公开(公告)号：US20120242363A1

公开(公告)日：2012-09-27

申请号：US13288925

申请日：2011-11-03

申请人： Keith J. Breinlinger ,  Benjamin N. Eldridge ,  Eric D. Hobbs ,  Michael J. Armstrong ,  John K. Gritters

发明人： Keith J. Breinlinger ,  Benjamin N. Eldridge ,  Eric D. Hobbs ,  Michael J. Armstrong ,  John K. Gritters

IPC分类号： G01R1/067 ,  H01R43/16 ,  H01R24/66 ,  G01R31/26 ,  H01R24/00 ,  H01R13/02

CPC分类号： G01R1/06716 ,  G01R1/06733 ,  G01R1/07357 ,  H01R13/2407 ,  H01R43/16 ,  Y10T29/49204

摘要： An electrically conductive contact element can include a first base and a second base with elongate, spaced apart leaves between the bases. A first end of each leaf can be coupled to the first base and an opposite second end of the leaf can be coupled to the second base. A body of the leaf between the first end and the second end can be sufficiently elongate to respond to a force through said contact element substantially parallel with the first axis and the second axis by first compressing axially while said force is less than a buckling force and then bending while said force is greater than the buckling force.

摘要翻译： 导电接触元件可以包括第一基部和在基部之间具有细长间隔开的叶片的第二基部。 每个叶片的第一端可以联接到第一基部，并且叶片的相对的第二端可以联接到第二基部。 在第一端和第二端之间的叶片的主体可以是足够伸长的，以响应于通过所述接触元件的力，所述力通过在所述力小于屈曲力的同时第一轴向压缩而基本上平行于第一轴线和第二轴线，并且 然后在所述力大于屈曲力时弯曲。

公开(公告)号：US08203352B2

公开(公告)日：2012-06-19

申请号：US12861984

申请日：2010-08-24

申请人： Li Fan ,  John K. Gritters

发明人： Li Fan ,  John K. Gritters

IPC分类号： G01R31/00 ,  G01R1/067

CPC分类号： G01R1/07342 ,  G01R1/06727 ,  G01R1/07378 ,  G01R31/31905

摘要： A probe group can include multiple probes for testing devices having contact pads. The probes can comprise beams, contact tip structures, and mounting portions. The beams can provide for controlled deflection of the probes. The contact tip structures can be connected to the beams and can include contact portions for contacting with the devices. The mounting portions of the beams can be attached to support structures, which can be arranged in a staggered pattern. The beams located in a first row of the staggered pattern can include narrowing regions that lie substantially in line with the mounting portions of a second row of the beams.

摘要翻译： 探针组可以包括用于测试具有接触垫的设备的多个探针。 探针可以包括梁，接触尖端结构和安装部分。 梁可以提供探头的可控偏转。 接触尖端结构可以连接到梁，并且可以包括用于与装置接触的接触部分。 梁的安装部分可以附接到可以以交错图案布置的支撑结构。 位于交错图案的第一行中的光束可以包括基本上与第二排光束的安装部分成一直线的变窄区域。

公开(公告)号：US20080143359A1

公开(公告)日：2008-06-19

申请号：US11611874

申请日：2006-12-17

申请人： John K. Gritters

发明人： John K. Gritters

IPC分类号： G01R31/02 ,  H01R4/48

CPC分类号： H01R13/2407 ,  H01R4/4809 ,  Y10T29/49222

摘要： Embodiments of reinforced resilient elements and methods for fabricating same are provided herein. In one embodiment, a reinforced resilient element includes a resilient element configured to electrically probe a device to be tested, the resilient element having a first end and an opposing second end; and a reinforcement member having a first end affixed to the resilient element at the first end thereof or at a point disposed between the first and the second ends of the resilient element, an opposing second end disposed in a direction towards the second end of the resilient member, and a resilient portion disposed between the first and second ends, wherein the resilient portion is not affixed to the resilient member.

摘要翻译： 增强弹性元件的实施例及其制造方法。 在一个实施例中，增强的弹性元件包括被配置为电探测要测试的装置的弹性元件，所述弹性元件具有第一端和相对的第二端; 以及加强构件，其具有在其第一端处或设置在弹性元件的第一和第二端之间的点处固定到弹性元件的第一端，相对的第二端沿朝向弹性元件的第二端的方向设置 以及设置在所述第一和第二端之间的弹性部分，其中所述弹性部分未固定到所述弹性部件。

公开(公告)号：US07384277B1

公开(公告)日：2008-06-10

申请号：US11611874

申请日：2006-12-17

申请人： John K. Gritters

发明人： John K. Gritters

IPC分类号： H01R4/48

CPC分类号： H01R13/2407 ,  H01R4/4809 ,  Y10T29/49222

摘要： Embodiments of reinforced resilient elements and methods for fabricating same are provided herein. In one embodiment, a reinforced resilient element includes a resilient element configured to electrically probe a device to be tested, the resilient element having a first end and an opposing second end; and a reinforcement member having a first end affixed to the resilient element at the first end thereof or at a point disposed between the first and the second ends of the resilient element, an opposing second end disposed in a direction towards the second end of the resilient member, and a resilient portion disposed between the first and second ends, wherein the resilient portion is not affixed to the resilient member.

