THROUGH SUBSTRATE VIAS USING SOLDER BUMPS
    61.
    发明申请

    公开(公告)号:US20170217767A1

    公开(公告)日:2017-08-03

    申请号:US15415919

    申请日:2017-01-26

    CPC classification number: B81C1/00301 B81C1/00095

    Abstract: A through substrate via is formed by disposing a quantity of solder material at the top of a through hole formed in a substrate, coating the hole with a wetting layer, and melting the solder material such that it flows into the hole. The solder material may alloy with the wetting layer, freezing upon formation of the alloy. Subsequent processing steps may be performed at temperatures higher than the melting point of the solder material.

    MEMS particle sorting actuator and method of manufacture
    63.
    发明授权
    MEMS particle sorting actuator and method of manufacture 有权
    MEMS颗粒分选机构及其制造方法

    公开(公告)号:US09372185B2

    公开(公告)日:2016-06-21

    申请号:US13987464

    申请日:2013-07-29

    Abstract: A MEMS-based system and a method are described for separating a target particle from the remainder of a fluid stream. The system makes use of a unique, microfabricated movable structure formed on a substrate, which moves in a rotary fashion about one or more fixed points, which are all located on one side of the axis of motion. The movable structure is actuated by a separate force-generating apparatus, which is entirely separate from the movable structure formed on its substrate. This allows the movable structure to be entirely submerged in the sample fluid.

    Abstract translation: 描述了基于MEMS的系统和方法,用于将目标颗粒与流体流的其余部分分离。 该系统利用形成在基板上的独特的微加工可移动结构,其以旋转方式围绕一个或多个固定点移动,所述固定点都位于运动轴的一侧。 可移动结构由独立的力产生装置致动,该装置与其基板上形成的可移动结构完全分开。 这允许可移动结构完全浸没在样品流体中。

    Solder bump sealing method and device
    65.
    发明授权
    Solder bump sealing method and device 有权
    焊接凸块密封方法及装置

    公开(公告)号:US09330874B2

    公开(公告)日:2016-05-03

    申请号:US14456972

    申请日:2014-08-11

    CPC classification number: H01H59/0009 B81C1/00333 H01H49/00 H03H9/1057

    Abstract: A method for forming a cavity in a microfabricated structure, includes the sealing of that cavity with a low temperature solder. The method may include forming a sacrificial layer over a substrate, forming a flexible membrane over the sacrificial layer, forming a release hole through a flexible membrane to the sacrificial layer, introducing an etchant through the release hole to remove the sacrificial layer, and then sealing that release hole with a low temperature solder.

    Abstract translation: 用于在微细结构中形成空腔的方法包括用低温焊料密封该空腔。 该方法可以包括在衬底上形成牺牲层,在牺牲层上形成柔性膜,形成通过柔性膜到牺牲层的释放孔,通过释放孔引入蚀刻剂以去除牺牲层,然后密封 该释放孔与低温焊料。

    Method for forming a microfabricated structure
    66.
    发明授权
    Method for forming a microfabricated structure 有权
    形成微细结构的方法

    公开(公告)号:US09302905B1

    公开(公告)日:2016-04-05

    申请号:US14738980

    申请日:2015-06-15

    Inventor: Suresh K Sampath

    Abstract: A method for forming a feature in a device layer, including forming a first layer of a liftoff material and a second layer of photoresist over the liftoff material, exposing the photoresist and developing the photoresist and the liftoff layer. The photoresist develops at a slower rate than the liftoff layer. The development results in a first opening in the lift off layer and a second opening in the photoresist layer wherein the first opening is smaller than the second opening because of the different developing rates. The device layer is then dry etched or ion milled through the opening. Subsequent removal of the first layer and second layer leaves a clean surface of the patterned device layer, without the fences that can be formed using other methods.

    Abstract translation: 一种用于在器件层中形成特征的方法,包括在剥离材料上形成第一层剥离材料和第二层光致抗蚀剂,暴露光致抗蚀剂并显影光致抗蚀剂和剥离层。 光致抗蚀剂以比剥离层更慢的速率显影。 显影导致剥离层中的第一开口和光致抗蚀剂层中的第二开口,其中由于不同的显影速率,第一开口小于第二开口。 然后将器件层干蚀刻或通过开口离子研磨。 随后去除第一层和第二层离开图案化的器件层的干净的表面,而不需要使用其它方法形成的栅栏。

    METHOD FOR FORMING THROUGH SUBSTRATE VIAS WITH TETHERS
    67.
    发明申请
    METHOD FOR FORMING THROUGH SUBSTRATE VIAS WITH TETHERS 有权
    通过具有四面体的基板VIAS形成的方法

    公开(公告)号:US20160093531A1

    公开(公告)日:2016-03-31

    申请号:US14619068

    申请日:2015-02-11

    Abstract: A method for forming through silicon vias (TSVs) in a silicon substrate is disclosed. The method involves forming a silicon post as an substantially continuous annulus in a first side of a silicon substrate, removing material from an opposite side to the level of the substantially continuous annulus, removing the silicon post and replacing it with a metal material to form a metal via extending through the thickness of the substrate. The substantially continuous annulus may be interrupted by at least one tether which connects the silicon post to the silicon substrate. The tether may be formed of a thing isthmus of silicon, or some suitable insulating material.

