摘要:
A sense amplifier includes at least two field effect transistors of identical conductivity type, each including a gate terminal, a source terminal, a drain terminal and a bulk terminal. The two field effect transistors are connected such that they are coupled back-to-back between a bit line and a reference line. The bit line is connected to a memory node via a selection transistor. The field effect transistors include bulk or substrate terminals formed in mutually insulated, different wells. The substrate bias voltages and thus the threshold voltages can be set independently via the body effect, so that the threshold voltages that are fundamentally different on account of stochastic effects in the different wells can be adapted to one another. Thus, compensating for the disadvantages that occur in conventional wells, on account of scattering effects during implantation or on account of mechanical stresses which act differently on transistors that are otherwise formed uniformly in the same well.
摘要:
A semiconductor memory is disclosed having an electrically conductive region buried in a substrate, and having an array of first and second cells. The first cells are designed as memory cells each having a selection transistor and a storage capacitor and are connected to word lines and first bit lines. The second cells are designed as switchable contacts each having a selection transistor and a resistance element and are connected to a respective one of the word lines and to a second bit line. The resistance element includes a first electrode and a second electrode, which are conductively connected to one another. The second bit line makes it possible to apply a plate voltage to the buried conductive region in low-impedance fashion via the second cells.
摘要:
An integrated semiconductor memory comprises a clock generator circuit (10), which is driven by an external clock signal (Cext) for the generation of an internal clock signal (Cint). The clock generator circuit (10) generates a level (PI1, PI2) of the internal clock signal if it is driven by the external clock signal with a level (PE1, PE2) for the duration of a sensitivity time (TE). The internal clock signal (Cint) has a higher frequency and phase stability than the external clock signal (Cext). The integrated semiconductor memory furthermore comprises a control circuit (20) for controlling the clock generator circuit (10), which is likewise driven by the external clock signal. The control circuit (20) alters the sensitivity time (TE) of the clock generator circuit (10) in a manner dependent on a frequency of the external clock signal. This prevents a noisy external clock signal (Cext) from leading to an uncontrolled switching behavior of an internal chip logic of the integrated semiconductor memory.
摘要:
A metallization surface (5), which acts as an etching stop layer during the production of openings (4) in a passivation layer (3) applied to its upper face and protects an interconnect structure (6) arranged underneath it, is arranged in an uppermost metallization level (1). A further opening is produced in the metal surface (5), through which a focused ion beam is aimed at the interconnect structure (6) in order to connect interconnects to one another and/or to interrupt at least one interconnect. The wiring of the integrated circuit can thus be varied individually, starting from identically produced semiconductor chips.
摘要:
A receiver circuit arrangement contains a receiver circuit (2) having an input (201) for receiving an input signal (IN), having an output (202) for outputting an output signal (OUT_F) and having an inverter circuit (21, 22, 23) having switching transistors (211, 212), to which the input signal is fed, at least one control transistor (221, 222) being connected in series with the switching transistors. A control circuit (3) is connected, on the input side, to a terminal for a reference voltage (VREF) and, on the output side, to the control terminal of the control transistor (221, 222) of the inverter circuit. The control circuit (3) is designed in such a way that the control transistor (221, 222) is driven by the regulating switching circuit in the event of deviations of the reference voltage (VREF) from a voltage value in a reference operating state with a control voltage (VCTL1, VCTL2) that deviates with respect to the reference operating state. The receiver circuit arrangement is comparatively insensitive to fluctuations of a reference voltage with respect to a nominal value of a reference operating state and enables high switching speeds.
摘要:
An apparatus (1) for testing a memory module (2) suitable for exchanging electrical signals with a motherboard (10) contains a device (8a-8k) suitable for detecting the operating state of at least one semiconductor chip (26a-26m) of the module, which device comprises a first set of signal lines (8a-8k), a microcontroller (3) with a memory device (32) for storing the operating state, said microcontroller being electrically connected to the signal lines (8a-8k), a clock generator (5) suitable for generating an operating clock, said clock generator being electrically connected to the microcontroller (3), and a signal connection (13) suitable for communicating a signal for controlling access to the memory module (2) between the circuit board arrangement (10) and the microcontroller (3) and for communicating to the microcontroller (3) a signal for initiating a process of detecting the operating state.
摘要:
The invention relates to a semiconductor memory, particularly a DRAM, in which the memory cells in each case have a trench capacitor arranged in a lower area of a trench hole and a vertical selection transistor which is formed adjoining an upper area of the trench hole and which connects an inner electrode of the trench capacitor to a bit line, a conductive channel being capable of being formed in dependence on the potential of a word line in the channel area, the channel area completely enclosing the trench hole in its upper area, and the associated word line at least partially enclosing the channel area.
摘要:
An integrated circuit includes a first circuit component, a second circuit component, and an external terminal for making contact with the circuit. The first circuit component is connected to the external terminal via the second component. A bridging circuit connects the first circuit component to the external terminal and can be activated by a test mode signal. In the active state, the bridging circuit connects the external terminal to the first circuit component while bridging the second circuit component, while it is nonconducting in the deactivated state. Circuit components integrated in the semiconductor chip can be electrically measured nondestructively via activatable switches. Circuit components that lie between the external terminal and the device to be measured can be excluded from the measurement by bridging circuits. The method also makes it possible to measure a plurality of integrated devices in parallel or serially.
摘要:
Method for fabricating a semiconductor memory device having auxiliary transistor structures which are required for lithography and etching processes. A protective structure for reducing leakage currents between gate conductor and doped zone is provided. The protective structure is formed as a region doped oppositely to the doped zone.
摘要:
A circuit for generating a refresh signal for a memory cell, includes a temperature-independent current source, a temperature-independent voltage source, and a temperature-dependent reference voltage source. A capacitor's first and second terminals are connected respectively to the temperature-independent current source, and the temperature-independent voltage source. The capacitor's first terminal is connected to a first input terminal of a comparator. The comparator's second input is connected to the temperature-dependent reference voltage source. The comparator is configured to output a refresh signal in response to a difference between voltages present at the first and second inputs thereof.