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公开(公告)号:US07269087B2
公开(公告)日:2007-09-11
申请号:US11151417
申请日:2005-06-14
IPC分类号: G11C8/00
CPC分类号: G11C29/808 , G11C7/18 , G11C11/4097 , G11C29/02 , G11C29/025 , G11C29/72 , G11C29/80 , G11C29/848
摘要: In a bit-line direction, a plurality of memory mats are arranged including a plurality of memory cells respectively coupled to bit lines and word lines, and a sense amplifier array is arranged including a plurality of latch circuits having input/output nodes connected to a half of bit-line pairs separately provided to the memory mats in a region between the memory mats placed in the bit-line direction, thereby making possible to replace with a redundant bit line pair and the corresponding redundant sense amplifier on a basis of each bit-line pair and sense amplifier connected thereto, thereby realizing effective and rational Y-system relief.
摘要翻译: 在位线方向上,多个存储器阵列被布置成包括分别耦合到位线和字线的多个存储器单元,并且读出放大器阵列被布置成包括多个锁存电路,其中输入/输出节点连接到 一半的位线对分别提供给放置在位线方向上的存储器垫之间的区域中的存储器堆,从而可以基于每个位替换冗余位线对和相应的冗余读出放大器 线对和读出放大器,从而实现有效和合理的Y系统释放。
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公开(公告)号:US20070183247A1
公开(公告)日:2007-08-09
申请号:US11727430
申请日:2007-03-27
申请人: Masashi Horiguchi , Masayuki Nakamura , Sadayuki Ohkuma , Kazuhiko Kajigaya , Yoshinobu Nakagome
发明人: Masashi Horiguchi , Masayuki Nakamura , Sadayuki Ohkuma , Kazuhiko Kajigaya , Yoshinobu Nakagome
CPC分类号: G11C5/063 , G11C5/14 , G11C5/147 , G11C7/1072 , G11C8/12 , G11C11/406 , G11C11/40615 , G11C11/40618 , G11C11/4074 , G11C11/4076 , G11C2207/2227 , G11C2211/4067 , G11C2211/4068
摘要: A synchronous DRAM is provided which includes arrangements for operations of power supply circuitry based upon whether the DRAM is in a power down mode or not. In one embodiment, a first power supply circuit and a second power supply circuit are provided which both receive externally supplied voltages and output internal supply voltages. The first power supply circuit is not in operation when a semiconductor device of the synchronous DRAM is in a power down mode. However, the second power supply circuit is continuously in operation during the power down mode. In another arrangement, the operation of a voltage limiter circuit is controlled based on whether or not the DRAM is in a power down mode.
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公开(公告)号:US20070147160A1
公开(公告)日:2007-06-28
申请号:US11467793
申请日:2006-08-28
IPC分类号: G11C8/00
CPC分类号: G11C7/1027 , G11C7/1012 , G11C7/1048 , G11C7/1051 , G11C7/1066 , G11C7/1069 , G11C7/1072 , G11C7/1078 , G11C7/1096 , G11C7/12 , G11C7/22 , G11C11/4076 , G11C11/4091 , G11C11/4093 , G11C11/4094 , G11C11/4096 , G11C29/028 , G11C2207/002
摘要: A column circuit that amplifies signals read from a sense amplifier array SAA to local input/output lines LIO in sub-amplifiers SAMP to transfer the amplified signals to main input/output lines MIO is provided. A current control circuit IC that can set one of two kinds of currents according to read enable signals RD1, RD2 is provided in each sub-amplifier SAMP. The read enable signals RD1, RD2 are generated at timings corresponding to the number of cycles in burst read operation under control of the timing controller. Current in the current control circuit IC is set to be large by the RD1 in burst read operation cycle just after activation of a memory bank, while current in the current control circuit IC is set to be small by the RD2 in the next and subsequent burst read cycles. Accordingly, expansion of an operation margin or reduction of power consumption can be realized in a semiconductor device including a semiconductor memory such as a DRAM.
摘要翻译: 提供了一种列电路,其将从读出放大器阵列SAA读取的信号放大到子放大器SAMP中的本地输入/输出线LIO,以将放大的信号传送到主输入/输出线MIO。 在每个子放大器SAMP中设置有能够根据读使能信号RD1,RD2设定两种电流之一的电流控制电路IC。 在定时控制器的控制下,在与脉冲串读取操作中的周期数相对应的定时,生成读使能信号RD 1,RD 2。 电流控制电路IC中的电流在刚刚激活存储体之后的脉冲串读取操作周期中的RD 1被设置为较大,而当前控制电路IC中的电流被下一个的RD 2设置得较小时, 随后的突发读取周期。 因此,可以在包括诸如DRAM的半导体存储器的半导体器件中实现操作余量的扩大或功率消耗的降低。
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公开(公告)号:US20070139995A1
公开(公告)日:2007-06-21
申请号:US11705420
申请日:2007-02-13
CPC分类号: G11C11/4094 , G11C7/12 , G11C7/18 , G11C11/4074 , G11C11/4097 , G11C2211/4013 , H01L27/0207 , H01L27/10882
摘要: A write command is inputted from an outside, voltages of bit lines become VDL and VSS, and a voltage in accordance with a threshold voltage (LVT: low threshold voltage, MVT: mid threshold voltage, HVT: high threshold voltage) of a memory cell transistor is written into a storage node of a capacitor via the memory cell transistor. Thereafter, when a plate line connected to a plate side of the capacitor is driven from voltage VPL to voltage VPH and the voltage of the storage node is increased due to coupling, the voltage VDL of the bit line is reduced to the voltage VDP, and the voltage excessively written into the storage node is reduced in accordance with a level of a threshold voltage of the memory cell transistor, thereby reducing a variation in the voltage of the storage node due to a variation in the threshold voltage.
