摘要:
Described are a system and method for converting a typical two-level logic signal to a pair of differential logic signals. In accordance with one embodiment, a field programmable gate array (FPGA) is configured to provide a digital signal and its complement on a pair of output terminals. A resistor network connected to these output terminals converts the complementary signals to a pair of differential signals having current and voltage levels within the range established by the LVDS specification. For maximum efficiency, the values of the resistors that make up the resistor network can be selected to match the 100 ohm input resistance exhibited by LVDS receivers.
摘要:
A cyclic redundancy check (CRC) bit-slice circuit including a plurality of AND gates coupled with configuration data is described. The configuration data may enable the plurality of AND gates to provide a set of CRC input data and feedback polynomial data meeting a plurality of CRC protocols. The CRC bit-slice circuit accepts a generator polynomial as an input design parameter to build a CRC module. The modularity of the design then allows a larger CRC design to be constructed from multiple CRC modules such that wider data width may be accommodated. Several CRC modules can be cascaded to accommodate various data widths and to meet a plurality of CRC protocols.
摘要:
A method of generating a random number using a multiplier oscillation, the method comprising providing a multiplier circuit coupled to receive a first digital input and a second digital input, wherein the first digital input and the second digital input are asynchronous signals and the first digital input comprises a feedback signal based upon an output of the multiplier circuit; allowing the multiplier to enter a state of feedback oscillation; and generating a random number based upon the output of the multiplier circuit. The method may further comprise providing a plurality of adders receiving feedback signals.
摘要:
Method and apparatus for error checking information is described. Configuration data includes data bits and parity bits. Notably, parity bits may be relocated for determining a syndrome value. Syndrome bits are determined by computing a partial syndrome value for each word serially transmitted of the configuration data, where the configuration data includes one or more data vectors. Location of each word of the configuration data is identified. It is determined whether a partial syndrome value is an initial partial syndrome value or other partial syndrome value responsive to word location. An initial partial syndrome value is stored, and subsequent partial syndrome values are cumulatively added for each word of a data vector to arrive at a syndrome value for the data vector.
摘要:
Programmable integrated circuits (ICs) that compensate for process variations and/or mask revisions in a programmable integrated circuit (IC). An exemplary IC includes two programming ports, two programmable circuits (e.g., digital and analog), a non-volatile memory, and a configuration control circuit coupled to the programmable circuits and non-volatile memory. In some embodiments, one port can be used for storing data in the non-volatile memory, while the other port can be used for providing a configuration bitstream to the configuration control circuit. The non-volatile memory can be used to store a value that identifies a process corner and/or mask revision for the programmable IC. The configuration control circuit monitors data arriving in the configuration bitstream, and selectively either ignores the data or uses the data to configure the IC (e.g., the analog circuit), based on a comparison of a code key in the bitstream with the value stored in the non-volatile memory.
摘要:
A system for programming configuration memory cells in an integrated circuit. The system includes: a set of data registers, wherein a member of the set has a temporary storage for a fixed number of configuration bits; and a plurality of rows, each row has a plurality of columns, wherein configuration memory cells in a selected column and in a selected row are programmed using the fixed number of configuration bits.
摘要:
A memory includes a plurality of row segments, with each row segment having a number of memory cells coupled to a corresponding dataline segment pair. Dataline driver circuits are provided between row segments to buffer signals on adjacent dataline segments. A control circuit is coupled to at least one row segment, and provides control signals to the at least one row segment and to the dataline driver circuits.
摘要:
Described are delay circuits that are relatively insensitive to changes in temperature and supply voltage. A delay circuit includes at least one inverter circuit made up of a pair of transistors. The inverter responds to voltage changes on the input terminal by providing corresponding inverse changes on the output terminal. The speed at which the inverter responds to voltage changes on the input terminal depends upon the ability of one or both transistors to conduct current to or from the output terminal. The ability of one or both transistors in the inverter to move charge to or from the output terminal is restricted to reduce the switching speed of the inverter, thus imposing a delay on the input signal. Further, the restricted current is provided at a reference level that is relatively insensitive to temperature changes and supply-voltage fluctuations.
摘要:
A method and apparatus for creating and utilizing a database of defective antifuses on a programmable logic device and comparing the list to a catalog of required connections in a design, wherein the process of comparing the two lists will determine whether the device, although flawed, is nonetheless compatible with the design to be implemented, thereby increasing device yield.
摘要:
A method and system for measuring programmed antifuse resistance in an FPGA without disturbing the antifuse resistance. The method includes estimating a plurality of subparts of the programming path connecting low and high programming voltage sources on the FPGA device, measuring the path as a whole, and subtracting the sum total of the subparts from the whole path measurement, thereby deriving the antifuse resistance. If the derived antifuse resistance is higher than desired, programming and measurement may be repeated to ensure device longevity and accurate timing for implemented designs.