Method for production of a radiation-emitting semiconductor chip
    4.
    发明授权
    Method for production of a radiation-emitting semiconductor chip 有权
    辐射发射半导体芯片的制造方法

    公开(公告)号:US08273593B2

    公开(公告)日:2012-09-25

    申请号:US13027810

    申请日:2011-02-15

    IPC分类号: H01L21/66 H01L21/30

    CPC分类号: H01L33/22 H01L33/0079

    摘要: A method for micropatterning a radiation-emitting surface of a semiconductor layer sequence for a thin-film light-emitting diode chip, wherein the semiconductor layer sequence is grown on a substrate, a mirror layer is formed or applied on the semiconductor layer sequence, which reflects back into the semiconductor layer sequence at least part of a radiation that is generated in the semiconductor layer sequence during the operation thereof and is directed toward the mirror layer, the semiconductor layer sequence is separated from the substrate, and a separation surface of the semiconductor layer sequence, from which the substrate is separated, is etched by an etchant which predominantly etches at crystal defects and selectively etches different crystal facets at the separation surface.

    摘要翻译: 一种用于对薄膜发​​光二极管芯片的半导体层序列的辐射发射表面进行微图形化的方法,其中在衬底上生长半导体层序列,在半导体层序列上形成或施加镜面层, 在半导体层序列中在半导体层序列中产生的至少一部分辐射反射回半导体层序列并且朝向镜面层,半导体层序列与衬底分离,并且半导体层的分离表面 衬底分离的层序列被蚀刻剂蚀刻,蚀刻剂主要在晶体缺陷处蚀刻并选择性地蚀刻分离表面处的不同晶面。

    Method for Production of a Radiation-Emitting Semiconductor Chip
    5.
    发明申请
    Method for Production of a Radiation-Emitting Semiconductor Chip 有权
    辐射发射半导体芯片的制造方法

    公开(公告)号:US20110140141A1

    公开(公告)日:2011-06-16

    申请号:US13027810

    申请日:2011-02-15

    IPC分类号: H01L33/60 H01L33/40

    CPC分类号: H01L33/22 H01L33/0079

    摘要: A method for micropatterning a radiation-emitting surface of a semiconductor layer sequence for a thin-film light-emitting diode chip, wherein the semiconductor layer sequence is grown on a substrate, a mirror layer is formed or applied on the semiconductor layer sequence, which reflects back into the semiconductor layer sequence at least part of a radiation that is generated in the semiconductor layer sequence during the operation thereof and is directed toward the mirror layer, the semiconductor layer sequence is separated from the substrate, and a separation surface of the semiconductor layer sequence, from which the substrate is separated, is etched by an etchant which predominantly etches at crystal defects and selectively etches different crystal facets at the separation surface.

    摘要翻译: 一种用于对薄膜发​​光二极管芯片的半导体层序列的辐射发射表面进行微图形化的方法,其中在衬底上生长半导体层序列,在半导体层序列上形成或施加镜面层, 在半导体层序列中在半导体层序列中产生的至少一部分辐射反射回半导体层序列并且朝向镜面层,半导体层序列与衬底分离,并且半导体层的分离表面 衬底分离的层序列被蚀刻剂蚀刻,蚀刻剂主要在晶体缺陷处蚀刻并选择性地蚀刻分离表面处的不同晶面。

    Method for production of a radiation-emitting semiconductor chip
    6.
    发明授权
    Method for production of a radiation-emitting semiconductor chip 有权
    辐射发射半导体芯片的制造方法

    公开(公告)号:US07897423B2

    公开(公告)日:2011-03-01

    申请号:US11579194

    申请日:2004-04-29

    IPC分类号: H01L21/00 H01L21/46

    CPC分类号: H01L33/22 H01L33/0079

    摘要: A method for micropatterning a radiation-emitting surface of a semiconductor layer sequence for a thin-film light-emitting diode chip. The semiconductor layer sequence is grown on a substrate. A mirror layer is formed or applied on the semiconductor layer sequence, which reflects back into the semiconductor layer sequence at least part of a radiation that is generated in the semiconductor layer sequence during the operation thereof and is directed toward the mirror layer. The semiconductor layer sequence is separated from the substrate by means of a lift-off method, in which a separation zone in the semiconductor layer sequence is at least partly decomposed in such a way that anisotropic residues of a constituent of the separation zone, in particular a metallic constituent of the separation layer, remain at the separation surface of the semiconductor layer sequence, from which the substrate is separated. The separation surface—provided with the residues—of the semiconductor layer sequence with a dry etching method, a gaseous etchant or a wet-chemical etchant, wherein the anisotropic residues are at least temporarily used as an etching mask. A semiconductor chip is produced according to such a method.

    摘要翻译: 一种用于对薄膜发​​光二极管芯片的半导体层序列的辐射发射表面进行微图形化的方法。 半导体层序列在衬底上生长。 在半导体层序列上形成或施加镜层,其反射回到半导体层序列中,半导体层序列在其操作期间在半导体层序列中产生的辐射的至少一部分并且被指向镜层。 通过剥离方法将半导体层序列与衬底分离,其中半导体层序列中的分离区域至少部分地被分解,使得分离区的成分的各向异性残留物 分离层的金属成分保留在半导体层序列的分离表面,基板从该分离表面分离。 具有干蚀刻方法的半导体层序列的残留物的分离表面,气体蚀刻剂或湿化学蚀刻剂,其中各向异性残余物至少暂时用作蚀刻掩模。 根据这种方法制造半导体芯片。

    Method for separating a semiconductor layer from a substrate by irradiating with laser pulses
    9.
    发明授权
    Method for separating a semiconductor layer from a substrate by irradiating with laser pulses 有权
    通过照射激光脉冲从衬底分离半导体层的方法

    公开(公告)号:US08524573B2

    公开(公告)日:2013-09-03

    申请号:US10544306

    申请日:2004-01-27

    IPC分类号: H01L21/428

    摘要: A method for producing a semiconductor component, in which a semiconductor layer is separated from a substrate by irradiation with laser pulses, the pulse duration of the laser pulses being less than or equal to 10 ns. The laser pulses have a spatial beam profile with a flank slope is chosen to be gentle enough to prevent cracks in the semiconductor layer that arise as a result of thermally induced lateral stresses during the separation of semiconductor layer and substrate.

    摘要翻译: 一种半导体元件的制造方法,其中通过激光脉冲照射半导体层与衬底分离,激光脉冲的脉冲持续时间小于或等于10ns。 激光脉冲具有空间光束轮廓,其侧面斜率被选择为足够温和以防止在半导体层和衬底的分离期间由于热诱导的横向应力引起的半导体层中的裂纹。