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公开(公告)号:US07154788B2
公开(公告)日:2006-12-26
申请号:US10995198
申请日:2004-11-24
IPC分类号: G11C11/34
CPC分类号: G11C13/0069 , G11C7/1078 , G11C7/1087 , G11C7/1096 , G11C8/08 , G11C13/0004 , G11C13/0028 , G11C13/004 , G11C2213/79
摘要: There is achieved a high-integrated and high-speed nonvolatile memory which can stabilize an operation of a phase-change memory for a short operation cycle time. A latch is provided in a write driver. A change to a high-resistance state of a phase-change element is performed per column cycle by a write-enable signal, and a change to a low-resistance state thereof is performed after a pre-charge command is inputted and concurrently with deactivation of a pre-charge signal. Thereby, a write time to a memory cell in which phase-change resistance is changed to a low-resistance state, and a period from a write operation for changing the phase-change resistance to a high-resistance state to a read operation to the above memory cell can be lengthened without extending the column cycle time, so that the stable write operation is achieved.
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公开(公告)号:US20060193160A1
公开(公告)日:2006-08-31
申请号:US11354131
申请日:2006-02-15
IPC分类号: G11C15/00
CPC分类号: G11C15/04 , G11C15/043
摘要: Control clocks of different phases are distributed to a memory array divided into multiple banks, and processing of entries and search keys (read and write operations and search operation) is performed at different phases. The memory array divided into banks is further divided into smaller arrays, that is, sub-arrays, and a sense amplifier in a read-write-search circuit block is shared by the two sub-arrays. In this case, a so-called open bit line structure in which each one bit line is connected from both sub-arrays to a sense amplifier is adopted. The same look-up table is registered to multiple banks, successively inputted search keys are sequentially inputted to the multiple banks, and the search operation is carried out in synchronization with the control clocks of different phases.
摘要翻译: 将不同相位的控制时钟分配到划分为多个存储体的存储器阵列,并且在不同阶段执行条目和搜索关键字的处理(读取和写入操作和搜索操作)。 划分为存储体的存储器阵列进一步分成较小的阵列,即子阵列,并且读写搜索电路块中的读出放大器由两个子阵列共享。 在这种情况下,采用所谓的开放位线结构,其中每个位线都从两个子阵列连接到读出放大器。 相同的查找表被注册到多个存储体,连续输入的搜索键被顺序地输入到多个存储体,并且与不同相位的控制时钟同步地执行搜索操作。
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公开(公告)号:US20060108640A1
公开(公告)日:2006-05-25
申请号:US11281743
申请日:2005-11-18
申请人: Kazuhiko Kajigaya , Kanji Otsuka
发明人: Kazuhiko Kajigaya , Kanji Otsuka
IPC分类号: H01L29/94
CPC分类号: G11C7/1051 , G11C7/1057 , H01L27/092
摘要: A semiconductor integrated circuit comprising: a pair of MOS transistors which are formed in a same well on a semiconductor substrate and arranged adjacent to each other with a distance such that charge exchange between capacitances of respective drain diffusion layers is possible; and a wiring structure which is formed to apply differential signals to respective gates of the pair of MOS transistors and to apply a common potential to respective sources of the pair of MOS transistors.
