Method for the contactless measurement of the potential waveform in an
electronic component and arrangement for implementing the method
    2.
    发明授权
    Method for the contactless measurement of the potential waveform in an electronic component and arrangement for implementing the method 失效
    用于电子部件中的电位波形的非接触式测量的方法以及用于实现该方法的装置

    公开(公告)号:US4220853A

    公开(公告)日:1980-09-02

    申请号:US22480

    申请日:1979-03-21

    CPC分类号: G01R13/00 G01R31/305

    摘要: A method for the contactless measurement of the potential waveform in an electronic component with a scanning electron microscope in which the electron beam is aimed at a measuring point of the integrated circuit until at least one phase range of the measuring voltage is determined by phase-shifting the pulses of the primary electron beam with respect to the measuring voltage and subsequently, the electron beam jumped to at least one further measuring point where a phase range is determined in the same manner permitting measurement of the potential waveform at different points of the integrated circuit and displayed together on a picture screen.

    摘要翻译: 一种用扫描电子显微镜对电子部件中的电位波形进行非接触式测量的方法,其中电子束瞄准集成电路的测量点,直到测量电压的至少一个相位范围由相移 相对于测量电压的一次电子束的脉冲,随后,电子束跳到至少一个另外的测量点,其中以允许测量集成电路的不同点处的电位波形的相同方式确定相位范围 并一起显示在图片屏幕上。

    Inductive component and use of said component
    5.
    发明申请
    Inductive component and use of said component 失效
    所述元件的感应元件和使用

    公开(公告)号:US20050206487A1

    公开(公告)日:2005-09-22

    申请号:US10521742

    申请日:2003-07-21

    摘要: The invention relates to an inductive component (1), for the formation of a magnetic circuit, comprising at least one wire winding (3) and at least one core (4) with a ferromagnetic core material. Said core comprises a gap (7, 8) and at least one further gap (8, 7) to interrupt the magnetic circuit. The inductive component is characterised in that the gaps each have a gap width of at least 1.0 mm. The core comprises two pieces, for example, which are arranged opposed to each other across the gaps (7, 8) and separated from each other by the gap width. The component is advantageously symmetrical with an essentially equal gap width for the gaps. A miniaturised inductive component is possible by the use of a hire winding made from high frequency braided wire and core material capable of accepting high frequencies, which has a high Q-factor even on a high power throughput and thus low electrical losses. In order to increase the Q-factor, the inductive component also has a cooling device for cooling the wire winding. The device is thus provided with a composite material with a thermally-conducting filler. The inductive component is used in a so-called electronic ballast (EVG) in the field of illumination.

    摘要翻译: 本发明涉及用于形成磁路的电感元件(1),其包括至少一个线绕组(3)和至少一个具有铁磁芯材料的芯(4)。 所述芯包括间隙(7,8)和至少一个另外间隙(8,7)以中断磁路。 电感元件的特征在于,间隙各自具有至少1.0mm的间隙宽度。 芯包括两个例如彼此跨过间隙(7,8)布置并且彼此隔开间隙宽度的两个部件。 该部件有利地对称地具有用于间隙的基本相等的间隙宽度。 通过使用能够接受高频的高频编织线和芯材制成的租用绕组,即使在高功率吞吐量以及因此低的电损耗也具有高Q因子,可以实现小型化的电感元件。 为了提高Q因子,电感元件还具有用于冷却线绕组的冷却装置。 因此,该装置设置有具有导热填料的复合材料。 电感元件用于照明领域的所谓电子镇流器(EVG)。

    Device for cooling surface that rotates about a rotation axis and that faces the rotation axis
    6.
    发明授权
    Device for cooling surface that rotates about a rotation axis and that faces the rotation axis 失效
    用于冷却表面的装置,其围绕旋转轴线旋转并且面向旋转轴线

    公开(公告)号:US06904128B2

    公开(公告)日:2005-06-07

    申请号:US10381883

    申请日:2001-09-20

    IPC分类号: F25D9/00 A61B6/03 H01J35/10

    CPC分类号: A61B6/035 A61B6/4488

    摘要: A device (4) comprises a container (40) for a liquid coolant (41) that is disposed between the axis (1) and the surface (30) facing the axis to co-rotate with the surface. The device is further provided with an atomizer nozzle (42) of the container, facing the surface, from which the coolant is discharged during rotation of the container due to the centrifugal force (F) acting upon the coolant of the container in the form of an atomized jet (43) that strikes the surface. The device cools a surface of an electronic device (3) that runs hot, the electronic device supplying the X-ray source of a computer tomograph with power and rotating about the axis of the gantry (2) of the tomograph.

