RESISTIVE NONVOLATILE MEMORY STRUCTURE EMPLOYING A STATISTICAL SENSING SCHEME AND METHOD

    公开(公告)号:US20200243126A1

    公开(公告)日:2020-07-30

    申请号:US16261617

    申请日:2019-01-30

    Abstract: A memory structure includes a first memory array with two transistor-two variable resistor memory cells and a second memory array with one transistor-one variable resistor memory cells, which are each selectively operable in read, write and standby modes. The first memory array and the second memory array are interleaved so that, when the second memory operates in the read mode, the first memory array automatically and concurrently operates in a reference mode. A method of operating the memory structure includes, when the second memory array operates in the read mode, automatically and concurrently operating the first memory array in the reference mode so that the first memory array generates and outputs a statistical reference voltage, which is between the low and high voltages of a nominal memory cell within the second memory array and which is employed by the second memory array to sense a stored data value.

    Resistive nonvolatile memory structure employing a statistical sensing scheme and method

    公开(公告)号:US10726896B1

    公开(公告)日:2020-07-28

    申请号:US16261617

    申请日:2019-01-30

    Abstract: A memory structure includes a first memory array with two transistor-two variable resistor memory cells and a second memory array with one transistor-one variable resistor memory cells, which are each selectively operable in read, write and standby modes. The first memory array and the second memory array are interleaved so that, when the second memory operates in the read mode, the first memory array automatically and concurrently operates in a reference mode. A method of operating the memory structure includes, when the second memory array operates in the read mode, automatically and concurrently operating the first memory array in the reference mode so that the first memory array generates and outputs a statistical reference voltage, which is between the low and high voltages of a nominal memory cell within the second memory array and which is employed by the second memory array to sense a stored data value.

    Gate cut isolation formed as layer against sidewall of dummy gate mandrel

    公开(公告)号:US10707206B2

    公开(公告)日:2020-07-07

    申请号:US16194691

    申请日:2018-11-19

    Abstract: A method of forming a gate cut isolation, a related structure and IC are disclosed. The method forms a dummy gate material mandrel having a sidewall positioned between and spaced from a first active region covered by the mandrel and a second active region not covered by the mandrel. A gate cut dielectric layer is formed against the sidewall of the mandrel, and may be trimmed. A dummy gate material may deposited to encase the remaining gate cut dielectric layer. Subsequent dummy gate formation and replacement metal gate processing forms a gate conductor with the gate cut isolation electrically isolating respective first and second portions of the gate conductor. The method creates a very thin, slightly non-vertical gate cut isolation, and eliminates the need to define a gate cut critical dimension or fill a small gate cut opening.

    Wideband low noise amplifier having DC loops with back gate biased transistors

    公开(公告)号:US10700653B2

    公开(公告)日:2020-06-30

    申请号:US15959514

    申请日:2018-04-23

    Abstract: Methods form amplifier device structures that include first-third amplifier devices. The first amplifier device produces an intermediate signal. The second amplifier device is connected to an input of the first amplifier device and produces an amplified inverted output signal. The third amplifier device inverts the intermediate signal to produce an amplified non-inverted output signal that is complementary to the amplified inverted output signal. A resistor feedback loop is connected to the input and output of the first amplifier device. A gain ratio of the gain of the third amplifier device to the gain of the second amplifier device matches a resistance ratio of the source resistance of the input signal to the resistance of the resistor added to the source resistance. Also, DC loop circuits are connected to the first-third amplifier devices, and each of the DC loop circuits connects an amplifier device output to an amplifier device input.

    LOW-POWER SCAN FLIP-FLOP
    59.
    发明申请

    公开(公告)号:US20200186131A1

    公开(公告)日:2020-06-11

    申请号:US16216369

    申请日:2018-12-11

    Abstract: Disclosed are scan flip-flops (SFFs) that reduce the dynamic power consumption of a system-on-chip (SOC) that incorporates them. Each SFF includes a master latch and a slave latch, each having a driver, a feed-forward path and a feedback path. Each SFF further includes at least one shared clock-gated power supply transistor, which is controlled by either a clock signal or an inverted clock signal to selectively and simultaneously connect a voltage rail to both the driver from one latch and the feedback path of the other latch. The different SFF embodiments have different numbers of shared clock-gated power supply transistors and various other different features designed for optimal power and/or performance. For example, the different SFF embodiments have different types of slave latch drivers; different types of transistors; and/or different types of master latch drivers (e.g., a single-stage, multiple clock phase-dependent driver or a multi-stage, single clock phase-dependent driver).

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