ROBOT AND ROBOT HAND
    1.
    发明申请
    ROBOT AND ROBOT HAND 有权
    机器人和机器人手

    公开(公告)号:US20120153652A1

    公开(公告)日:2012-06-21

    申请号:US13331041

    申请日:2011-12-20

    IPC分类号: B25J15/00

    CPC分类号: B25J15/0028

    摘要: A recess has a proximal-end-side surface and a distal-end-side surface. When an intersection between a straight line included in the proximal-end-side surface and a straight line included in the distal-end-side surface is a base point, a line passing through the base point is a base line, a line between two claw portions, passing through an end point of the recess and orthogonal to the base line is an orthogonal line, the angle α made between the base line, and the straight line included in the distal-end-side surface is greater than 0 degrees and less than 90 degrees, the angle β made between the orthogonal line, and the straight line included in the proximal-end-side surface is greater than 0 degrees and less than 90 degrees, and the length d from the base point to the orthogonal line is greater than 0.

    摘要翻译: 凹部具有近端侧表面和远端侧表面。 当基端侧表面所包括的直线和包含在前端侧表面中的直线之间的交点为基点时,通过基点的线为基线,两条线 穿过凹部的终点并且与基线正交的爪部是正交线,在基线与包括在前端侧表面中的直线之间形成的角度α大于0度, 小于90度,角度&bgr; 在正交线之间形成,并且包括在近端侧表面中的直线大于0度且小于90度,并且从基点到正交线的长度d大于0。

    PROCESS FOR PRODUCING PHOTOVOLTAIC DEVICE
    2.
    发明申请
    PROCESS FOR PRODUCING PHOTOVOLTAIC DEVICE 审中-公开
    生产光伏器件的方法

    公开(公告)号:US20120040494A1

    公开(公告)日:2012-02-16

    申请号:US13264277

    申请日:2010-06-23

    IPC分类号: H01L31/18

    摘要: A process for producing a photovoltaic device having high photovoltaic conversion efficiency by suppressing light absorption in the visible light short wavelength region. The process for producing a photovoltaic device (100) comprises a step of forming a substrate-side transparent electrode layer (2) on a substrate (1), a step of forming an intermediate contact layer (5) between two adjacent cell layers (91, 92), and a step of forming a backside transparent electrode layer (6) on a photovoltaic layer (3), wherein a transparent conductive film comprising mainly Ga-doped ZnO is deposited as the substrate-side transparent electrode layer (2), the intermediate contact layer (5) or the backside transparent electrode layer (6), under conditions in which the N2 gas partial pressure is controlled so that the ratio of N2 gas partial pressure relative to inert gas partial pressure per unit thickness of the transparent conductive film is not more than a predetermined value.

    摘要翻译: 通过抑制可见光短波长区域中的光吸收而制造具有高光电转换效率的光伏器件的方法。 制造光电器件(100)的方法包括在基板(1)上形成基板侧透明电极层(2)的步骤,在两个相邻单元层(91)之间形成中间接触层(5)的步骤 ,92),以及在光电转换层(3)上形成背面透明电极层(6)的步骤,其中沉积了主要包含Ga的ZnO的透明导电膜作为衬底侧透明电极层(2), 中间接触层(5)或背面透明电极层(6),在N2气体分压被控制的条件下,使N 2气体分压与透明导电性单位厚度的惰性气体分压之比 电影不超过预定值。

    THIN-FILM INSPECTION APPARATUS AND METHOD THEREFOR
    3.
    发明申请
    THIN-FILM INSPECTION APPARATUS AND METHOD THEREFOR 失效
    薄膜检查装置及其方法

    公开(公告)号:US20110205556A1

    公开(公告)日:2011-08-25

    申请号:US13120295

    申请日:2009-07-02

    IPC分类号: G01B11/06

    CPC分类号: G01B11/0625

    摘要: A thin-film inspection apparatus includes a storage section (14) that stores at least two feature-value characteristics in which at least two feature values selected from feature values in a spectral reflectance spectrum that are affected by a variation in the film thickness of at least one of a first transparent thin film and a second transparent thin film are each associated with the film thickness of the first transparent thin film and the film thickness of the second transparent thin film; a light irradiation section (11) that irradiates an inspection-target substrate (S) with white light through a transparent glass substrate; a light receiving section (12) that receives reflected light reflected from the inspection-target substrate (S); and an arithmetic section (15) that obtains measurement values of the feature values stored in the storage section (14) from a spectral reflectance spectrum generated based on the received reflected light and that calculates the film thickness of each of the first transparent thin film and the second transparent thin film by using the obtained measurement values of the feature values and the feature-value characteristics stored in the storage section (14).

