Semiconductor Component with Coreless Transformer
    6.
    发明申请
    Semiconductor Component with Coreless Transformer 有权
    无芯变压器半导体元件

    公开(公告)号:US20130278372A1

    公开(公告)日:2013-10-24

    申请号:US13452075

    申请日:2012-04-20

    IPC分类号: H01F5/00

    摘要: A semiconductor component has integrated a coreless transformer with a first connection contact, a second connection contact, an electrically conductive spiral first coil, an electrically conductive first ring, and an electrically conductive second ring. The electrically conductive spiral first coil is electrically connected between the first connection contact and the second connection contact. The electrically conductive first ring surrounds the first coil and one or both of the first connection contact and the second connection contact. The electrically conductive second ring is arranged between the first coil and the first ring, electrically connected to the first coil, and surrounds the first coil and one or both of the first connection contact and the second connection contact.

    摘要翻译: 半导体部件集成了无芯变压器与第一连接触点,第二连接触点,导电螺旋第一线圈,导电第一环和导电第二环。 导电螺旋第一线圈电连接在第一连接触点和第二连接触点之间。 导电的第一环围绕第一线圈和第一连接触点和第二连接触点中的一个或两个。 导电的第二环被布置在第一线圈和第一环之间,电连接到第一线圈,并且包围第一线圈以及第一连接触点和第二连接触点中的一个或两者。

    METHOD FOR PROCESSING A WAFER AND METHOD FOR DICING A WAFER
    7.
    发明申请
    METHOD FOR PROCESSING A WAFER AND METHOD FOR DICING A WAFER 有权
    用于处理波浪的方法和用于划分波形的方法

    公开(公告)号:US20140065768A1

    公开(公告)日:2014-03-06

    申请号:US13602219

    申请日:2012-09-03

    申请人: Markus Menath

    发明人: Markus Menath

    IPC分类号: H01L21/78

    摘要: In various embodiments, a method for processing a wafer may include: providing a wafer having at least one die region and at least one metallization disposed over the at least one die region; covering the at least one metallization with a protecting layer; plasma etching the wafer to form at least one die.

    摘要翻译: 在各种实施例中,用于处理晶片的方法可以包括:提供具有至少一个管芯区域和设置在所述至少一个管芯区域上的至少一个金属化的晶片; 用保护层覆盖所述至少一个金属化层; 等离子体蚀刻晶片以形成至少一个管芯。

    Semiconductor component with coreless transformer
    8.
    发明授权
    Semiconductor component with coreless transformer 有权
    具有无芯变压器的半导体元件

    公开(公告)号:US08665054B2

    公开(公告)日:2014-03-04

    申请号:US13452075

    申请日:2012-04-20

    IPC分类号: H01F5/00 H01L27/08

    摘要: A semiconductor component has integrated a coreless transformer with a first connection contact, a second connection contact, an electrically conductive spiral first coil, an electrically conductive first ring, and an electrically conductive second ring. The electrically conductive spiral first coil is electrically connected between the first connection contact and the second connection contact. The electrically conductive first ring surrounds the first coil and one or both of the first connection contact and the second connection contact. The electrically conductive second ring is arranged between the first coil and the first ring, electrically connected to the first coil, and surrounds the first coil and one or both of the first connection contact and the second connection contact.

    摘要翻译: 半导体部件集成了无芯变压器与第一连接触点,第二连接触点,导电螺旋第一线圈,导电第一环和导电第二环。 导电螺旋第一线圈电连接在第一连接触点和第二连接触点之间。 导电的第一环围绕第一线圈和第一连接触点和第二连接触点中的一个或两个。 导电的第二环被布置在第一线圈和第一环之间,电连接到第一线圈,并且包围第一线圈以及第一连接触点和第二连接触点中的一个或两者。

    Apparatus and method for determining physical properties of a mask blank
    10.
    发明授权
    Apparatus and method for determining physical properties of a mask blank 有权
    用于确定面罩坯料的物理性质的装置和方法

    公开(公告)号:US07289231B2

    公开(公告)日:2007-10-30

    申请号:US10744067

    申请日:2003-12-24

    CPC分类号: G03F1/84 G01N21/958

    摘要: An apparatus for determining physical properties of a mask blank. The apparatus includes, for example, an illumination device for radiating a predetermined light laterally into the mask blank, a detection device opposite the illumination device for detecting the light which has been scattered and/or runs through the mask blank, and an evaluation device for determining predetermined properties of the mask blank from the light which has been scattered and/or has run through the mask blank and has been detected in the detection device. The present invention likewise provides a method for determining physical properties of a mask blank.

    摘要翻译: 一种用于确定面罩坯料的物理特性的装置。 该装置包括例如用于将预定光横向辐射到掩模坯料中的照明装置,与照明装置相对的用于检测已经散射和/或穿过掩模板的光的检测装置,以及用于 从已经散布和/或已经穿过掩模板的光已经在检测装置中检测到的光中确定掩模坯料的预定特性。 本发明同样提供了一种用于确定掩模坯料的物理性质的方法。