公开(公告)号：US10791267B2

公开(公告)日：2020-09-29

申请号：US16395721

申请日：2019-04-26

申请人： Satoshi Mitsui ,  Kei Kushimoto ,  Kohichi Nishide ,  Tomotoshi Sato

发明人： Satoshi Mitsui ,  Kei Kushimoto ,  Kohichi Nishide ,  Tomotoshi Sato

IPC分类号： H04N5/232 ,  H04N21/2743 ,  H04N21/4223 ,  H04N21/81 ,  H04N1/00 ,  H04N1/21 ,  H04N21/258 ,  H04N21/45 ,  H04N1/32 ,  H04N5/225

摘要： A service system includes a mobile terminal and an information processing device capable of communication via a network. The mobile terminal includes a first transmission unit that transmits spherical images taken in respective imaging locations and positional information about the imaging locations to the information processing device. The information processing device includes a reception unit that receives the spherical images transmitted by the first transmission unit; a map data obtaining unit that obtains map data from a map data storage, the map data including the imaging locations of the spherical images; a path information creation unit that creates information about a path made by connecting the imaging locations in the map data obtained by the map data obtaining unit; and a content providing unit that makes content available for a request through the network, the content including the map data, the information about the path, and the spherical images.

公开(公告)号：US20090219460A1

公开(公告)日：2009-09-03

申请号：US12087766

申请日：2007-01-12

申请人： Daisuke Takeda ,  Tomotoshi Sato ,  Akira Ohnishi

发明人： Daisuke Takeda ,  Tomotoshi Sato ,  Akira Ohnishi

IPC分类号： H05B37/02 ,  G02F1/133

CPC分类号： H05B33/0821 ,  G02F1/133603 ,  G02F2001/133612 ,  H01L23/62 ,  H01L2924/0002 ,  H05B33/0818 ,  H01L2924/00

摘要： An object of the invention is to provide an illumination device that can make it easy to detect a disorder of a light emitting element, and a liquid crystal display apparatus including the illumination device. Each light emitting element array (S) is constituted by light emitting elements (T) which are connected in series. To the light emitting elements (T) are individually connected in parallel current bypass elements (U) that are changed from a disconnected state where no current flows to a connected state where current flows when a predetermined voltage higher than that applied to the light emitting elements in an lighting state is applied thereto. Each power source unit (P) is connected to each light emitting element array (S) in series, and supplies constant current to each light emitting element (T). Terminal units for voltage detection (11) are connected to an anode (A) of each light emitting element (T).

摘要翻译： 本发明的目的是提供一种能够容易地检测发光元件的障碍的照明装置，以及包括该照明装置的液晶显示装置。 每个发光元件阵列（S）由串联连接的发光元件（T）构成。 发光元件（T）分别连接在并联电流旁路元件（U）中，该电流旁路元件（U）从没有电流流过的断开状态改变为当电流比施加到发光元件的电压高的电流时电流流动的连接状态 处于照明状态。 每个电源单元（P）串联连接到每个发光元件阵列（S），并且向每个发光元件（T）提供恒定电流。 用于电压检测的端子单元（11）连接到每个发光元件（T）的阳极（A）。

公开(公告)号：US07467341B2

公开(公告)日：2008-12-16

申请号：US10545511

申请日：2004-02-10

申请人： Tomotoshi Sato

发明人： Tomotoshi Sato

IPC分类号： G01R31/28

CPC分类号： G01R31/318555 ,  H01L24/01 ,  H01L2924/14 ,  H01L2924/00

摘要： An object of the invention is to provide a boundary scan controller that allows a boundary scan to be executed and also allows a semiconductor apparatus to be manufactured in such a manner that the same type of semiconductor circuit chips are stacked. When identification data stored in memory means (85) is compared with fixed data held in fixed-data holding means (87) by comparison means (88) and the identification data is coincident with the fixed data, a data derivation section (89) outputs the same data as data which is outputted from an output section (86). In a boundary scan test, a data derivation section (89) of a boundary controller (80) provided for each semiconductor circuit chip is connected to the same bus line. When the identification data is not coincident with the fixed data, the data derivation section (89) can be substantially disconnected from the bus line. In this way, the same type of semiconductor circuit chips for which the boundary controller (80) is provided can be stacked, thereby manufacturing the semiconductor apparatus.