摘要翻译： 增强弹性元件的实施例及其制造方法。 在一个实施例中，增强的弹性元件包括被配置为电探测要测试的装置的弹性元件，所述弹性元件具有第一端和相对的第二端; 以及加强构件，其具有在其第一端处或设置在弹性元件的第一和第二端之间的点处固定到弹性元件的第一端，相对的第二端沿朝向弹性元件的第二端的方向设置 以及设置在所述第一和第二端之间的弹性部分，其中所述弹性部分未固定到所述弹性部件。

公开(公告)号：US08138859B2

公开(公告)日：2012-03-20

申请号：US12106364

申请日：2008-04-21

申请人： John K. Gritters ,  Eric D. Hobbs ,  Sangtae Park ,  Jun Jason Yao

发明人： John K. Gritters ,  Eric D. Hobbs ,  Sangtae Park ,  Jun Jason Yao

IPC分类号： H01H51/22 ,  H01H57/00

CPC分类号： H01H1/60 ,  H01H1/0036 ,  H01H59/0009 ,  H01H2001/0047 ,  H01H2001/0052 ,  H01H2001/0078

摘要： Embodiments of the present invention provide microelectromechanical systems (MEMS) switching methods and apparatus having improved performance and lifetime as compared to conventional MEMS switches. In some embodiments, a MEMS switch may include a resilient contact element comprising a beam and a tip configured to wipe a contact surface; and a MEMS actuator having an open position that maintains the tip and the contact surface in a spaced apart relation and a closed position that brings the tip into contact with the contact surface, wherein the resilient contact element and the MEMS actuator are disposed on a substrate and are movable in a plane substantially parallel to the substrate. In some embodiments, various contact elements are provided for the MEMS switch. In some embodiments, various actuators are provided for control of the operation of the MEMS switch.

摘要翻译： 与常规MEMS开关相比，本发明的实施例提供了具有改进的性能和寿命的微机电系统（MEMS）开关方法和装置。 在一些实施例中，MEMS开关可以包括弹性接触元件，其包括梁和构造成擦拭接触表面的尖端; 以及MEMS致动器，其具有将尖端和接触表面保持间隔开的关闭位置和使尖端与接触表面接触的闭合位置，其中弹性接触元件和MEMS致动器设置在基板上 并且可以在基本上平行于基板的平面中移动。 在一些实施例中，为MEMS开关提供各种接触元件。 在一些实施例中，提供各种致动器用于控制MEMS开关的操作。

公开(公告)号：US20100154861A1

公开(公告)日：2010-06-24

申请号：US12343135

申请日：2008-12-23

申请人： John K. Gritters

发明人： John K. Gritters

IPC分类号： H01L31/052 ,  H01L31/042 ,  H01L31/18

CPC分类号： H01L31/0392 ,  H01L31/0352 ,  H01L31/035281 ,  H01L31/0543 ,  H01L31/0547 ,  Y02B10/12 ,  Y02E10/52

摘要： A solar panel can include a substrate with layers of droplets of different materials disposed on a surface of the substrate. An outer layer can be disposed away from the surface and can comprise a face of the solar panel. The layers can comprise a cathode electrode and an anode electrode disposed between the outer layer and the surface of the substrate. The layers can further comprise a P region and an N region. The P region can be disposed at least partially around the anode electrode. The N region can be disposed at least partially around the P region and at least partially around the cathode electrode. The P region and the N region can comprise droplets of a P material comprising P-doped semiconductor particles and an N material comprising N-doped semiconductor particles respectively.

摘要翻译： 太阳能电池板可以包括具有设置在基板的表面上的具有不同材料的液滴层的基板。 外层可以远离表面设置并且可以包括太阳能面板的面。 这些层可以包括阴极电极和设置在衬底的外层和表面之间的阳极电极。 这些层可进一步包括P区和N区。 P区可以至少部分地布置在阳极电极周围。 N区域可以至少部分地围绕P区域设置，并且至少部分地围绕阴极电极设置。 P区域和N区域可以包括分别包含P掺杂半导体颗粒的P材料和包含N掺杂半导体颗粒的N材料的液滴。

公开(公告)号：US20100141290A1

公开(公告)日：2010-06-10

申请号：US12339919

申请日：2008-12-19

申请人： John K. Gritters

发明人： John K. Gritters

IPC分类号： G01R31/02

CPC分类号： G01R3/00 ,  G01R1/06711 ,  H01L2924/0002 ,  Y10T29/49002 ,  H01L2924/00

摘要： Embodiments of microspring arrays and methods for fabricating and using same are provided herein. In some embodiments, a microspring array may include at least two lithographically formed resilient contact elements, each resilient contact element having a beam and a tip for contacting a device to be tested, wherein the beams extend in substantially the same direction relative to a first end of the beams, and wherein the ends of the at least two beams are separated by a distance defining a central region and wherein the respective tips of the at least two beams extend away from the beams in a non-zero, non-perpendicular direction into the central region.

