Digital imaging with masked pixels

    公开(公告)号:US10326952B2

    公开(公告)日:2019-06-18

    申请号:US15675494

    申请日:2017-08-11

    Abstract: In one application, an imaging device includes an image sensor having an array of pixels, and a mask coupled with the image sensor. The mask is configured to darken a plurality of isolated pixels or groups of pixels interspersed within the array of pixels. The imaging device also includes a processor coupled with the image sensor and configured to receive image data from the image sensor, and determine a dark current fixed pattern noise based on the image data received from the plurality of darkened pixels or groups of pixels.

    CONTACT IMAGER
    3.
    发明申请
    CONTACT IMAGER 有权
    联系IMAGER

    公开(公告)号:US20160006910A1

    公开(公告)日:2016-01-07

    申请号:US14789717

    申请日:2015-07-01

    CPC classification number: H04N5/2252 G01N21/76 G01N21/763 G01N2201/0221

    Abstract: Provided herein are imaging cassettes for detecting a luminescent and/or radioactive signals. Such cassettes are useful in common biological assays, e.g., immunoassays, nucleotide detection assays, and other affinity assays.

    Abstract translation: 本文提供了用于检测发光和/或放射性信号的成像盒。 这样的盒可用于常见的生物测定,例如免疫测定,核苷酸检测测定和其他亲和测定。

    DIGITAL IMAGING WITH MASKED PIXELS
    4.
    发明申请
    DIGITAL IMAGING WITH MASKED PIXELS 有权
    数字成像与屏蔽像素

    公开(公告)号:US20160028976A1

    公开(公告)日:2016-01-28

    申请号:US14563411

    申请日:2014-12-08

    CPC classification number: H04N5/361 H04N5/365

    Abstract: One embodiment of the invention is directed to an imaging device comprising an image sensor comprising an array of pixels, and a mask coupled with the image sensor, the mask configured to darken at least one pixel in the array of pixels.

    Abstract translation: 本发明的一个实施例涉及一种包括包括像素阵列的图像传感器和与图像传感器耦合的掩模的成像装置,该掩模被配置为使像素阵列中的至少一个像素变暗。

    NON-SCANNING SPR SYSTEM
    5.
    发明申请
    NON-SCANNING SPR SYSTEM 有权
    非扫描SPR系统

    公开(公告)号:US20130344623A1

    公开(公告)日:2013-12-26

    申请号:US14013068

    申请日:2013-08-29

    Inventor: Boaz RAN Itay Barak

    CPC classification number: G01N21/553 G02B3/005 G02B5/008

    Abstract: A system for measuring an evanescent wave phenomenon at total internal reflection, the system comprising: a) a sensing surface comprising a plurality of areas of interest; b) an illumination sub-system comprising a light source, which illuminates each area of interest on the sensing surface over a range of angles of incidence; c) a detector which responds differently to an intensity of light received by it at different locations; and d) projection optics comprising primary optics and a plurality of secondary elements, the primary optics projecting an image of the illuminated sensing surface onto the secondary elements, which project their received light onto the detector in such a way that it is possible to determine, from the response of the detector, how much light is reflected from each area of interest, as a function of angle of incidence over the range of angles for that area.

    Abstract translation: 一种用于在全内反射下测量ev逝波现象的系统,所述系统包括:a)感测表面,包括多个感兴趣的区域; b)照明子系统,包括光源,其在入射角范围上照射感测表面上的每个感兴趣区域; c)检测器,其响应于其在不同位置处接收的光的强度不同; 以及d)包括主要光学元件和多个次要元件的投影光学元件,所述主要光学器件将所述照射的感测表面的图像投影到所述次级元件上,所述次级元件将其接收的光投射到所述检测器上,使得可以确定, 根据检测器的响应,从感兴趣区域反射多少光,作为该区域的角度范围内的入射角的函数。

    Microfluidic probe head with aspiration posts

    公开(公告)号:US12201974B2

    公开(公告)日:2025-01-21

    申请号:US16984852

    申请日:2020-08-04

    Abstract: The present disclosure is notably directed to a microfluidic probe head (202), or MFP head, comprising a processing surface (204) having liquid injection and liquid aspiration apertures, as well as projections (205) extending from the processing surface (204). The arrangement of injection and aspiration apertures provides for a hydrodynamic flow confinement within a processing region that is formed between the processing surface (204) and a substrate (104) or sample surface (for example, the bottom of a microtiter plate sample well (102)), typically located beneath the processing surface (204). The disclosure is further directed to related microfluidic probe devices, and methods of operation of such an MFP head, notably to deposit cells on a surface.

    Non-scanning SPR system
    8.
    发明授权

    公开(公告)号:US09383311B2

    公开(公告)日:2016-07-05

    申请号:US14013068

    申请日:2013-08-29

    Inventor: Boaz Ran Itay Barak

    CPC classification number: G01N21/553 G02B3/005 G02B5/008

    Abstract: A system for measuring an evanescent wave phenomenon at total internal reflection, the system comprising: a) a sensing surface comprising a plurality of areas of interest; b) an illumination sub-system comprising a light source, which illuminates each area of interest on the sensing surface over a range of angles of incidence; c) a detector which responds differently to an intensity of light received by it at different locations; and d) projection optics comprising primary optics and a plurality of secondary elements, the primary optics projecting an image of the illuminated sensing surface onto the secondary elements, which project their received light onto the detector in such a way that it is possible to determine, from the response of the detector, how much light is reflected from each area of interest, as a function of angle of incidence over the range of angles for that area.

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