Pattern forming method, actinic ray-sensitive or radiation-sensitive resin composition, resist film, manufacturing method of electronic device using the same and electronic device
    5.
    发明授权
    Pattern forming method, actinic ray-sensitive or radiation-sensitive resin composition, resist film, manufacturing method of electronic device using the same and electronic device 有权
    图案形成方法,光化射线敏感或辐射敏感性树脂组合物,抗蚀剂膜,使用其的电子器件的制造方法和电子器件

    公开(公告)号:US09557643B2

    公开(公告)日:2017-01-31

    申请号:US14451901

    申请日:2014-08-05

    Abstract: There is provided a pattern forming method comprising (1) a step of forming a film by using an actinic ray-sensitive or radiation-sensitive resin composition containing (A) a resin containing an acid-decomposable repeating unit and being capable of decreasing the solubility for an organic solvent-containing developer by the action of an acid, (B) a compound capable of generating an acid upon irradiation with an actinic ray or radiation, (C) a compound capable of decomposing by the action of an acid to generate an acid, and (D) a solvent; (2) a step of exposing the film by using an actinic ray or radiation, and (4) a step of developing the exposed film by using an organic solvent-containing developer to form a negative pattern.

    Abstract translation: 提供了一种图案形成方法,其包括(1)通过使用含有(A)含有酸可分解重复单元的树脂并且能够降低溶解度的光化射线敏感性或辐射敏感性树脂组合物形成膜的步骤 对于含有机溶剂的显影剂,通过酸的作用,(B)能够在用光化射线或辐射照射时能够产生酸的化合物,(C)能够通过酸的作用分解以产生酸的化合物, 酸,和(D)溶剂; (2)通过使用光化射线或辐射使膜曝光的步骤,以及(4)通过使用含有机溶剂的显影剂显影曝光的膜以形成负图案的步骤。

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