    Abstract translation: 公开了一种在硅衬底中形成硅通孔(TSV)的方法。 该方法包括在硅衬底的第一侧中形成硅柱作为基本上连续的环状空间,从与基本上连续的环的水平面相反的一侧去除材料,去除硅柱并用金属材料代替它,以形成 金属通过延伸穿过衬底的厚度。 基本上连续的环可被至少一个将硅柱连接到硅衬底的系绳中断。 系绳可以由硅的地峡或一些合适的绝缘材料形成。

    Wafer level hermetic bond using metal alloy with raised feature and wetting layer
    68.
    发明授权
    Wafer level hermetic bond using metal alloy with raised feature and wetting layer 有权
    使用具有凸起特征和润湿层的金属合金的晶圆级密封

    公开(公告)号:US09162878B2

    公开(公告)日:2015-10-20

    申请号:US14194794

    申请日:2014-03-02

    CPC classification number: B81C1/00269 B81C1/00849 B81C2203/019

    Abstract: Systems and methods for forming an encapsulated device include a substantially hermetic seal which seals a device in an environment between two substrates. The substantially hermetic seal is formed by an alloy of two metal layers, one having a lower melting temperature than the other. The metal layers may be deposited two substrates, along with a raised feature formed under at least one of the metal layers. The two metals may form an alloy of a predefined stoichiometry in at least two locations on either side of the midpoint of the raised feature. The formation of the alloy may be improved by the use of an organic wetting layer adjacent to the lower melting temperature metal. Design guidelines are set forth for reducing or eliminating the leakage of molten metal into the areas adjacent to the bondlines.

    Abstract translation: 用于形成封装装置的系统和方法包括在两个基板之间的环境中密封装置的基本上气密的密封。 基本上气密的密封由两个金属层的合金形成,一个熔化温度低于另一个。 金属层可以沉积两个基底,以及形成在至少一个金属层下面的凸起特征。 两种金属可以在凸起特征的中点的任一侧上的至少两个位置中形成预定化学计量的合金。 可以通过使用与较低熔点金属相邻的有机润湿层来改善合金的形成。 阐述了设计准则,以减少或消除熔融金属泄漏到与粘接线相邻的区域。

    WAFER LEVEL HERMETIC BOND USING METAL ALLOY WITH RAISED FEATURE AND WETTING LAYER
    69.
    发明申请
    WAFER LEVEL HERMETIC BOND USING METAL ALLOY WITH RAISED FEATURE AND WETTING LAYER 有权
    使用金属合金加成的特征和湿润层的波浪水平粘结

    公开(公告)号:US20150266726A1

    公开(公告)日:2015-09-24

    申请号:US14194794

    申请日:2014-03-02

    CPC classification number: B81C1/00269 B81C1/00849 B81C2203/019

    Abstract: Systems and methods for forming an encapsulated device include a substantially hermetic seal which seals a device in an environment between two substrates. The substantially hermetic seal is formed by an alloy of two metal layers, one having a lower melting temperature than the other. The metal layers may be deposited two substrates, along with a raised feature formed under at least one of the metal layers. The two metals may form an alloy of a predefined stoichiometry in at least two locations on either side of the midpoint of the raised feature. The formation of the alloy may be improved by the use of an organic wetting layer adjacent to the lower melting temperature metal. Design guidelines are set forth for reducing or eliminating the leakage of molten metal into the areas adjacent to the bondlines.

    Abstract translation: 用于形成封装装置的系统和方法包括在两个基板之间的环境中密封装置的基本上气密的密封。 基本上气密的密封由两个金属层的合金形成,一个熔化温度低于另一个。 金属层可以沉积两个基底,以及形成在至少一个金属层下面的凸起特征。 两种金属可以在凸起特征的中点的任一侧上的至少两个位置中形成预定化学计量的合金。 可以通过使用与较低熔点金属相邻的有机润湿层来改善合金的形成。 阐述了设计准则,以减少或消除熔融金属泄漏到与粘接线相邻的区域。

    MEMS DUAL SUBSTRATE SWITCH WITH MAGNETIC ACTUATION

    公开(公告)号:US20210202196A1

    公开(公告)日:2021-07-01

    申请号:US17200954

    申请日:2021-03-15

    Abstract: Systems and methods for forming a magnetostatic MEMS switch include forming a movable beam on a first substrate, forming the electrical contacts on a second substrate, and coupling the two substrates using a hermetic seal. A shunt bar on the movable plate may close the switch when lowered onto the contacts. The switch may generally be closed, with the shunt bar resting on the contacts. However, a magnetically permeable material may also be inlaid into the movable plate. The switch may then be opened by placing either a permanent magnet or an electromagnet in proximity to the switch.

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