流电转换成稳定的直流电力，并根据负载的电压变化将直流电力发送到负载。 当电源监视电路检测到交流电源并确定负载处于亮状态时，电力监控电路控制轻负载供电电路向负载输出小功率DC。 由于轻负载供电电路提供的直流电力小，其轻负载状态下的开关损耗率较低。 因此，轻负载状态下的工作效率较高。

    SAFETY SOCKET
    52.
    发明申请
    SAFETY SOCKET 审中-公开
    安全插座

    公开(公告)号：US20090315409A1

    公开(公告)日：2009-12-24

    申请号：US12362024

    申请日：2009-01-29

    申请人： William R. Wheeler ,  Chien-Long Lin ,  Shiann-Chang Yeh ,  Chien-Hong Lin ,  Che-Cheng Chang

    发明人： William R. Wheeler ,  Chien-Long Lin ,  Shiann-Chang Yeh ,  Chien-Hong Lin ,  Che-Cheng Chang

    IPC分类号： H02H3/40

    CPC分类号： H01R13/665 ,  H01R13/6683 ,  H02H3/42 ,  Y10T307/832

    摘要： A digital automatic monitoring and power breaking safety socket has a shell in which an electrical connection base is mounted for connecting to a power line and an external line plug inside. A power switch is connected in series between the electrical connection base and the power line. A digital power monitoring circuit is coupled to the power line detect the power status to control the power switch based on the power status. Further, a power line data communication circuit is mounted in the shell and connects to the digital power monitoring circuit to obtain and process the power status. The processed power status is loaded into the power line that connects to the electrical connection base. Therefore, in addition to automatic power breaking and supplying, a remote power management host is able to obtain the power status and remotely control the socket.

    摘要翻译： 数字自动监测和断电安全插座具有壳体，其中安装有电连接基座用于连接到电力线和外部线路插头。 电源开关串联在电气连接基座和电源线之间。 数字电源监控电路耦合到电源线，根据电源状态检测电源状态，控制电源开关。 此外，电源线数据通信电路安装在外壳中并连接到数字电源监控电路以获得并处理电源状态。 处理后的电源状态被加载到连接到电气连接基座的电力线上。 因此，除了自动断电和供电之外，远程电源管理主机能够获得电源状态并远程控制插座。

    System for sensing a sample
    55.
    发明授权
    System for sensing a sample 失效
    用于感测样品的系统

    公开(公告)号：US07278301B2

    公开(公告)日：2007-10-09

    申请号：US11423098

    申请日：2006-06-08

    申请人： Thomas McWaid ,  Peter Panagas ,  Steven G. Eaton ,  Amin Samsavar ,  William R. Wheeler

    发明人： Thomas McWaid ,  Peter Panagas ,  Steven G. Eaton ,  Amin Samsavar ,  William R. Wheeler

    IPC分类号： G01B5/28 ,  G01N13/10 ,  G01N13/16

    CPC分类号： G01B3/008 ,  G01B7/34 ,  G01Q10/06 ,  G01Q60/34 ,  Y10S977/851

    摘要： A profiler or scanning probe microscope may be scanned across a sample surface with a distance between them controlled to allow the sensing tip to contact the surface intermittently in order to find and measure features of interest. The distance is controlled so that when the sensing tip is raised or lowered to touch the sample surface, there is no lateral relative motion between the tip and the sample. This prevents tip damage. Prior knowledge of the height distribution of the sample surface may be provided or measured and used for positioning the sensing tip initially or in controlling the separation to avoid lateral contact between the tip and the sample. The process may also be performed in two parts: a fast find mode to find the features and a subsequent measurement mode to measure the features. A quick step mode may also be performed by choosing steps of lateral relative motion to be smaller than 100 nanometers to reduce probability of tip damage. In this mode, after each vertical step to increase the separation between the tip and the sample, it is detected as to whether the tip and the sample are in contact. If they are still in contact after the vertical step, one or more vertical steps are taken to increase the separation, and no vertical step to reduce the separation is taken and no lateral relative motion is caused until it is determined that the tip and the sample are no longer in contact.

