Semiconductor light-receiving element
    1.
    发明授权
    Semiconductor light-receiving element 有权
    半导体光接收元件

    公开(公告)号:US08330242B2

    公开(公告)日:2012-12-11

    申请号:US12919551

    申请日:2009-03-05

    IPC分类号: G02B6/26

    摘要: The Si waveguide 305 includes a first conductivity-type Si layer 301 and an intrinsic Si layer 302, and a second conductivity-type light-absorption layer 303 is partially formed on an area thereof. During operation, a reverse bias is applied between the first conductivity-type Si layer 301 and the light-absorption layer 303. Since the light-absorption layer 303 has a conductivity type, it is not depleted when a voltage is applied, but the intrinsic Si layer 302 forming the Si waveguide 305 is depleted. Therefore, it is possible to reduce a CR time constant. Furthermore, since the intrinsic Si layer 302 can be formed on the first conductivity-type Si layer 301 in a continuous manner, it is possible to reduce lattice defects. As a result, it is possible to suppress the dark current generated in the light-receiving element.

    摘要翻译: Si波导305包括第一导电型Si层301和本征Si层302,并且在其一部分上部分地形成第二导电型光吸收层303。 在操作期间,在第一导电型Si层301和光吸收层303之间施加反向偏压。由于光吸收层303具有导电类型,所以在施加电压时不会耗尽,而是内在的 形成Si波导305的Si层302耗尽。 因此,可以减少CR时间常数。 此外,由于本征Si层302可以以连续的方式形成在第一导电型Si层301上,所以可以减少晶格缺陷。 结果,可以抑制在光接收元件中产生的暗电流。

    Electrode structure, semiconductor element, and methods of manufacturing the same
    2.
    发明授权
    Electrode structure, semiconductor element, and methods of manufacturing the same 有权
    电极结构,半导体元件及其制造方法

    公开(公告)号:US08304335B2

    公开(公告)日:2012-11-06

    申请号:US13269153

    申请日:2011-10-07

    IPC分类号: H01L21/28

    摘要: According to the present invention, there is provided an electrode structure which includes: a nitride semiconductor layer; an electrode provided over the nitride semiconductor layer; and an electrode protective film provided over the electrode, wherein the nitride semiconductor layer contains a metal nitride containing Nb, Hf or Zr as a constitutive element, the electrode has a portion having a metal oxide containing Ti or V as a constitutive element formed therein, and the electrode protective film covers at least a portion of the electrode, and contains a protective layer having Au or Pt as a constitutive element.

    摘要翻译: 根据本发明,提供了一种电极结构,其包括:氮化物半导体层; 设置在氮化物半导体层上的电极; 以及设置在所述电极上的电极保护膜,其中所述氮化物半导体层包含含有Nb,Hf或Zr作为构成元素的金属氮化物,所述电极具有含有作为其中形成的构成元素的Ti或V的金属氧化物的部分, 并且所述电极保护膜覆盖所述电极的至少一部分,并且包含具有Au或Pt作为构成要素的保护层。

    SEMICONDUCTOR OPTICAL ELEMENT
    3.
    发明申请
    SEMICONDUCTOR OPTICAL ELEMENT 失效
    半导体光学元件

    公开(公告)号:US20090160033A1

    公开(公告)日:2009-06-25

    申请号:US12095031

    申请日:2006-12-20

    摘要: A light receiving element 1 has a semiconductor substrate 101; a first mesa 11 provided over the semiconductor substrate 101, and having an active region and a first electrode (p-side electrode 111) provided over the active region; a second mesa 12 provided over the semiconductor substrate 101, and having a semiconductor layer and a second electrode (n-side electrode 121) provided over the semiconductor layer; and a third mesa 13 provided over the semiconductor substrate 101, and having a semiconductor layer, wherein the third mesa 13 is arranged so as to surround the first mesa 11.