摘要翻译： 本发明的目的是提供一种边界扫描控制器，其允许执行边界扫描，并且还允许半导体装置以相同类型的半导体电路芯片堆叠的方式制造。 当存储在存储装置（85）中的识别数据与通过比较装置（88）保持在固定数据保持装置（87）中的固定数据进行比较，并且识别数据与固定数据一致时，数据导出部分（89）输出 与从输出部（86）输出的数据相同的数据。 在边界扫描测试中，为每个半导体电路芯片提供的边界控制器（80）的数据推导部分（89）连接到相同的总线。 当识别数据与固定数据不一致时，数据导出部分（89）可以基本上与总线断开连接。 以这种方式，可以堆叠设置边界控制器（80）的相同类型的半导体电路芯片，从而制造半导体装置。

公开(公告)号：US20070036010A1

公开(公告)日：2007-02-15

申请号：US10573460

申请日：2004-09-24

申请人： Tomotoshi Sato

发明人： Tomotoshi Sato

IPC分类号： G11C29/00

CPC分类号： G11C29/808 ,  G11C29/72 ,  G11C29/785 ,  G11C29/832

摘要： A memory chip includes a main memory cell; a row-wise redundant memory cell and a column-wise redundant memory cell for relieving a defect existing in the main memory; an identification number designation terminal for storing an identification number corresponding to the main memory cell; an address terminal for receiving the identification number; and a redundant row selector circuit and a redundant column selector circuit for performing allocation so as to replace a defective memory space of the main memory cell with a memory space of the redundant memory cells. The redundant selector circuits allocate a memory space corresponding to the defect of the main memory cell to the redundant memory cells when the identification number received from the address terminal coincides with the identification number of the identification number specification terminal.

摘要翻译： 存储芯片包括主存储单元; 逐行冗余存储器单元和用于缓解存储在主存储器中的缺陷的列式冗余存储器单元; 识别号指定终端，用于存储对应于所述主存储单元的标识号; 用于接收识别号码的地址终端; 以及冗余行选择器电路和冗余列选择器电路，用于执行分配以便用冗余存储器单元的存储空间来代替主存储单元的有缺陷的存储空间。 当从地址终端接收的识别号与识别号码指定终端的识别号一致时，冗余选择器电路将与主存储单元的缺陷相对应的存储空间分配给冗余存储单元。

公开(公告)号：US06875672B2

公开(公告)日：2005-04-05

申请号：US10629695

申请日：2003-07-30

申请人： Yoshihiko Nemoto ,  Tomonori Fujii ,  Masahiro Sunohara ,  Tomotoshi Sato

发明人： Yoshihiko Nemoto ,  Tomonori Fujii ,  Masahiro Sunohara ,  Tomotoshi Sato

IPC分类号： H01L23/52 ,  H01L21/3205 ,  H01L21/60 ,  H01L21/68 ,  H01L21/768 ,  H01L23/48 ,  H01L21/4757

CPC分类号： H01L21/6835 ,  H01L21/76898 ,  H01L23/481 ,  H01L24/81 ,  H01L2221/6834 ,  H01L2224/136 ,  H01L2224/8121 ,  H01L2224/81815 ,  H01L2924/01068 ,  H01L2924/12044 ,  Y10S438/928 ,  H01L2924/014

摘要： A method for manufacturing a semiconductor device can prevent defective products resulting from a plating liquid when surfaces of protruded portions of penetration electrodes are subjected to plating. An organic insulation film (14) is formed on one surface of a substrate proper (10), and a support member (16) is adhered to the organic insulation film (adhesion step). A rear side of the substrate proper is removed until protruded portions (6) of penetration electrodes (7) are exposed, thereby to form a semiconductor substrate (5). Plating films (8) are formed on the surfaces of the protruded portions (6), and the support member and the organic insulation film are removed from the semiconductor substrate. The organic insulation film has an adhesive property and chemical resistance to chemical substances used in respective steps after the adhesion step, and it is at least dissolved in or peeled off from a chemical substance used in the removal step.

摘要翻译： 当穿透电极的突出部分的表面进行电镀时，半导体器件的制造方法可以防止电镀液产生的不良品。 在基板本体（10）的一个表面上形成有机绝缘膜（14），并且将有机绝缘膜（粘合步骤）上的支撑部件（16）粘合。 去除衬底本体的后侧直到暴露穿透电极（7）的突出部分（6），从而形成半导体衬底（5）。 在突出部分（6）的表面上形成电镀膜（8），从半导体衬底去除支撑件和有机绝缘膜。 有机绝缘膜在粘合步骤之后的各个步骤中具有对化学物质的粘合性和耐化学性，并且至少溶解或从去除步骤中使用的化学物质剥离。

