摘要:
An electronic device comprising a generator for generating a stream of charge carriers. The generator comprises a bipolar transistor having an emitter region, a collector region and a base region oriented between the emitter region and the collector region, and a controller for controlling exposure of the bipolar transistor to a voltage in excess of its open base breakdown voltage (BVCEO) such that the emitter region generates the stream of charge carriers from a first area being smaller than the emitter region surface area. The electronic device may further comprise a material arranged to receive the stream of charge carriers for triggering a change in a property of said material, the emitter region being arranged between the base region and the material.
摘要:
A semiconductor device includes a semiconductor region having a pn junction and a field shaping region located adjacent the pn junction to increase the reverse breakdown voltage of the device. The field shaping region is coupled via capacitive voltage coupling regions to substantially the same voltages as are applied to the pn junction. When a reverse voltage is applied across the pn junction and the device is non-conducting, a capacitive electric field is present in a part of the field shaping region which extends beyond a limit of the pn junction depletion region which would exist in the absence of the field shaping region. The electric field in the field shaping region inducing a stretched electric field limited to a correspondingly stretched pn junction depletion region in the semiconductor region.
摘要:
A BiCMOS-compatible JFET device comprising source and drain regions (17, 18) which are formed in the same process as that used to form the emitter out-diffusion or a vertical bipolar device, wherein the semiconductor layer which forms the emitter cap in the bipolar device forms the channel (16) of the JFET device and the layer of material (i.e. the base epi-stack) which forms the intrinsic base region of the bipolar device forms the intrinsic gate region (14) of the JFET device. As a result, the integration of the JFET device into a standard BiCMOS process can be achieved without the need for any additional masking or other processing steps.
摘要:
A thermally programmable memory has a programmable element (20) of a thermally programmable resistance preferably of phase change material, material and a blown antifuse (80) located adjacent to the programmable material. Such a blown antifuse has a dielectric layer (100) surrounded by conductive layers (90, 110) to enable a brief high voltage to be applied across the dielectric to blow a small hole in the dielectric during manufacture to form a small conductive path which can be used as a tiny electrical heater for programming the material. Due to the current confinement by the hole, the volume of the material that must be heated in order to switch to a highly-resistive state is very small. As a result the programming power can be low.
摘要:
A field effect transistor semiconductor device (1) comprises a source region (33), a drain region (14) and a drain drift region (11), the device having a field shaping region (20) adjacent the drift region (11) and arranged such that, in use, when a voltage is applied between the source (33) and drain (14) regions and the device is non-conducting, a substantially constant electric field is generated in the field shaping region (20) and accordingly in the adjacent drift region (11). The field shaping region (20), which may be intrinsic semiconductor, is arranged to function as a capacitor dielectric region (20) between a first capacitor electrode region (21) and a second capacitor electrode region (22), the first and second capacitor electrode regions (21, 22) being adjacent respective ends of the dielectric region (20) and having different electron energy barriers. The first and second capacitor electrode regions (21, 22) may be opposite conductivity semiconductor regions, or they may be a semiconductor region (21) and a Schottky barrier region (224, FIG. 4). The device may be an insulated gate device (1, 13, 15, 17, 171, 172, 19, 12) particularly suitable for high or low voltage DC power applications, or a Schottky gate device (181, 182, 183) particularly suitable for RF applications.
摘要:
In a series-parallel-series memory circuit (3) which requires a write clock signal (at 19), a transfer clock signal (at 25) and a read clock signal (at 31), it is sufficient, because a clock signal processing circuit (23) is provided, to apply only two clock signals (to 33 and 35). Using a gate circuit (41), it is possible to obtain from one clock signal (applied to 35) additional information, which is provided by means of pulse duration variation, for adapting the time delay of the memory circuit (FIG. 1).
摘要:
A semiconductor device, for example a diode (200), having a pn junction (101) has an insulating material field shaping region (201) adjacent, and possibly bridging, the pn junction. The field shaping region (201) preferably has a high dielectric constant and is coupled via capacitive voltage coupling regions (204,205) to substantially the same voltages as are applied to the pn junction. When a reverse voltage is applied across the pn junction (101) and the device is non-conducting, a capacitive electric field, is present in a part of the field shaping region which extends beyond a limit of the pn junction depletion region which would exist in the absence of the field shaping region (201), the electric field in the field shaping region inducing a stretched electric field limited to a correspondingly stretched pn junction depletion region (208,209) and an increased reverse breakdown voltage of the device.
摘要:
The invention relates to a trench bipolar transistor structure, having a base 7, emitter 9 and collector 4, the latter being divided into a higher doped region 3 and a lower doped drift region 5. An insulated gate 11 is provided to deplete the drift region 5 when the transistor is switched off. The gate 11 and/or doping levels in the drift region 5 are arranged to provide a substantially uniform electric field in the drift region in this state, to minimise breakdown. In particular, the gate 11 may be seminsulating and a voltage applied along the gate between connections 21,23.
摘要:
A semiconductor device includes a programmable element having a doped semiconductor region (4) and a conductor region (6) which are separated from one another by at least a portion of an insulating layer (5). The conductor region (6) is of a material suitable for forming a rectifying junction (8) with the material of the semiconductor region (4). To achieve a comparatively high conductivity connection to the semiconductor region (4), the element is further provided with a contact region (3) which has a comparatively low electrical resistance compared with the semiconductor region (4). The contact region (3) is provided at a side of the semiconductor region (4) remote from the insulating layer (5) and is separated from the insulating layer (5) by the semiconductor region (4). Both the semiconductor region (4) and the contact region (5) are laterally bounded by an isolating region (7) at opposing sides. The invention thus offers a device provided with a programmable element of a substantially more compact structure than a comparable conventional programmable element.
摘要:
A first charge storage electrode (21) has a first row (21b) of teeth interdigitated with a second row (22b) of teeth of a second charge storage electrode (22). The second storage electrode (22) has a third row (22c) of teeth interdigitated with a fourth row (23b) of teeth of a third charge storage electrode (23). The first and third rows (21b and 22c) overlie one group (11b) of a series of parallel conduction channels while the second and fourth rows (22b and 23b) overlie another group (11a) of the parallel channels. A first charge transfer electrode (24) is provided to transfer charge packets into sites beneath the first storage electrode. Second, third, fourth and fifth charge transfer electrodes (25, 26, 27 and 28) are provided to transfer charge packets between sites beneath, respectively, the first storage electrode (21) and the second row (22b), the first row (21b) and the second storage electrode (22), the second storage electrode (22) and the fourth row (23b), and the third row (22c) and the third storage electrode (23). The first, second and third storage and associated transfer electrodes may form an output stage (20) of a parallel register (C) of a series-parallel-series device to enable de-interlacing of rows of information.