Abstract:
A maskless micro-ion-beam reduction lithography system is a system for projecting patterns onto a resist layer on a wafer with feature size down to below 100 nm. The MMRL system operates without a stencil mask. The patterns are generated by switching beamlets on and off from a two electrode blanking system or pattern generator. The pattern generator controllably extracts the beamlet pattern from an ion source and is followed by a beam reduction and acceleration column.
Abstract:
An electron source includes a planar emission region for generating an electron emission, and a focusing structure for focusing the electron emission into an electron beam.
Abstract:
An electrode (12 or 30) of an electron-emitting device has a plurality of openings (16 or 60) spaced laterally apart from one another. The openings can be used, as needed, in selectively separating one or more parts of the electrode from the remainder of the electrode during corrective test directed towards repairing any short-circuit defects that may exist between the electrode and other overlying or underlying electrodes. When the electrode with the openings is an emitter electrode (12), each opening (16) normally extends fully across an overlying control electrode (30). When the electrode with the openings is a control electrode (30), each opening (60) normally extends fully across an underlying emitter electrode (12). The short-circuit repair procedure typically entails directing light energy on appropriate portions of the electrode with the openings.
Abstract:
There is provided a cold cathode including a substrate, a plurality of electron emitting electrodes formed on the substrate, a first insulating layer formed on the substrate and formed with a plurality of first cavities in which the electron emitting electrodes are disposed, a gate electrode formed on the first insulating layer and formed with a plurality of first openings which are in communication with the first cavities, a second insulating layer formed on the gate electrode and formed with a plurality of second cavities which are in communication with the first openings, and a focusing electrode formed on the second insulating layer and formed with a plurality of second openings which are in communication with the second cavities. At least one of central axes of the second openings and central axes of the first openings is eccentric with central axes of the electron emitting electrodes. Eccentricity between at least one of the central axes of the second openings and the central axes of the first openings, and the central axes of the electron emitting electrodes is oriented outwardly, and a degree of the eccentricity is set greater at a location more remote from a centrally located electron emitting electrode.
Abstract:
A focused ion beam (FIB) system produces a final beam spot size down to 0.1 .mu.m or less and an ion beam output current on the order of microamps. The FIB system increases ion source brightness by properly configuring the first (plasma) and second (extraction) electrodes. The first electrode is configured to have a high aperture diameter to electrode thickness aspect ratio. Additional accelerator and focusing electrodes are used to produce the final beam. As few as five electrodes can be used, providing a very compact FIB system with a length down to only 20 mm. Multibeamlet arrangements with a single ion source can be produced to increase throughput. The FIB system can be used for nanolithography and doping applications for fabrication of semiconductor devices with minimum feature sizes of 0.1 .mu.m or less.
Abstract:
A hermetic container which can improve its stress resistance and its buckling strength and prevent deformation due to the atmospheric pressure. The space between the anode substrate and the cathode substrate in the hermetic container can be stably maintained. Anode conductors and fluorescent substance layers are formed on the inner surface of the anode substrate. Electron sources are formed on the inner surface of the cathode substrate so as to confront the corresponding display portions on the anode substrate. In order to complete a container, the anode substrate is spaced from the cathode substrate a predetermined distance apart and the fringe portions of the substrates are sealed. A supporting member is disposed in the container. The supporting member 15 consists of a plate in which plural through holes are formed at predetermined intervals and reinforcing supports which are respectively inserted into the through holes of the plate and of which the middle portions are bonded at the inlets of the through holes. Each reinforcing support has one end in contact with an inner surface of the anode substrate and the other end in contact with an inner surface of the cathode substrate. Each reinforcing support maintains the gap between the anode substrate and the cathode substrate at a fixed distance.
Abstract:
There is provided a field-emission type cold cathode including (a) a substrate at least a surface of which has electrical conductivity, (b) an insulating layer formed on the substrate, (c) an electrically conductive gate electrode formed on the insulating layer, (d) an almost conical, sharp-pointed emitter electrode disposed in a hole formed through the gate electrode and insulating layer, (e) a focusing electrode formed on the insulating layer so that the focusing electrode is located in the same plane as the gate electrode and surrounds the gate electrode, and (f) a feeder line formed in the same plane as the gate electrode. The feeder line extends from the gate electrode into the focusing electrode and being shaped complementarily with the focusing electrode so that the focusing electrode is present at every radial directions as viewed from a center of the emitter electrode. The present invention provides an electron source which has small divergence and has high axis-symmetry, and which can be fabricated by conventional field-emission type cold cathode fabrication methods having no focusing electrodes. Hence, the present invention makes it possible to provide a high-quality cathode at lower cost suitable for an electron source for an electronic tube and an electron beam emitter.
Abstract:
The invention forms on a substrate an electron emission area composed of at least a single micro cold cathode which is composed of an emitter and a gate electrode, arranges plural focusing electrodes surrounding this electron emission area in the periphery of the electron emission area, and connects with each other the focusing electrodes facing each other around the electron emission area. An electron beam having a vertically long spot near the cathode is formed by making more intense the horizontal focusing when the electron beam is scanning the peripheral part of the screen on the basis of a horizontal and a vertical synchronizing signal. Thus the invention can correct distortion of the electron beam caused by deflection and can achieve and excellent resolution all over the display screen, and furthermore, can compose a cathode ray tube using this cold cathode as an electron source.
Abstract:
In a field emission electron gun including emitters (104) on predetermined parts of a substrate (409), an insulator film (105) on a remaining part of the substrate, a first gate electrode (101) on the insulator film so as to surround the emitters with a space left between each emitter and the first gate electrode, the emitters are formed on the substrate except a center part of the substrate. The first gate electrode has an inner peripheral surface which defines a hole (107) exposing a center portion of the insulator film that is positioned on the center part of the substrate. A second gate electrode (102) is formed on the insulator film to surround an outer peripheral surface of the first gate electrode with a distance left between the outer peripheral surface of the first gate electrode and the second gate electrode. A third gate electrode (106) may be formed on the center portion of the insulator film with another distance left between the inner peripheral surface of the first gate electrode and the third gate electrode.
Abstract:
A passive region is provided adjacent the mirror surface of a laser. A mesa is formed with an end face parallel to the mirror surface to be formed. The passive region is grown against the end face, and the mirror surface is formed therein by cleaving. The passive region is provided exclusively at the area of the active region. The passive region is provided at the area of the active region preferably in the following manner: two depressions are formed in the layer structure of the laser at the area of the mirror surface to be formed, reaching down to the active layer. Then a portion of the active layer situated between the depressions is selectively removed, whereupon the passive region is grown starting from the depressions in the tubular cavity thus formed.