公开(公告)号：US20050007615A1

公开(公告)日：2005-01-13

申请号：US10616632

申请日：2003-07-09

申请人： Tomotoshi Sato

发明人： Tomotoshi Sato

IPC分类号： B41J29/38 ,  B41J21/00 ,  B41J29/00 ,  B41J29/42 ,  G06F3/12 ,  G06F15/00

CPC分类号： G06F3/1285 ,  G06F3/1204 ,  G06F3/1209 ,  G06F3/1248 ,  G06F3/1284

摘要： A printing device into which data conversion functionality may be installed is disclosed. According to one aspect, the printing device receives, through a first module, a command that is intended to cause the printing device to perform an action that is indicated by the command. The printing device determines whether a translation module, which contains logic for translating the command, is installed in the printing device. If the translation module is not installed in the printing device, then the printing device sends data, which indicates the command, directly from the first module to a second module If the translation module is installed in the printing device, then the printing device invokes the logic to translate the command into one or more translated commands that will cause the printing device to perform the intended action, and sends the one or more translated commands to the second module.

摘要翻译： 公开了可以安装数据转换功能的打印装置。 根据一个方面，打印装置通过第一模块接收旨在使打印装置执行由该命令指示的动作的命令。 打印设备确定在打印设备中是否安装了包含用于转换命令的逻辑的翻译模块。 如果翻译模块未安装在打印设备中，则打印设备将指示命令的数据直接从第一模块发送到第二模块。如果翻译模块安装在打印设备中，则打印设备调用 将命令翻译成将导致打印设备执行预期动作的一个或多个转换的命令的逻辑，并将一个或多个转换的命令发送到第二模块。

公开(公告)号：US6062460A

公开(公告)日：2000-05-16

申请号：US971985

申请日：1997-11-17

申请人： Tomotoshi Sato

发明人： Tomotoshi Sato

IPC分类号： B23K1/018 ,  H01L21/60 ,  H05K3/22 ,  H05K3/34 ,  B23K31/00 ,  B23K1/00 ,  B23K1/08

CPC分类号： H05K3/3457 ,  H01L21/4853 ,  H01L24/11 ,  H01L24/12 ,  H01L24/81 ,  H01L24/98 ,  H05K3/3436 ,  H05K3/3484 ,  H01L2224/11003 ,  H01L2224/11822 ,  H01L2224/13022 ,  H01L2224/13099 ,  H01L2224/81191 ,  H01L2224/8123 ,  H01L2224/81801 ,  H01L2924/01004 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01015 ,  H01L2924/01019 ,  H01L2924/01022 ,  H01L2924/01023 ,  H01L2924/01027 ,  H01L2924/01033 ,  H01L2924/0105 ,  H01L2924/01074 ,  H01L2924/01075 ,  H01L2924/01077 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/01322 ,  H01L2924/014 ,  H01L2924/351 ,  H05K2201/035 ,  H05K2201/10734 ,  H05K2201/10984 ,  H05K2203/0195 ,  H05K2203/0278 ,  H05K2203/0338 ,  H05K2203/043 ,  H05K2203/0445 ,  H05K2203/176 ,  H05K3/225 ,  H05K3/3494 ,  Y02P70/613

摘要： A method for producing an electronic circuit device includes a repair step in which, in a case where a semiconductor device once mounted on a wiring board is defective, the defective semiconductor device is removed from the wiring board and a new semiconductor device is mounted on the wiring board. The repair step includes the steps of: removing an excessive residue of a brazing metal residue remaining on lands of the wiring board from which the defective semiconductor device has been removed and leaving a uniform amount of the brazing metal residue on the lands; aligning the new semiconductor device with the wiring board; and melting the brazing metal residue which is made uniform and remains on the lands and projecting electrodes of the new semiconductor device by heating, thereby connecting the new semiconductor device to the wiring board.