    摘要翻译: 光接收元件1具有半导体衬底101; 设置在半导体衬底101上的第一台面11,并且具有有源区和设置在有源区上的第一电极(p侧电极111); 设置在半导体衬底101上的第二台面12,并且具有设置在半导体层上的半导体层和第二电极(n侧电极121); 以及设置在半导体衬底101上并具有半导体层的第三台面13,其中第三台面13布置成围绕第一台面11。

    Numerical controller and numerical control method for NC machine tools
    4.
    发明授权
    Numerical controller and numerical control method for NC machine tools 有权
    数控机床数控及数控方法

    公开(公告)号:US06728595B2

    公开(公告)日:2004-04-27

    申请号:US10176134

    申请日:2002-06-21

    IPC分类号: G06F1900

    摘要: A feed velocity of a control axis and acceleration thereof do not exceed a maximum feed velocity and a maximum acceleration defined in mechanical specifications even if a radial operation is carried out for the purpose of a cut-in or escape operation in a contour describing control. A radial permissible maximum velocity (Vnp) and a radial permissible maximum acceleration (&agr;np) in a contour describing control using a circular interpolation is set separately from a setting value of a maximum feed velocity (Vm) of a control axis and that of a maximum acceleration (&agr;m) thereof set as mechanical specifications, and when a command of the circular interpolation is given, limitations are given to a radial velocity (Vn) and acceleration (&agr;n) so that the radial velocity (Vn) and acceleration (&agr;n) do not exceed the radial permissible maximum velocity (Vnp) and permissible maximum acceleration (&agr;np).

    摘要翻译: 控制轴的进给速度及其加速度不会超过在机械规格中定义的最大进给速度和最大加速度,即使在轮廓描述控制中进行切入或逃逸操作的径向操作。 使用圆弧插补描述控制的轮廓中的径向允许最大速度(Vnp)和径向允许最大加速度(alphanp)与控制轴的最大进给速度(Vm)和最大进给速度(Vm)的设定值分开设置 加速度(alpham)设定为机械规格,当给出圆弧插补的指令时,对径向速度(Vn)和加速度(alphan)给出限制,使得径向速度(Vn)和加速度(alphan) 不超过径向允许最大速度(Vnp)和允许的最大加速度(alphanp)。

    ELECTRODE STUCTURE, SEMICONDUCTOR ELEMENT, AND METHODS OF MANUFACTURING THE SAME
    5.
    发明申请
    ELECTRODE STUCTURE, SEMICONDUCTOR ELEMENT, AND METHODS OF MANUFACTURING THE SAME 有权
    电极结构,半导体元件及其制造方法

    公开(公告)号:US20120028456A1

    公开(公告)日:2012-02-02

    申请号:US13269153

    申请日:2011-10-07

    IPC分类号: H01L21/28

    摘要: According to the present invention, there is provided an electrode structure which includes: a nitride semiconductor layer; an electrode provided over the nitride semiconductor layer; and an electrode protective film provided over the electrode, wherein the nitride semiconductor layer contains a metal nitride containing Nb, Hf or Zr as a constitutive element, the electrode has a portion having a metal oxide containing Ti or V as a constitutive element formed therein, and the electrode protective film covers at least a portion of the electrode, and contains a protective layer having Au or Pt as a constitutive element.

    摘要翻译: 根据本发明,提供了一种电极结构,其包括:氮化物半导体层; 设置在氮化物半导体层上的电极; 以及设置在所述电极上的电极保护膜,其中所述氮化物半导体层包含含有Nb,Hf或Zr作为构成元素的金属氮化物,所述电极具有含有作为其中形成的构成元素的Ti或V的金属氧化物的部分, 并且所述电极保护膜覆盖所述电极的至少一部分,并且包含具有Au或Pt作为构成要素的保护层。

    Semiconductor optical element
    6.
    发明授权
    Semiconductor optical element 失效
    半导体光学元件

    公开(公告)号:US07952172B2

    公开(公告)日:2011-05-31

    申请号:US12095031

    申请日:2006-12-20

    IPC分类号: H01L29/06

    摘要: A light receiving element 1 has a semiconductor substrate 101; a first mesa 11 provided over the semiconductor substrate 101, and having an active region and a first electrode (p-side electrode 111) provided over the active region; a second mesa 12 provided over the semiconductor substrate 101, and having a semiconductor layer and a second electrode (n-side electrode 121) provided over the semiconductor layer; and a third mesa 13 provided over the semiconductor substrate 101, and having a semiconductor layer, wherein the third mesa 13 is arranged so as to surround the first mesa 11.