    摘要翻译： 扫描仪或扫描探针显微镜可以跨样品表面进行扫描，其间的距离被控制以允许感测尖端间歇地接触表面，以便找到并测量感兴趣的特征。 控制距离使得当感测尖端升高或降低以接触样品表面时，尖端和样品之间没有横向相对运动。 这可以防止尖端损坏。 可以提供或测量样品表面的高度分布的先前知识并且用于最初定位感测尖端或者用于控制分离以避免尖端和样品之间的横向接触。 该过程也可以分两部分执行：快速查找模式以查找特征，以及随后的测量模式来测量特征。 还可以通过选择横向相对运动的步骤来小于100纳米，以减少尖端损伤的可能性来执行快速步进模式。 在该模式中，在每个垂直步骤之后，增加尖端和样品之间的间隔，检测尖端和样品是否接触。 如果它们在垂直步骤之后仍然接触，则采取一个或多个垂直步骤来增加分离，并且不采取垂直步骤来减小分离，并且不会引起横向相对运动，直到确定尖端和样品 不再联系。

    Logic simulation
    56.
    发明授权
    Logic simulation 失效

    公开(公告)号：US07130784B2

    公开(公告)日：2006-10-31

    申请号：US09942116

    申请日：2001-08-29

    申请人： William R. Wheeler ,  Timothy J. Fennell ,  Matthew J. Adiletta

    发明人： William R. Wheeler ,  Timothy J. Fennell ,  Matthew J. Adiletta

    IPC分类号： G06F17/50

    CPC分类号： G06F17/5022

    摘要： Logic simulation includes storing a first state to identify in a simulation of a logic design whether a node included in the logic design has a logic high value Logic simulation also includes storing a second state to identify in simulation of the logic design whether the node has a logic low value and storing a third state to identify in simulation of the logic design whether the node has an undefined state. The logic simulation determines an output of the node in simulation of the logic design based on the first state, the second state, and the third state.

    Real-time connection error checking method and process
    58.
    发明授权
    Real-time connection error checking method and process 失效
    实时连接错误检查方法和流程

    公开(公告)号：US06640329B2

    公开(公告)日：2003-10-28

    申请号：US09941498

    申请日：2001-08-29

    申请人： William R. Wheeler ,  Matthew J. Adiletta

    发明人： William R. Wheeler ,  Matthew J. Adiletta

    IPC分类号： G06F1750

    CPC分类号： G06F17/5022 ,  G06F17/5045

    摘要： A method comprising monitoring a design environment to detect the addition of a circuitry component to a circuit being designed by a circuit designer. The method accesses a connection parameter definition file that specifies a set of connection parameters for that added circuitry component. The method compares the connection parameters defined in the connection parameter definition file with the actual connections of the added circuitry component. The method provides the circuit designer with feedback concerning the validity of the actual connections of the added circuitry component.

    摘要翻译： 一种方法，包括监视设计环境以检测电路组件到由电路设计者设计的电路的添加。 该方法访问连接参数定义文件，该文件为该添加的电路组件指定一组连接参数。 该方法将连接参数定义文件中定义的连接参数与添加的电路组件的实际连接进行比较。 该方法为电路设计者提供关于所添加的电路组件的实际连接的有效性的反馈。

    System for sensing a sample
    60.
    发明授权
    System for sensing a sample 有权

    公开(公告)号：US06520005B2

    公开(公告)日：2003-02-18

    申请号：US09313962

    申请日：1999-05-18

    申请人： Thomas McWaid ,  Peter Panagas ,  Steven G. Eaton ,  Amin Samsavar ,  William R. Wheeler

    发明人： Thomas McWaid ,  Peter Panagas ,  Steven G. Eaton ,  Amin Samsavar ,  William R. Wheeler

    IPC分类号： G01B528

    CPC分类号： G01B3/008 ,  G01B7/34 ,  G01Q10/06 ,  G01Q60/34 ,  Y10S977/851

    摘要： A profiler or scanning probe microscope may be scanned across a sample surface with a distance between them controlled to allow the sensing tip to contact the surface intermittently in order to find and measure features of interest. The distance is controlled so that when the sensing tip is raised or lowered to touch the sample surface, there is no lateral relative motion between the tip and the sample. This prevents tip damage. Prior knowledge of the height distribution of the sample surface may be provided or measured and used for positioning the sensing tip initially or in controlling the separation to avoid lateral contact between the tip and the sample. The process may also be performed in two parts: a fast find mode to find the features and a subsequent measurement mode to measure the features. A quick step mode may also be performed by choosing steps of lateral relative motion to be smaller than 100 nanometers to reduce probability of tip damage. In this mode, after each vertical step to increase the separation between the tip and the sample, it is detected as to whether the tip and the sample are in contact. If they are still in contact after the vertical step, one or more vertical steps are taken to increase the separation, and no vertical step to reduce the separation is taken and no lateral relative motion is caused until it is determined that the tip and the sample are no longer in contact.