摘要翻译： 一种电子电路装置的制造方法，其特征在于，在一旦安装在配线基板上的半导体装置发生故障的情况下，将所述有缺陷的半导体装置从所述布线基板上除去，将新的半导体装置安装在 接线板 修复步骤包括以下步骤：除去残留在已经去除了有缺陷的半导体器件的布线板的焊盘上的残留的残留的残余物，并且在焊盘上留下均匀量的钎焊金属残留物; 将新的半导体器件与布线板对准; 并且通过加热熔化制成均匀的钎焊金属残渣并保留在新的半导体器件的焊盘和突出电极上，从而将新的半导体器件连接到布线板。

公开(公告)号：US09785244B2

公开(公告)日：2017-10-10

申请号：US14186180

申请日：2014-02-21

申请人： Tomotoshi Sato ,  Takahiro Imamichi

发明人： Tomotoshi Sato ,  Takahiro Imamichi

IPC分类号： G06F3/01 ,  G06F3/00 ,  G06F3/03

CPC分类号： G06F3/017 ,  G06F3/005 ,  G06F3/0304

摘要： An image projection apparatus includes a projection unit configured to project an image onto a projection target; a recognition unit configured to recognize an instruction action for the image being projected by the projection unit; a storage control unit configured to store correspondence information in which multiple instruction actions are associated with image output controls, respectively, for each type of image in a storage device; a determination unit configured to determine, on the basis of the type of the image being projected by the projection unit, correspondence information for image output control; and a projection control unit configured to perform, on the basis of the correspondence information determined by the determination unit and the instruction action recognized by the recognition unit, image projection control corresponding to the image output control that is associated with the instruction action.

公开(公告)号：US20140253433A1

公开(公告)日：2014-09-11

申请号：US14186180

申请日：2014-02-21

申请人： Tomotoshi SATO ,  Takahiro IMAMICHI

发明人： Tomotoshi SATO ,  Takahiro IMAMICHI

IPC分类号： G06F3/01

CPC分类号： G06F3/017 ,  G06F3/005 ,  G06F3/0304

摘要： An image projection apparatus includes a projection unit configured to project an image onto a projection target; a recognition unit configured to recognize an instruction action for the image being projected by the projection unit; a storage control unit configured to store correspondence information in which multiple instruction actions are associated with image output controls, respectively, for each type of image in a storage device; a determination unit configured to determine, on the basis of the type of the image being projected by the projection unit, correspondence information for image output control; and a projection control unit configured to perform, on the basis of the correspondence information determined by the determination unit and the instruction action recognized by the recognition unit, image projection control corresponding to the image output control that is associated with the instruction action.

摘要翻译： 图像投影装置包括投影单元，被配置为将图像投影到投影对象上; 识别单元，被配置为识别由投影单元投影的图像的指令动作; 存储控制单元，被配置为存储与存储装置中的每种图像分别对应于图像输出控制的多个指令动作的对应信息; 确定单元，被配置为基于由投影单元投影的图像的类型来确定用于图像输出控制的对应信息; 以及投影控制单元，被配置为基于由所述确定单元确定的对应信息和由所述识别单元识别的指令动作，执行与所述指令动作相关联的图像输出控制相对应的图像投影控制。

公开(公告)号：US20060220672A1

公开(公告)日：2006-10-05

申请号：US10545511

申请日：2004-02-10

申请人： Tomotoshi Sato

发明人： Tomotoshi Sato

IPC分类号： H03K19/00

CPC分类号： G01R31/318555 ,  H01L24/01 ,  H01L2924/14 ,  H01L2924/00

摘要： An object of the invention is to provide a boundary scan controller that allows a boundary scan to be executed and also allows a semiconductor apparatus to be manufactured in such a manner that the same type of semiconductor circuit chips are stacked. When identification data stored in memory means (85) is compared with fixed data held in fixed-data holding means (87) by comparison means (88) and the identification data is coincident with the fixed data, a data derivation section (89) outputs the same data as data which is outputted from an output section (86). In a boundary scan test, a data derivation section (89) of a boundary controller (80) provided for each semiconductor circuit chip is connected to the same bus line. When the identification data is not coincident with the fixed data, the data derivation section (89) can be substantially disconnected from the bus line. In this way, the same type of semiconductor circuit chips for which the boundary controller (80) is provided can be stacked, thereby manufacturing the semiconductor apparatus.

摘要翻译： 本发明的目的是提供一种边界扫描控制器，其允许执行边界扫描，并且还允许半导体装置以相同类型的半导体电路芯片堆叠的方式制造。 当存储在存储装置（85）中的识别数据与通过比较装置（88）保存在固定数据保持装置（87）中的固定数据进行比较，并且识别数据与固定数据一致时，数据导出部分（89）输出 与从输出部（86）输出的数据相同的数据。 在边界扫描测试中，为每个半导体电路芯片提供的边界控制器（80）的数据推导部分（89）连接到相同的总线。 当识别数据与固定数据不一致时，数据导出部分（89）可以基本上与总线断开连接。 以这种方式，可以堆叠设置边界控制器（80）的相同类型的半导体电路芯片，从而制造半导体装置。