摘要翻译： 本发明提供了微管阵列及其制造和使用方法的实施例。 在一些实施例中，微弹簧阵列可以包括至少两个光刻形成的弹性接触元件，每个弹性接触元件具有梁和用于接触待测试装置的尖端，其中所述梁相对于第一端基本相同的方向延伸 并且其中所述至少两个光束的端部被分开限定中心区域的距离，并且其中所述至少两个光束的各个尖端在非零非垂直方向上远离所述光束延伸成 中部地区。

公开(公告)号：US07579856B2

公开(公告)日：2009-08-25

申请号：US11379760

申请日：2006-04-21

申请人： Igor Y. Khandros ,  John K. Gritters

发明人： Igor Y. Khandros ,  John K. Gritters

IPC分类号： G01R31/02

CPC分类号： G01R31/312 ,  G01R1/06727 ,  G01R1/06744 ,  G01R1/07342 ,  G01R3/00

摘要： A probe apparatus can include a substrate, a contact structure attached to the substrate, and an electronic component electrically connected to the contact structure. The electronic component can be attached to the contact structure.

摘要翻译： 探针装置可以包括衬底，附接到衬底的接触结构和电连接到接触结构的电子部件。 电子部件可以附接到接触结构。

公开(公告)号：US20070296433A1

公开(公告)日：2007-12-27

申请号：US11423878

申请日：2006-06-13

申请人： John K. Gritters

发明人： John K. Gritters

IPC分类号： G01R31/02

CPC分类号： G01R1/07342 ,  G01R1/06727 ,  G01R3/00

摘要： In some embodiments of the invention, a probing apparatus can comprise a substrate, a spring structure attached to the substrate, and a plurality of resilient probes attached to the spring structure. Each probe can comprise a contact portion disposed to contact a device. The spring structure can provide a first source of compliance for each of the probes in response to forces on the contact portions of the probes, and each of the probes can individually provide second sources of compliance in response to the forces on the contact portions of the probes.

摘要翻译： 在本发明的一些实施例中，探测装置可以包括衬底，附接到衬底的弹簧结构以及附接到弹簧结构的多个弹性探针。 每个探针可以包括设置成接触设备的接触部分。 弹簧结构可以响应于探针的接触部分上的力而为每个探针提供第一符合源，并且每个探针可以响应于在接触部分的接触部分上的力而单独地提供第二依从源 探针。

公开(公告)号：US08872176B2

公开(公告)日：2014-10-28

申请号：US13253665

申请日：2011-10-05

申请人： Treliant Fang ,  John K. Gritters ,  Onnik Yaglioglu

发明人： Treliant Fang ,  John K. Gritters ,  Onnik Yaglioglu

IPC分类号： H01L23/58 ,  H01L29/10 ,  B82Y10/00 ,  G01R1/067 ,  G01R31/28

CPC分类号： G01R1/06744 ,  B82Y10/00 ,  G01R31/2886 ,  H01L2224/13 ,  H01L2924/00013 ,  H01L2224/13099 ,  H01L2224/13599 ,  H01L2224/05599 ,  H01L2224/05099 ,  H01L2224/29099 ,  H01L2224/29599

摘要： Contacts of an electrical device can be made of carbon nanotube columns. Contact tips can be disposed at ends of the columns. The contact tips can be made of an electrically conductive paste applied to the ends of the columns and cured (e.g., hardened). The paste can be applied, cured, and/or otherwise treated to make the contact tips in desired shapes. The carbon nanotube columns can be encapsulated in an elastic material that can impart the dominant mechanical characteristics, such as spring characteristics, to the contacts. The contacts can be electrically conductive and can be utilized to make pressure-based electrical connections with electrical terminals or other contact structures of another device.

摘要翻译： 电气装置的触点可以由碳纳米管柱制成。 接触尖端可以放在柱的末端。 接触尖端可以由施加到柱的端部并被固化（例如硬化）的导电浆料制成。 可以施加，固化和/或以其他方式处理糊状物以使接触尖端成为所需形状。 碳纳米管柱可以被包封在弹性材料中，该弹性材料可以赋予触点更大的机械特性，例如弹簧特性。 触点可以是导电的，并且可以用于与电端子或另一器件的其它接触结构进行基于压力的电连接。