Source reagent composition and method for chemical vapor deposition formation or ZR/HF silicate gate dielectric thin films
    3.
    发明授权
    Source reagent composition and method for chemical vapor deposition formation or ZR/HF silicate gate dielectric thin films 失效
    用于化学气相沉积形成的源试剂组合物和方法或ZR / HF硅酸盐栅极电介质薄膜

    公开(公告)号:US06399208B1

    公开(公告)日:2002-06-04

    申请号:US09414133

    申请日:1999-10-07

    IPC分类号: B32B900

    CPC分类号: C23C16/401 C09D1/00

    摘要: A precursor composition for forming a zirconium and/or hafnium silicate film on a substrate, e.g., by chemical vapor deposition (CVD). Illustrative precursor compositions include (1) a first precursor metal compound or complex including a silicon alcoxide (siloxide) ligand coordinated to a metal M, wherein M=Zr or Hf and (2) a second precursor metal compound or complex including an aliphatic alcoxide ligand coordinated to a metal M, wherein M=Zr or Hf, wherein the relative proportions of the first and second precursors relative to one another are employed to controllably establish the M/Si ratio in the deposited silicate thin film. The precursor composition may contain a solvent medium, so that the composition is adapted for liquid delivery CVD, to form stable thin-film gate dielectrics for fabrication of microelectronic devices.

    摘要翻译: 用于在衬底上形成锆和/或硅酸铪膜的前体组合物,例如通过化学气相沉积(CVD)。 说明性的前体组合物包括(1)第一前体金属化合物或络合物,其包含与金属M配位的硅烷醇(硅氧烷)配体,其中M = Zr或Hf,和(2)第二前体金属化合物或络合物,包括脂族醇酸配体 与金属M配位,其中M = Zr或Hf,其中第一和第二前体相对于彼此的相对比例用于可控地建立沉积的硅酸盐薄膜中的M / Si比。 前体组合物可以含有溶剂介质,使得组合物适于液体输送CVD,以形成用于制造微电子器件的稳定的薄膜栅极电介质。

    Tetrahydrofuran-adducted group II &bgr;-diketonate complexes as source reagents for chemical vapor deposition
    4.
    发明授权
    Tetrahydrofuran-adducted group II &bgr;-diketonate complexes as source reagents for chemical vapor deposition 失效
    四氢呋喃加成的II族β-二酮络合物作为化学气相沉积的原料

    公开(公告)号:US06504015B2

    公开(公告)日:2003-01-07

    申请号:US09791005

    申请日:2001-02-22

    IPC分类号: C07F500

    CPC分类号: C07F3/003 C23C16/409

    摘要: Group II metal MOCVD precursor compositions are described having utility for MOCVD of the corresponding Group II metal-containing films. The complexes are Group II metal &bgr;-diketonate adducts of the formula M(&bgr;-diketonate)2(L)4 wherein M is the Group II metal and L is tetrahydrofuran. Such source reagent complexes of barium and strontium are usefully employed in the formation of barium strontium titanate and other Group II thin films on substrates for microelectronic device applications, such as integrated circuits, ferroelectric memories, switches, radiation detectors, thin-film capacitors, microelectromechanical structures (MEMS) and holographic storage media.

    摘要翻译: 描述了II类金属MOCVD前体组合物用于相应的含II族金属膜的MOCVD。 络合物是式M(β-二酮酸酯)2(L)4的II族金属β-二酮加成物,其中M是第II族金属,L是四氢呋喃。 钡和锶的这种源试剂络合物可用于形成钛酸锶钡和其他用于微电子器件应用的基板上的II类薄膜,例如集成电路,铁电存储器,开关,辐射检测器,薄膜电容器,微机电 结构(MEMS)和全息存储介质。

    Group II MOCVD source reagents, and method of forming Group II
metal-containing films utilizing same
    5.
    发明授权
    Group II MOCVD source reagents, and method of forming Group II metal-containing films utilizing same 失效
    II族MOCVD源试剂,以及使用其形成含有II族金属的膜的方法

    公开(公告)号:US6111122A

    公开(公告)日:2000-08-29

    申请号:US67557

    申请日:1998-04-28

    摘要: Novel Group II metal MOCVD precursor compositions are described having utility for MOCVD of the corresponding Group II metal-containing films. The complexes are Group II metal .beta.-diketonate Lewis base adducts having ligands such as: (i) amines bearing terminal NH.sub.2 groups; (ii) imine ligands formed as amine (i)/carbonyl reaction products; (iii) combination of two or more of the foregoing ligands (i)-(ii), and (iv) combination of one or more of the foregoing ligands (i)-(ii) with one or more other ligands or solvents. The source reagent complexes of barium and strontium are usefully employed in the formation of barium strontium titanate and other Group II doped thin-films on substrates for microelectronic device applications, such as intearated circuits, ferroelectric memories, switches, radiation detectors, thin-film capacitors, microelectromechanical structures (MEMS) and holoaraphic storage media.