    摘要翻译: 薄膜检查装置包括存储部分(14),其存储至少两个特征值特性,其中从光谱反射光谱中的特征值中选择的至少两个特征值受到在 第一透明薄膜和第二透明薄膜中的至少一个分别与第一透明薄膜的膜厚度和第二透明薄膜的膜厚相关联; 通过透明玻璃基板将白色光照射到检查对象基板(S)的光照射部(11) 接收从所述检查对象基板(S)反射的反射光的受光部(12)。 以及算术部(15),其从基于所接收的反射光生成的光谱反射光谱获得存储在所述存储部(14)中的特征量的测量值,并且计算所述第一透明薄膜和 通过使用获得的存储在存储部分(14)中的特征值和特征值特性的测量值来确定第二透明薄膜。

    PROCESS FOR PRODUCING PHOTOVOLTAIC DEVICE AND DEPOSITION APPARATUS
    4.
    发明申请
    PROCESS FOR PRODUCING PHOTOVOLTAIC DEVICE AND DEPOSITION APPARATUS 失效
    生产光伏器件和沉积设备的方法

    公开(公告)号:US20110201145A1

    公开(公告)日:2011-08-18

    申请号:US13124553

    申请日:2009-10-02

    摘要: A process for producing a high-performance photovoltaic device by depositing a high-quality crystalline silicon layer, and a deposition apparatus for depositing the high-quality crystalline silicon layer. A process for producing a photovoltaic device that comprises forming a crystalline silicon-based photovoltaic layer comprising an i-layer on a substrate using a plasma-enhanced CVD method, wherein formation of the i-layer comprises an initial layer deposition stage and a bulk i-layer deposition stage, and the initial layer deposition stage comprises depositing the initial layer using a silane-based gas flow rate during the initial layer deposition stage that is lower than the silane-based gas flow rate during the bulk i-layer deposition stage, with the deposition time for the initial layer deposition stage set to not less than 0.5% and not more than 20% of the total deposition time for the i-layer, and with the SiH* emission intensity during the initial layer deposition stage not, more than 80% of the stabilized SiH* emission intensity during the bulk i-layer deposition stage.

    摘要翻译: 通过沉积高品质晶体硅层制造高性能光伏器件的方法和用于沉积高质量晶体硅层的沉积设备。 一种用于制造光伏器件的方法,其包括使用等离子体增强CVD方法在衬底上形成包含i层的晶体硅基光伏层,其中所述i层的形成包括初始层沉积阶段和体积i 初始层沉积阶段包括在初始层沉积阶段期间使用硅烷基气体流速沉积初始层,该初始层沉积阶段低于体积i层沉积阶段期间的硅烷基气体流速, 初始层沉积阶段的沉积时间设定为不少于i层总沉积时间的0.5%且不大于20%,而在初始层沉积阶段的SiH *发射强度不大于 超过80%的稳定的SiH *发射强度在大量i层沉积阶段。

    Thin-film inspection apparatus and inspection method
    6.
    发明授权
    Thin-film inspection apparatus and inspection method 失效
    薄膜检验仪器及检验方法

    公开(公告)号:US08497991B2

    公开(公告)日:2013-07-30

    申请号:US13120319

    申请日:2009-07-02

    IPC分类号: G01N21/47 G01N21/00

    摘要: An object is to reduce the effect of a film thickness variation on the substrate surface of a thin film and improve the measuring accuracy. Provided are a light source that radiates single-wavelength light to an inspection-target substrate (W), which is formed by forming a thin film on a glass substrate from the glass substrate side; a light receiving element that is disposed such that the light receiving axis intersects with the optical axis of illumination light emitted from the light source at a predetermined inclination angle and that receives diffused transmitted light that has been transmitted through the inspection-target substrate W; and a computer (7) that obtains a haze ratio of the thin film on the basis of the intensity of the light received by the light receiving element. The computer (7) has a haze ratio characteristic made by associating the haze ratio and the light intensity of the diffused transmitted light and obtains a haze ratio by using the haze ratio characteristic and the light intensity received by the light receiving element.