    摘要翻译: 光接收元件1具有半导体衬底101; 设置在半导体衬底101上的第一台面11,并且具有有源区和设置在有源区上的第一电极(p侧电极111); 设置在半导体衬底101上的第二台面12,并且具有设置在半导体层上的半导体层和第二电极(n侧电极121); 以及设置在半导体衬底101上并具有半导体层的第三台面13,其中第三台面13布置成围绕第一台面11。

    METHOD FOR DETECTING SUBSTRATE POSITION OF CHARGED PARTICLE BEAM PHOTOLITHOGRAPHY APPARATUS AND CHARGED PARTICLE BEAM PHOTOLITHOGRAPHY APPARATUS
    7.
    发明申请
    METHOD FOR DETECTING SUBSTRATE POSITION OF CHARGED PARTICLE BEAM PHOTOLITHOGRAPHY APPARATUS AND CHARGED PARTICLE BEAM PHOTOLITHOGRAPHY APPARATUS 有权
    用于检测充电颗粒光束照相装置和充电颗粒光栅照相装置的基板位置的方法

    公开(公告)号:US20100290023A1

    公开(公告)日:2010-11-18

    申请号:US12778472

    申请日:2010-05-12

    IPC分类号: G03B27/58

    摘要: One aspect of the invention provides a substrate position detecting method for charged particle beam photolithography apparatus in order to be able to measure accurately and simply a substrate position on a stage. The substrate position detecting method for charged particle beam photolithography apparatus includes placing a substrate on a stage that can be moved in an X-direction and a Y-direction; measuring a position in the X-direction of the stage while moving the stage in the X-direction, and illuminating obliquely an upper surface of the substrate with a laser beam to receive light reflected from the substrate with a position sensing device; computing a barycentric position of the reflected light when the stage is moved in the X-direction; measuring a position in the Y-direction of the stage while moving the stage in the Y-direction, and illuminating obliquely the upper surface of the substrate with the laser beam to receive light reflected from the substrate with the position sensing device; computing a barycentric position of the reflected light when the stage is moved in the Y-direction; and computing the positions of the substrate from the position measurement results of the stage and the computed barycentric position.

    摘要翻译: 本发明的一个方面提供一种用于带电粒子束光刻设备的基板位置检测方法,以便能够准确且简单地测量台上的基板位置。 用于带电粒子束光刻设备的基片位置检测方法包括将基片放置在能沿X方向和Y方向移动的台上; 在X方向移动载物台的同时测量载物台的X方向上的位置,用激光束倾斜地照射基板的上表面,以利用位置检测装置接收从基板反射的光; 当所述台沿X方向移动时计算反射光的重心位置; 同时沿着Y方向移动台,测量台的Y方向的位置,并用激光束倾斜地照射基板的上表面,以利用位置感测装置接收从基板反射的光; 当所述载物台沿Y方向移动时计算反射光的重心位置; 以及从所述台的位置测量结果和所计算的重心位置计算所述基板的位置。

    ELECTRODE STRUCTURE, SEMICONDUCTOR DEVICE, AND METHODS FOR MANUFACTURING THOSE
    8.
    发明申请
    ELECTRODE STRUCTURE, SEMICONDUCTOR DEVICE, AND METHODS FOR MANUFACTURING THOSE 审中-公开
    电极结构,半导体器件及其制造方法

    公开(公告)号:US20100200863A1

    公开(公告)日:2010-08-12

    申请号:US11917124

    申请日:2006-07-06

    IPC分类号: H01L29/40 H01L21/20 H01L21/28

    摘要: A first layer containing Ti as a constituent element, a second layer containing Nb as a constituent element, and a third layer containing Au as a constituent element are formed on a GaN substrate 11. Thereafter, the GaN substrate 11 and the first to third layers are kept at 700° C. or higher and at 1300° C. or lower. This allows a metal oxide of Ti to be distributed to extend from the interface between the GaN substrate 11 and the electrode 14 over to the inside of the electrode 14. Further, a metal nitride of Nb is formed in the inside of the GaN substrate 11. The metal nitride of Nb will be distributed to extend from the inside of the electrode 14 over to the inside of the GaN substrate 11.

