Mapping between program states and data patterns

    公开(公告)号:US09318205B2

    公开(公告)日:2016-04-19

    申请号:US14626208

    申请日:2015-02-19

    摘要: The present disclosure includes methods and apparatuses for mapping between program states and data patterns. One method includes: programming a group of G memory cells such that a combination of respective program states of the group maps to a constellation point corresponding to a received N unit data pattern, the group used to store N/G units of data per memory cell; wherein the constellation point is one of a number of constellation points of a constellation associated with mapping respective program state combinations of the group of memory cells to N unit data patterns; and wherein the constellation comprises a first mapping shell and a second mapping shell, the constellation points corresponding to the respective first and second mapping shells determined, at least partially, based on a polynomial expression of order equal to G.

    METHODS, DEVICES, AND SYSTEMS FOR DEALING WITH THRESHOLD VOLTAGE CHANGE IN MEMORY DEVICES
    84.
    发明申请
    METHODS, DEVICES, AND SYSTEMS FOR DEALING WITH THRESHOLD VOLTAGE CHANGE IN MEMORY DEVICES 有权
    用于处理存储器件中阈值电压变化的方法,器件和系统

    公开(公告)号:US20140098614A1

    公开(公告)日:2014-04-10

    申请号:US14056713

    申请日:2013-10-17

    IPC分类号: G11C16/34 G11C16/26

    摘要: The present disclosure includes methods, devices, and systems for dealing with threshold voltage change in memory devices. A number of embodiments include an array of memory cells and control circuitry having sense circuitry coupled to the array. The control circuitry is configured to determine changes in threshold voltages (Vts) associated with the memory cells without using a reference cell, and adjust the sense circuitry based on the determined changes and without using a reference cell.

    摘要翻译: 本公开包括用于处理存储器件中的阈值电压变化的方法,装置和系统。 多个实施例包括具有耦合到阵列的感测电路的存储器单元阵列和控制电路。 控制电路被配置为确定与存储器单元相关联的阈值电压(Vts)的变化而不使用参考单元,并且基于所确定的变化并且不使用参考单元来调整感测电路。

    Methods, devices, and systems for dealing with threshold voltage change in memory devices
    85.
    发明授权
    Methods, devices, and systems for dealing with threshold voltage change in memory devices 有权
    用于处理存储器件中阈值电压变化的方法,器件和系统

    公开(公告)号:US08576632B2

    公开(公告)日:2013-11-05

    申请号:US13667414

    申请日:2012-11-02

    IPC分类号: G11C16/06

    摘要: The present disclosure includes methods, devices, and systems for dealing with threshold voltage change in memory devices. A number of embodiments include an array of memory cells and control circuitry having sense circuitry coupled to the array. The control circuitry is configured to determine changes in threshold voltages (Vts) associated with the memory cells without using a reference cell, and adjust the sense circuitry based on the determined changes and without using a reference cell.

    摘要翻译: 本公开包括用于处理存储器件中的阈值电压变化的方法,装置和系统。 多个实施例包括具有耦合到阵列的感测电路的存储器单元阵列和控制电路。 控制电路被配置为确定与存储器单元相关联的阈值电压(Vts)的变化而不使用参考单元,并且基于所确定的变化并且不使用参考单元来调整感测电路。

    METHODS, DEVICES, AND SYSTEMS FOR DEALING WITH THRESHOLD VOLTAGE CHANGE IN MEMORY DEVICES
    86.
    发明申请
    METHODS, DEVICES, AND SYSTEMS FOR DEALING WITH THRESHOLD VOLTAGE CHANGE IN MEMORY DEVICES 有权
    用于处理存储器件中阈值电压变化的方法,器件和系统

    公开(公告)号:US20130058168A1

    公开(公告)日:2013-03-07

    申请号:US13667414

    申请日:2012-11-02

    IPC分类号: G11C16/06

    摘要: The present disclosure includes methods, devices, and systems for dealing with threshold voltage change in memory devices. A number of embodiments include an array of memory cells and control circuitry having sense circuitry coupled to the array. The control circuitry is configured to determine changes in threshold voltages (Vts) associated with the memory cells without using a reference cell, and adjust the sense circuitry based on the determined changes and without using a reference cell.

    摘要翻译: 本公开包括用于处理存储器件中的阈值电压变化的方法,装置和系统。 多个实施例包括具有耦合到阵列的感测电路的存储器单元阵列和控制电路。 控制电路被配置为确定与存储器单元相关联的阈值电压(Vts)的变化而不使用参考单元,并且基于所确定的变化并且不使用参考单元来调整感测电路。

    Preread and read threshold voltage optimization

    公开(公告)号:US11763896B2

    公开(公告)日:2023-09-19

    申请号:US17951593

    申请日:2022-09-23

    摘要: A request to read data at the memory device is received. A first read operation is performed to read the data at the memory device using a first read threshold voltage. The data read at the memory device using the first read threshold voltage is determined to be associated with a first unsuccessful correction of an error. Responsive to determining that the data read at the memory device using the first read threshold voltage is associated with the first unsuccessful correction of the error, a second read threshold voltage is stored at a register to replace a preread threshold voltage previously stored at the register that is associated with the memory device. The first preread threshold voltage was previously used to perform a preread operation at the memory device. A second read operation to read the data at the memory device is performed using the second read threshold voltage.

    Power-on read demarcation voltage optimization

    公开(公告)号:US11756597B2

    公开(公告)日:2023-09-12

    申请号:US17393112

    申请日:2021-08-03

    摘要: A system includes a memory device having memory cells and a processing device operatively coupled to the memory device. The processing device is to perform operations including: determining a length of time the memory device has been powered off; and in response to determining that the length of time satisfies a threshold value: for each of multiple groups of memory cells, asserting a corresponding flag; determining, based on the length of time, one or more adjusted demarcation voltages to be used in reading a state of the multiple groups of memory cells; and storing the one or more adjusted demarcation voltages for use in performing memory operations.

    Codeword error leveling for 3DXP memory devices

    公开(公告)号:US11720273B2

    公开(公告)日:2023-08-08

    申请号:US17323089

    申请日:2021-05-18

    IPC分类号: G06F12/00 G06F3/06 G06F11/07

    摘要: Disclosed is a system that comprises a memory device and a processing device, operatively coupled with the memory device, to perform operations that include, identifying, by the processing device, a plurality of partitions located on a die of the memory device. The operations performed by the processing device further include selecting, based on evaluating a predefined criterion reflecting a physical layout of the die of the memory device, a first partition and a second partition of the plurality of partitions. The operations performed by the processing device further include generating a codeword comprising first data residing on the first partition and second data residing on the second partition.