    摘要翻译: 目的是减少薄膜的薄膜厚度变化对薄膜的基板表面的影响,提高测量精度。 提供了通过从玻璃基板侧在玻璃基板上形成薄膜而将单波长光照射到检查对象基板(W)的光源, 光接收元件被设置为使得光接收轴线以与预定倾斜角度从光源发射的照明光的光轴相交并且接收已经透射通过检查对象基板W的扩散透射光; 以及基于由光接收元件接收的光的强度来获得薄膜的雾度比的计算机(7)。 计算机(7)具有通过使雾化率和扩散透射光的光强度相关联而获得的雾度比特性,并且通过使用由光接收元件接收的雾度比特性和光强度来获得雾度比。

    PROCESS FOR PRODUCING PHOTOVOLTAIC DEVICE
    7.
    发明申请
    PROCESS FOR PRODUCING PHOTOVOLTAIC DEVICE 审中-公开
    生产光伏器件的方法

    公开(公告)号:US20110318871A1

    公开(公告)日:2011-12-29

    申请号:US13203935

    申请日:2010-02-25

    IPC分类号: H01L31/18

    摘要: There are provided a thermal barrier coating material and a thermal barrier coating member that can suppress spalling when used at a high temperature and have a high thermal barrier effect, a method for producing the same, a turbine member coated with a thermal barrier coating, and a gas turbine. The thermal barrier coating member comprises a heat resistant substrate, a bond coat layer formed thereon, and a ceramic layer formed further thereon, wherein the ceramic layer comprises an oxide which consists of an oxide represented by the general formula A2Zr2O7 doped with a predetermined amount of CaO or MgO and has 10 volume % or more of a pyrochlore type crystal structure, where A represents any of La, Nd, Sm, Gd, and Dy.

    摘要翻译: 提供了在高温下使用时具有高的隔热效果,能够抑制剥落的热障涂层材料及其制造方法,具有隔热涂层的涡轮部件,以及 一个燃气轮机。 隔热涂层构件包括耐热基材,形成在其上的粘合涂层和其上形成的陶瓷层,其中陶瓷层包括氧化物,该氧化物由掺杂有预定量的金属的通式A2Zr2O7表示, CaO或MgO,并且具有10体积%以上的烧绿石型晶体结构,其中A表示La,Nd,Sm,Gd和Dy中的任一种。

    RESISTIVITY TESTING METHOD AND DEVICE THEREFOR
    8.
    发明申请
    RESISTIVITY TESTING METHOD AND DEVICE THEREFOR 有权
    电阻测试方法及其设备

    公开(公告)号:US20110019190A1

    公开(公告)日:2011-01-27

    申请号:US12934717

    申请日:2009-07-02

    摘要: An object is to efficiently measure the resistivity of a transparent conductive film with high accuracy in a non-destructive and non-contact manner. Provided is a resistivity testing device that includes a light emitting device that emits p-polarized emission light having a wavelength selected by a preliminarily performed test-condition selecting method toward a transparent conductive film, formed on a light-transmissive substrate conveyed along a manufacturing line, from a film-surface side at an incidence angle selected by the method; a light detecting device that detects reflected light reflected at the transparent conductive film; and an information processor that calculates an evaluation value related to the amount of light of the reflected light with respect to the wavelength on the basis of the intensity of the detected light and obtains a resistivity from the calculated evaluation value by using a correlation characteristic in which the evaluation value and the resistivity are associated with each other in advance.