摘要翻译: 一种半导体集成电路,包括:一对MOS晶体管,其形成在半导体衬底上的相同阱中并且彼此相邻布置,使得可以使各个漏极扩散层的电容之间的电荷交换成为可能; 以及布线结构,其被形成为将差分信号施加到所述一对MOS晶体管的各个栅极,并向所述一对MOS晶体管的各个源施加公共电位。
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公开(公告)号:US06992343B2
公开(公告)日:2006-01-31
申请号:US10975494
申请日:2004-10-29
申请人: Shinichi Miyatake , Kazuhiko Kajigaya , Kazuyuki Miyazawa , Tomonori Sekiguchi , Riichiro Takemura , Takeshi Sakata
发明人: Shinichi Miyatake , Kazuhiko Kajigaya , Kazuyuki Miyazawa , Tomonori Sekiguchi , Riichiro Takemura , Takeshi Sakata
IPC分类号: H01L27/108 , H01L29/76 , H01L29/94 , H01L31/119
CPC分类号: H01L27/108 , G11C7/18 , G11C11/403 , G11C11/406 , G11C11/40615 , G11C11/4097 , G11C2211/4013 , H01L27/0207 , H01L27/10814 , H01L27/10885 , H01L27/10897 , Y10S257/905 , Y10S257/906
摘要: A semiconductor memory device is provided which can achieve the high integration, ultra-high speed operation, and significant reduction of power consumption during the information holding time, by reducing the increase in the area of a memory cell and obtaining a period of the ultra-high speed readout time and ensuring a long refresh period at the time of the self refresh. A DRAM employing a one-intersection cell·two cells/bit method has a twin cell structure employing a one-intersection 6F2 cell, the structure in which: memory cells are arranged at positions corresponding to all of the intersections between a bit-line pair and a word line; and when a half pitch of the word line is defined as F, a pitch of each bit line of the bit-line pair is larger than 2F and smaller than 4F. Further, an active region in the silicon substrate, on which a source, channel and drain of the transistor of each memory cell are formed, is obliquely formed relative to the direction of the bit-line pair.
摘要翻译: 提供一种半导体存储器件,其可以通过减少存储器单元的面积的增加并获得超宽带的周期来实现信息保持时间期间的高集成度,超高速度运行和功耗的显着降低, 高速读出时间,确保自刷新时间长的刷新周期。 采用单交点单元两个单元/比特方法的DRAM具有采用单交叉6F SUP>单元的双单元结构,其结构是:将存储单元布置在与 位线对和字线之间的交点; 并且当字线的半间距被定义为F时,位线对的每个位线的间距大于2F且小于4F。 此外,在硅衬底中形成每个存储单元的晶体管的源极,沟道和漏极的有源区相对于位线对的方向倾斜地形成。
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公开(公告)号:US20050232038A1
公开(公告)日:2005-10-20
申请号:US11151417
申请日:2005-06-14
IPC分类号: G11C11/401 , G11C7/00 , G11C29/00 , G11C29/02 , G11C29/04
CPC分类号: G11C29/808 , G11C7/18 , G11C11/4097 , G11C29/02 , G11C29/025 , G11C29/72 , G11C29/80 , G11C29/848
摘要: In a bit-line direction, a plurality of memory mats are arranged including a plurality of memory cells respectively coupled to bit lines and word lines, and a sense amplifier array is arranged including a plurality of latch circuits having input/output nodes connected to a half of bit-line pairs separately provided to the memory mats in a region between the memory mats placed in the bit-line direction, thereby making possible to replace with a redundant bit line pair and the corresponding redundant sense amplifier on a basis of each bit-line pair and sense amplifier connected thereto, thereby realizing effective and rational Y-system relief.
摘要翻译: 在位线方向上,多个存储器阵列被布置成包括分别耦合到位线和字线的多个存储器单元,并且读出放大器阵列被布置成包括多个锁存电路,其中输入/输出节点连接到 一半的位线对分别提供给放置在位线方向上的存储器垫之间的区域中的存储器堆,从而可以基于每个位替换冗余位线对和相应的冗余读出放大器 线对和读出放大器,从而实现有效和合理的Y系统释放。
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公开(公告)号:US20050231991A1
公开(公告)日:2005-10-20
申请号:US11084138
申请日:2005-03-21
申请人: Masashi Horiguchi , Masayuki Nakamura , Sadayuki Ohkuma , Kazuhiko Kajigaya , Yoshinobu Nakagome
发明人: Masashi Horiguchi , Masayuki Nakamura , Sadayuki Ohkuma , Kazuhiko Kajigaya , Yoshinobu Nakagome
IPC分类号: G11C11/413 , G11C5/06 , G11C5/14 , G11C7/10 , G11C8/00 , G11C8/12 , G11C11/401 , G11C11/406 , G11C11/407 , G11C11/4074 , G11C11/4076 , G11C11/409 , H01L21/8242 , H01L27/108
CPC分类号: G11C5/063 , G11C5/14 , G11C5/147 , G11C7/1072 , G11C8/12 , G11C11/406 , G11C11/40615 , G11C11/40618 , G11C11/4074 , G11C11/4076 , G11C2207/2227 , G11C2211/4067 , G11C2211/4068
摘要: A synchronous DRAM is provided which includes arrangements for operations of power supply circuitry based upon whether the DRAM is in a power down mode or not. In one embodiment, a first power supply circuit and a second power supply circuit are provided which both receive externally supplied voltages and output internal supply voltages. The first power supply circuit is not in operation when a semiconductor device of the synchronous DRAM is in a power down mode. However, the second power supply circuit is continuously in operation during the power down mode. In another arrangement, the operation of a voltage limiter circuit is controlled based on whether or not the DRAM is in a power down mode.
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