Simultaneous testing of semiconductor components on a wafer
    4.
    发明授权
    Simultaneous testing of semiconductor components on a wafer 有权
    同时测试晶圆上的半导体元件

    公开(公告)号:US09002673B2

    公开(公告)日:2015-04-07

    申请号:US13025657

    申请日:2011-02-11

    摘要: Methods and apparatus are disclosed to simultaneously, wirelessly test semiconductor components formed on a semiconductor wafer. The semiconductor components transmit respective outcomes of a self-contained testing operation to wireless automatic test equipment via a common communication channel. Multiple receiving antennas observe the outcomes from multiple directions in three dimensional space. The wireless automatic test equipment determines whether one or more of the semiconductor components operate as expected and, optionally, may use properties of the three dimensional space to determine a location of one or more of the semiconductor components. The wireless testing equipment may additionally determine performance of the semiconductor components by detecting infrared energy emitted, transmitted, and/or reflected by the semiconductor wafer before, during, and/or after a self-contained testing operation.

    摘要翻译: 公开了同时无线地测试形成在半导体晶片上的半导体元件的方法和装置。 半导体部件通过公共通信信道将各自的测试结果传送到无线自动测试设备。 多个接收天线在三维空间中观察多个方向的结果。 无线自动测试设备确定一个或多个半导体组件是否按预期运行,并且可选地,可以使用三维空间的属性来确定一个或多个半导体组件的位置。 无线测试设备还可以通过检测在独立测试操作之前,期间和/或之后由半导体晶片发射,传输和/或反射的红外能量来确定半导体组件的性能。

    Simultaneously tagging of semiconductor components on a wafer
    7.
    发明授权
    Simultaneously tagging of semiconductor components on a wafer 有权
    同时在晶片上标记半导体元件

    公开(公告)号:US08866502B2

    公开(公告)日:2014-10-21

    申请号:US13029653

    申请日:2011-02-17

    摘要: Methods and apparatus are disclosed to simultaneously, wirelessly test semiconductor components formed on a semiconductor wafer. The semiconductor components transmit respective outcomes of a self-contained testing operation to wireless automatic test equipment via a common communication channel. Multiple receiving antennas observe the outcomes from multiple directions in three dimensional space. The wireless automatic test equipment determines whether one or more of the semiconductor components operate as expected and, optionally, may use properties of the three dimensional space to determine a location of one or more of the semiconductor components. The wireless testing equipment may additionally determine performance of the semiconductor components by detecting infrared energy emitted, transmitted, and/or reflected by the semiconductor wafer before, during, and/or after a self-contained testing operation.

    摘要翻译: 公开了同时无线地测试形成在半导体晶片上的半导体元件的方法和装置。 半导体部件通过公共通信信道将各自的测试结果传送到无线自动测试设备。 多个接收天线在三维空间中观察多个方向的结果。 无线自动测试设备确定一个或多个半导体组件是否按预期运行,并且可选地,可以使用三维空间的属性来确定一个或多个半导体组件的位置。 无线测试设备还可以通过检测在独立测试操作之前,期间和/或之后由半导体晶片发射,传输和/或反射的红外能量来确定半导体组件的性能。

    Radio frequency transceiver integrated circuit floor plan applicable to MIMO
    10.
    发明授权
    Radio frequency transceiver integrated circuit floor plan applicable to MIMO 有权
    射频收发器集成电路平面图适用于MIMO

    公开(公告)号:US08472889B2

    公开(公告)日:2013-06-25

    申请号:US11168831

    申请日:2005-06-28

    申请人: Arya Reza Behzad

    发明人: Arya Reza Behzad

    IPC分类号: H04B1/40

    CPC分类号: H04B1/406

    摘要: A Radio Frequency (RF) transceiver Integrated Circuit (IC) includes a first RF transceiver group, a first baseband section, a second RF transceiver group, a second baseband section, local oscillation circuitry, and local oscillation distribution circuitry. The first baseband section communicatively couples to the first RF transceiver group. The second RF transceiver group resides in substantial symmetry with the first RF transceiver group about a center line of symmetry of the RF transceiver IC. The second baseband section communicatively coupled to the second RF transceiver group. The local oscillation distribution circuitry operably couples to the local oscillation generation circuitry, to the first RF transceiver group, and to the second RF transceiver group. The second baseband section may reside in substantial symmetry with the first baseband section about the center line of symmetry of the RF transceiver IC.

    摘要翻译: 射频(RF)收发器集成电路(IC)包括第一RF收发器组,第一基带部分,第二RF收发器组,第二基带部分,本地振荡电路和本地振荡分配电路。 第一基带部分通信地耦合到第一RF收发机组。 第二RF收发器组与第一RF收发器组关于RF收发器IC的中心对称线基本对称。 通信地耦合到第二RF收发机组的第二基带部分。 本地振荡分配电路可操作地耦合到本地振荡发生电路,第一RF收发器组和第二RF收发器组。 第二基带部分可以围绕RF收发器IC的对称中心线与第一基带部分基本对称。