    摘要翻译: 在GaN衬底11上形成包含Ti作为构成元素的第一层,含有Nb作为构成元素的第二层和含有Au作为构成元素的第三层。此后,GaN衬底11和第一至第三层 保持在700℃以上且1300℃以下。 这允许Ti的金属氧化物从GaN衬底11和电极14之间的界面延伸到电极14的内部。此外,在GaN衬底11的内部形成Nb的金属氮化物 Nb的金属氮化物将从电极14的内部扩散到GaN衬底11的内部。

    ELECTRODE STRUCTURE, SEMICONDUCTOR ELEMENT, AND METHODS OF MANUFACTURING THE SAME
    9.
    发明申请
    ELECTRODE STRUCTURE, SEMICONDUCTOR ELEMENT, AND METHODS OF MANUFACTURING THE SAME 有权
    电极结构,半导体元件及其制造方法

    公开(公告)号:US20100032839A1

    公开(公告)日:2010-02-11

    申请号:US12519698

    申请日:2007-12-11

    IPC分类号: H01L23/48 H01L21/28

    摘要: According to the present invention, there is provided an electrode structure which includes: a nitride semiconductor layer; an electrode provided over the nitride semiconductor layer; and an electrode protective film provided over the electrode, wherein the nitride semiconductor layer contains a metal nitride containing Hb, Hf or Zr as a constitutive element, the electrode has a portion having a metal oxide containing Ti or V as a constitutive element formed therein, and the electrode protective film covers at least a portion of the electrode, and contains a protective layer having Au or Pt as a constitutive element.

    摘要翻译: 根据本发明,提供了一种电极结构,其包括:氮化物半导体层; 设置在氮化物半导体层上的电极; 以及设置在所述电极上的电极保护膜,其中所述氮化物半导体层包含含有Hb,Hf或Zr作为构成元素的金属氮化物,所述电极具有含有作为其中形成的构成元素的Ti或V的金属氧化物的部分, 并且所述电极保护膜覆盖所述电极的至少一部分,并且包含具有Au或Pt作为构成要素的保护层。

    Optical device of waveguide type and its production method
    10.
    发明申请
    Optical device of waveguide type and its production method 有权
    波导型光学器件及其制作方法

    公开(公告)号:US20070003183A1

    公开(公告)日:2007-01-04

    申请号:US10569454

    申请日:2004-08-30

    IPC分类号: G02B6/12

    摘要: Input ports (103a, 103b) formed from fundamental mode waveguides are provided at one end of a multimode waveguide (104). Further, an output port (105) formed from a fundamental mode waveguide is provided at the other end of the multimode waveguide (104). The multimode waveguide (104) has a width wider than those of the input ports (103a, 103b) and the output port (105), and provides modes including multimode to the waveguide. The multimode waveguide (104) is embedded with a buried layer (200). Both of the end faces of the multimode waveguide (104) are made to be planes equivalent to a (100) plane or planes inclined from these planes. In a case of inclined planes, the planes are made to be planes inclined to a direction that the waveguide region spreads toward a stacked direction of the semiconductor layers.

    摘要翻译: 在多模波导(104)的一端设置由基波导波导形成的输入端口(103a,103b)。 此外,在多模波导(104)的另一端设置由基波导波导形成的输出端口(105)。 多模波导(104)的宽度大于输入端口(103a,103b)和输出端口(105)的宽度,并且提供包括多模式到波导的模式。 多模波导(104)嵌入有埋层(200)。 多模波导(104)的两个端面被制成与(100)平面相等的平面或从这些平面倾斜的平面。 在倾斜平面的情况下,将这些平面制成为使波导区域向半导体层的堆叠方向扩展的方向倾斜的面。