    摘要翻译: 目的是以非破坏性和非接触的方式高精度地有效地测量透明导电膜的电阻率。 提供了一种电阻率测试装置,其包括:发光装置,其将具有通过预先进行的测试条件选择方法选择的波长的p偏振发射光朝向透明导电膜形成,所述透明导电膜形成在沿着制造线传送的透光基板 从膜表面侧以该方法选择的入射角; 检测在透明导电膜上反射的反射光的光检测装置; 以及信息处理器,其基于所检测的光的强度来计算与所述反射光的相对于所述波长的光量相关的评价值,并且通过使用相关特性从所计算的评估值获得电阻率,其中, 评估值和电阻率预先相互关联。

    Turbine moving blade, turbine stationary blade, turbine split ring, and gas turbine
    9.
    发明授权
    Turbine moving blade, turbine stationary blade, turbine split ring, and gas turbine 有权
    涡轮动叶片,涡轮固定叶片,涡轮分裂环和燃气轮机

    公开(公告)号:US06811373B2

    公开(公告)日:2004-11-02

    申请号:US10067947

    申请日:2002-02-08

    IPC分类号: F01D518

    摘要: The present invention provides a turbine moving blade, a turbine stationary blade, and a turbine split ring which are capable of restraining the deterioration and peeling-off of a thermal barrier coating easily and surely, and a gas turbine capable of enhancing the energy efficiency by increasing the temperature of combustion gas. The turbine moving blade provided in a turbine constituting the gas turbine includes a platform having a gas path surface extending in the combustion gas flow direction, and a blade portion erecting on the platform. The thermal barrier coating covering the gas path surface is formed so as to go around from the gas path surface to an upstream-side end face and a downstream-side end face of the outer peripheral faces of the platform.

    摘要翻译: 本发明提供了能够容易且可靠地抑制热障涂层的劣化和剥离的涡轮机动叶片,涡轮静叶片和涡轮分裂环,以及能够通过以下方式提高能量效率的燃气轮机 增加燃烧气体的温度。 设置在构成燃气轮机的涡轮机中的涡轮机动叶片具有在燃烧气体流动方向上具有气体流路面的平台和在平台上竖起的叶片部。 覆盖气体路径表面的隔热涂层形成为从气体路径表面到平台的外周面的上游侧端面和下游侧端面。

    Thin-film inspection apparatus and method therefor
    10.
    发明授权
    Thin-film inspection apparatus and method therefor 失效
    薄膜检查装置及其方法

    公开(公告)号:US08482744B2

    公开(公告)日:2013-07-09

    申请号:US13120295

    申请日:2009-07-02

    IPC分类号: G01B11/28

    CPC分类号: G01B11/0625

    摘要: A thin-film inspection apparatus calculates a film thickness of a first transparent thin film and a second transparent thin film of an inspection-target substrate including the first and second transparent thin films and a transparent conductive film on a transparent glass substrate. The apparatus has a storage section storing at least two feature-value characteristics in which at least two feature values selected from feature values in a spectral reflectance spectrum; a light irradiation section irradiating the inspection-target substrate with white light through the transparent glass substrate; a light receiving section receiving light reflected from the inspection-target substrate; and an arithmetic section obtaining measurement values of the feature values stored in the storage section from the spectral reflectance spectrum based on the reflected light received by the light receiving section, and calculating the film thickness of each of the first transparent thin film and the second transparent thin film.

    摘要翻译: 薄膜检查装置在透明玻璃基板上计算包括第一透明薄膜和第二透明薄膜的透明导电薄膜的检查对象基板的第一透明薄膜和第二透明薄膜的膜厚。 该装置具有存储至少两个特征值特性的存储部分,其中从光谱反射光谱中的特征值中选择的至少两个特征值; 光照射部,通过透明玻璃基板照射检查对象基板的白色光; 接收从检查对象基板反射的光的受光部; 以及算术部,基于由所述受光部所接收的反射光,从所述光谱反射率光谱求出存储在所述存储部中的特征量的测量值,并且计算所述第一透明薄膜和所述第二透明薄膜 薄膜。