    摘要翻译: 描述了新的第II族金属MOCVD前体组合物用于相应的含II族金属膜的MOCVD。 络合物是具有配体的II族金属β-二酮基路易斯碱加成物,其具有:(i)带有末端NH 2基团的胺; (ii)以胺(i)/羰基反应产物形成的亚胺配体; (iii)上述配体(i) - (ii)中的两种或更多种的组合,和(iv)一种或多种前述配体(i) - (ii)与一种或多种其它配体或溶剂的组合。 钡和锶的源试剂络合物可用于形成钛酸钡锶和其他第II类掺杂的薄膜,用于微电子器件应用的基板上,例如有线电路,铁电存储器,开关,辐射探测器,薄膜电容器 ,微机电结构(MEMS)和全息存储介质。

    Tetrahydrofuran-adducted group II &bgr;-diketonate complexes as source reagents for chemical vapor deposition
    6.
    发明授权
    Tetrahydrofuran-adducted group II &bgr;-diketonate complexes as source reagents for chemical vapor deposition 失效
    四氢呋喃加成的II族β-二酮络合物作为化学气相沉积的原料

    公开(公告)号:US06218518B1

    公开(公告)日:2001-04-17

    申请号:US09321637

    申请日:1999-05-28

    IPC分类号: C07F500

    CPC分类号: C07F3/003 C23C16/409

    摘要: Group II metal MOCVD precursor compositions are described having utility for MOCVD of the corresponding Group II metal-containing films. The complexes are Group II metal &bgr;-diketonate adducts of the formula M(&bgr;-diketonate)2(L)4 wherein M is the Group II metal and L is tetrahydrofuran. Such source reagent complexes of barium and strontium are usefully employed in the formation of barium strontium titanate and other Group II thin films on substrates for microelectronic device applications, such as integrated circuits, ferroelectric memories, switches, radiation detectors, thin-film capacitors, microelectromechanical structures (MEMS) and holographic storage media.

    摘要翻译: 描述了II类金属MOCVD前体组合物用于相应的含II族金属膜的MOCVD。 络合物是式M(β-二酮酸酯)2(L)4的II族金属β-二酮加成物,其中M是第II族金属,L是四氢呋喃。 钡和锶的这种源试剂络合物可用于形成钛酸锶钡和其他用于微电子器件应用的基板上的II类薄膜,例如集成电路,铁电存储器,开关,辐射检测器,薄膜电容器,微机电 结构(MEMS)和全息存储介质。

    Method of forming Group II metal-containing films utilizing Group II MOCVD source reagents
    7.
    发明授权
    Method of forming Group II metal-containing films utilizing Group II MOCVD source reagents 失效
    使用II族MOCVD源试剂形成含II族金属的膜的方法

    公开(公告)号:US06338873B1

    公开(公告)日:2002-01-15

    申请号:US09610822

    申请日:2000-07-06

    IPC分类号: C23C1600

    摘要: Novel Group II metal MOCVD precursor compositions are described having utility for MOCVD of the corresponding Group II metal-containing films. The complexes are Group II metal &bgr;-diketonate Lewis base adducts having ligands such as: (i) amines bearing terminal NH2 groups; (ii) imine ligands formed as amine (i)/carbonyl reaction products; (iii) combination of two or more of the foregoing ligands (i)-(ii), and (iv) combination of one or more of the foregoing ligands (i)-(ii) with one or more other ligands or solvents. The source reagent complexes of barium and strontium are usefully employed in the formation of barium strontium titanate and other Group II doped thin-films on substrates for microelectronic device applications, such as integrated circuits, ferroelectric memories, switches, radiation detectors, thin-film capacitors, microelectromechanical structures (MEMS) and holographic storage media.

    摘要翻译: 描述了新的第II族金属MOCVD前体组合物用于相应的含II族金属膜的MOCVD。 络合物是具有配体的II族金属β-二酮酸酯路易斯碱加成物,其具有:(i)带有末端NH 2基团的胺; (ii)以胺(i)/羰基反应产物形成的亚胺配体; (iii)上述配体(i) - (ii)中的两种或更多种的组合,和(iv)一种或多种前述配体(i) - (ii)与一种或多种其它配体或溶剂的组合。 钡和锶的源试剂络合物可用于形成钛酸锶钡和其他第II类掺杂薄膜在用于微电子器件应用的衬底上,例如集成电路,铁电存储器,开关,辐射探测器,薄膜电容器 ,微机电结构(MEMS)和全息存储介质。

    Method of using ultrasonics to plate silver
    10.
    发明授权
    Method of using ultrasonics to plate silver 有权
    超声波镀银方法

    公开(公告)号:US07429400B2

    公开(公告)日:2008-09-30

    申请号:US11300254

    申请日:2005-12-14

    IPC分类号: B05D5/12 B05D1/18

    摘要: A method of reducing solder mask interface attack in a process of fabricating printed circuit boards. The method comprises the steps of providing a printed circuit board with a solder mask applied thereon and treating the printed circuit board with an immersion plating solution, wherein the immersion plating solution is plated onto the printed circuit board with the use of ultrasonics in the plating bath. It has been found that the use of ultrasonics at a frequency of about 40 kHz for the entire plating duration provides beneficial results.

    摘要翻译: 在制造印刷电路板的过程中减少焊接掩模界面攻击的方法。 该方法包括以下步骤:为印刷电路板提供涂覆有焊接掩模并用浸镀液处理印刷电路板的步骤,其中使用镀液中的超声波将浸镀液镀在印刷电路板上 。 已经发现,在整个电镀持续时间内使用大约40kHz频率的超声波提供有益的结果。