    摘要翻译: 装置(4)包括用于液体冷却剂(41)的容器(40),所述容器(40)设置在所述轴线(1)和面向所述轴线的与所述表面共旋转的所述表面(30)之间。 装置还设置有面向表面的容器的雾化喷嘴(42),由于作用在容器的冷却剂上的离心力(F)以容器的冷却剂的形式 一个撞击表面的雾化射流(43)。 该装置冷却运行热的电子装置(3)的表面,电子装置向计算机断层摄影机的X射线源供电并围绕断层摄影机的台架(2)的轴线旋转。

    Device for warming food by means of inductive coupling and device for transferring energy
    7.
    发明授权
    Device for warming food by means of inductive coupling and device for transferring energy 有权
    用于通过电感耦合加热食物的装置和用于传递能量的装置

    公开(公告)号:US08890041B2

    公开(公告)日:2014-11-18

    申请号:US10586692

    申请日:2005-01-13

    IPC分类号: H05B6/12 H05B6/36

    摘要: A device wherein food can be warmed by means of induction, said device comprising at least one secondary coil which is formed from a current conductor, whereon at least one heating element is connected. The invention also relates to a device which is used to transfer energy in a device in order to warm food by means of induction, said device comprising a primary coil which is connected to a voltage source and which is formed from a current conductor. According to the invention, the primary and secondary coil is cast into a coil body by casting means, and the insulating casting means exhibits a coefficient of thermal expansion which essentially corresponds to the coil body.

    摘要翻译: 一种其中可以通过感应加热食物的装置,所述装置包括至少一个由电流导体形成的次级线圈,其中连接有至少一个加热元件。 本发明还涉及一种用于在装置中传递能量以通过感应来加热食物的装置,所述装置包括连接到电压源并由电流导体形成的初级线圈。 根据本发明,初级线圈和次级线圈通过铸造装置铸造成线圈体,并且绝缘铸造装置表现出基本上对应于线圈体的热膨胀系数。

    Method and apparatus for analyzing errors in integrated circuits
    8.
    发明授权
    Method and apparatus for analyzing errors in integrated circuits 失效
    用于分析综合电路中的误差的方法和装置

    公开(公告)号:US5164666A

    公开(公告)日:1992-11-17

    申请号:US753555

    申请日:1985-07-10

    CPC分类号: G01R31/305

    摘要: Method and apparatus for analyzing errors or failures in integrated circuits wherein the integrated circuit is displayed on the picture screen of a work station (AS) and the circuit is excited with a test signal such that at least one measuring location is selected on a malfunction path and an actual signal tappable at this measuring location is compared to a rated signal and wherein the fault location is identified from the comparison results at the measuring locations. The object is to execute a method using an electron beam testing apparatus (EMG) such that the simplest possible measured data transfer occurs. For this purpose the selection of the measuring location on the malfunctioning path proceeds such that a portion (23) of the layout of the integrated circuit corresponding to the measuring location is displayed on the picture screen of the work station and the measuring location is marked by a cursor (24) and position signals depending on the positon of the cursor (24) are supplied to the electron beam measuring apparatus for aligning the electron beam (2) to the measuring location and such that the electron beam testing apparatus is utilized for the identification of the actual signal.

    摘要翻译: 用于分析集成电路中的错误或故障的方法和装置,其中所述集成电路显示在工作站(AS)的画面上,并且所述电路用测试信号激励,使得在故障路径上选择至少一个测量位置 并且将在该测量位置可抽出的实际信号与额定信号进行比较,并且其中根据测量位置处的比较结果来识别故障位置。 目的是执行使用电子束测试装置(EMG)的方法,使得发生最简单的可能的测量数据传送。 为此,在故障路径上的测量位置的选择进行,使得与测量位置相对应的集成电路的布局的部分(23)显示在工作站的画面上,测量位置由 将光标(24)和取决于光标(24)的位置的位置信号提供给用于将电子束(2)与测量位置对准的电子束测量装置,并且使得电子束测试装置用于 识别实际信号。

    Method and apparatus for automatically positioning a particle beam
    9.
    发明授权
    Method and apparatus for automatically positioning a particle beam 失效
    自动定位粒子束的方法和装置

    公开(公告)号:US4705954A

    公开(公告)日:1987-11-10

    申请号:US766448

    申请日:1985-08-19

    CPC分类号: G01R31/305 H01J37/3045

    摘要: A particle probe is positioned to a specific region when an actual position of the specific region appears shifted relative to its rated position due to local fields, and can therefore not be defined with high precision. The particle probe is positioned to a prescribed region. The particle probe is then deflected in the environment of this region such that the particle probe impinges different regions at the prescribed region. The position of the specific region is determined from the measured signals which are triggered given incidence of the particle probe on the different regions. The particle probe is then positioned to the specific region. An electrical line may form a test spot at the specific region wherein one dimension thereof is greater than a width thereof.

    摘要翻译: 当特定区域的实际位置由于局部场而相对于其额定位置出现偏移时,粒子探针被定位到特定区域,因此不能高精度地定义。 颗粒探针定位到规定区域。 然后,颗粒探针在该区域的环境中被偏转,使得颗粒探针在规定区域上撞击不同的区域。 特定区域的位置由给定的不同区域上的颗粒探针的入射点触发的测量信号确定。 然后将颗粒探针定位到特定区域。 电线可以在其一个尺寸大于其宽度的特定区域处形成测试点。